{"id":"https://openalex.org/W4400114595","doi":"https://doi.org/10.1109/i2mtc60896.2024.10560774","title":"Electrical Capacitance-Ultrasonic Dual-mode Tomography for Gas-liquid Two-Phase Flow","display_name":"Electrical Capacitance-Ultrasonic Dual-mode Tomography for Gas-liquid Two-Phase Flow","publication_year":2024,"publication_date":"2024-05-20","ids":{"openalex":"https://openalex.org/W4400114595","doi":"https://doi.org/10.1109/i2mtc60896.2024.10560774"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc60896.2024.10560774","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc60896.2024.10560774","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101922920","display_name":"Keyi Wang","orcid":"https://orcid.org/0000-0001-8454-9217"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Keyi Wang","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100347021","display_name":"Ying Wang","orcid":"https://orcid.org/0000-0001-8835-6674"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ying Wang","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000328813","display_name":"Jiangtao Sun","orcid":"https://orcid.org/0000-0003-2516-3466"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangtao Sun","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058642753","display_name":"Yuedong Xie","orcid":"https://orcid.org/0000-0001-9535-0764"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuedong Xie","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100745911","display_name":"Duan Li","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Duan Li","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101388486","display_name":"Lijun Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijun Xu","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004178818","display_name":"Shijie Sun","orcid":"https://orcid.org/0000-0003-0930-5575"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shijie Sun","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06653363,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11255","display_name":"Microfluidic and Bio-sensing Technologies","score":0.9801999926567078,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.7668222188949585},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6651618480682373},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6099991202354431},{"id":"https://openalex.org/keywords/ultrasonic-sensor","display_name":"Ultrasonic sensor","score":0.5986316204071045},{"id":"https://openalex.org/keywords/two-phase-flow","display_name":"Two-phase flow","score":0.5254266262054443},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.48052534461021423},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.4757932424545288},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.44348978996276855},{"id":"https://openalex.org/keywords/flow","display_name":"Flow (mathematics)","score":0.4347856342792511},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.28676360845565796},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.19823145866394043},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18478786945343018},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.16728028655052185}],"concepts":[{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.7668222188949585},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6651618480682373},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6099991202354431},{"id":"https://openalex.org/C81288441","wikidata":"https://www.wikidata.org/wiki/Q20736125","display_name":"Ultrasonic sensor","level":2,"score":0.5986316204071045},{"id":"https://openalex.org/C144308804","wikidata":"https://www.wikidata.org/wiki/Q232997","display_name":"Two-phase flow","level":3,"score":0.5254266262054443},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.48052534461021423},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.4757932424545288},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.44348978996276855},{"id":"https://openalex.org/C38349280","wikidata":"https://www.wikidata.org/wiki/Q1434290","display_name":"Flow (mathematics)","level":2,"score":0.4347856342792511},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.28676360845565796},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.19823145866394043},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18478786945343018},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.16728028655052185},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc60896.2024.10560774","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc60896.2024.10560774","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8299999833106995,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G6346208946","display_name":null,"funder_award_id":"U21B2011","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W197201203","https://openalex.org/W1595025288","https://openalex.org/W1965417376","https://openalex.org/W1980240402","https://openalex.org/W1982240355","https://openalex.org/W2009983281","https://openalex.org/W2019388017","https://openalex.org/W2033150186","https://openalex.org/W2049772201","https://openalex.org/W2070738097","https://openalex.org/W2083602980","https://openalex.org/W2109435165","https://openalex.org/W2119208233","https://openalex.org/W2119699417","https://openalex.org/W2121265902","https://openalex.org/W2460565455","https://openalex.org/W2570842791","https://openalex.org/W2622008139","https://openalex.org/W2738033462","https://openalex.org/W2799773359","https://openalex.org/W2809002902","https://openalex.org/W2902827954","https://openalex.org/W2998234332","https://openalex.org/W3004108902","https://openalex.org/W4368232628","https://openalex.org/W6608012111"],"related_works":["https://openalex.org/W2065013354","https://openalex.org/W2056641994","https://openalex.org/W1974831921","https://openalex.org/W2362942457","https://openalex.org/W1973400749","https://openalex.org/W2009640073","https://openalex.org/W2364971604","https://openalex.org/W1971900134","https://openalex.org/W1969121263","https://openalex.org/W2393881606"],"abstract_inverted_index":{"Both":[0],"the":[1,26,30,39,61,64,94,101,124],"electrical":[2],"capacitance":[3],"tomography":[4,8,55],"(ECT)":[5],"and":[6,52,73,109,115],"ultrasonic":[7,53],"(UT)":[9],"can":[10,21],"be":[11,22],"used":[12,23],"for":[13],"processing":[14],"imaging":[15],"of":[16,29,41,63,93,119],"gas-liquid":[17],"two-phase":[18],"flow.":[19],"ECT":[20,51,72,108],"to":[24,37,59,90],"reconstruct":[25],"permittivity":[27,68],"distributions":[28],"cross":[31],"section,":[32],"while":[33],"UT":[34],"is":[35,57],"skilled":[36],"distinguish":[38],"boundaries":[40],"two-phase.":[42],"In":[43],"this":[44],"paper,":[45],"an":[46],"image":[47,113],"reconstruction":[48],"method":[49,105],"merging":[50],"reflection":[54],"(URT)":[56],"proposed":[58,95,102],"improve":[60],"quality":[62,114],"reconstructed":[65,70,77],"image.":[66],"The":[67,97],"distribution":[69,76],"by":[71,78,82],"sound":[74],"velocity":[75],"URT":[79,110],"are":[80],"processed":[81],"pixel-to-pixel":[83],"thresholding":[84],"fusion":[85,104],"method.":[86,96,126],"Simulations":[87],"were":[88],"conducted":[89],"evaluate":[91],"performance":[92],"results":[98],"show":[99],"that":[100],"dual-mode":[103],"based":[106],"on":[107],"possess":[111],"higher":[112,116],"measurement":[117],"accuracy":[118],"void":[120],"fraction,":[121],"compared":[122],"with":[123],"single-mode":[125]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}