{"id":"https://openalex.org/W4384158617","doi":"https://doi.org/10.1109/i2mtc53148.2023.10175977","title":"Sample Considerations for Short-Circuited Filled Transmission Line Measurements","display_name":"Sample Considerations for Short-Circuited Filled Transmission Line Measurements","publication_year":2023,"publication_date":"2023-05-22","ids":{"openalex":"https://openalex.org/W4384158617","doi":"https://doi.org/10.1109/i2mtc53148.2023.10175977"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc53148.2023.10175977","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/i2mtc53148.2023.10175977","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5092460775","display_name":"Jared Sinkey","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jared Sinkey","raw_affiliation_strings":["Missouri University of Science and Technology Rolla,Microwave Sensing (&#x03BC;Sense) Laboratory,Department of Electrical and Computer Engineering,Missouri,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Missouri University of Science and Technology Rolla,Microwave Sensing (&#x03BC;Sense) Laboratory,Department of Electrical and Computer Engineering,Missouri,USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048651046","display_name":"Alexander Hook","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alexander Hook","raw_affiliation_strings":["Missouri University of Science and Technology Rolla,Microwave Sensing (&#x03BC;Sense) Laboratory,Department of Electrical and Computer Engineering,Missouri,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Missouri University of Science and Technology Rolla,Microwave Sensing (&#x03BC;Sense) Laboratory,Department of Electrical and Computer Engineering,Missouri,USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066941650","display_name":"Kristen M. Donnell","orcid":"https://orcid.org/0000-0001-8725-5484"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kristen M. Donnell","raw_affiliation_strings":["Missouri University of Science and Technology Rolla,Microwave Sensing (&#x03BC;Sense) Laboratory,Department of Electrical and Computer Engineering,Missouri,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Missouri University of Science and Technology Rolla,Microwave Sensing (&#x03BC;Sense) Laboratory,Department of Electrical and Computer Engineering,Missouri,USA","institution_ids":["https://openalex.org/I20382870"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I20382870"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/lambda","display_name":"Lambda","score":0.6977428793907166},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.6830487847328186},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6046196222305298},{"id":"https://openalex.org/keywords/transmission-line","display_name":"Transmission line","score":0.5475432276725769},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.5335882902145386},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.5276110172271729},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.51643967628479},{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.47483760118484497},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.46493691205978394},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4558585286140442},{"id":"https://openalex.org/keywords/electric-power-transmission","display_name":"Electric power transmission","score":0.42801299691200256},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4114551544189453},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39974209666252136},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3444531559944153},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.34006258845329285},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.28825145959854126},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2626851797103882},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.24447205662727356},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22353675961494446},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1782817840576172},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17466500401496887},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15974101424217224},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.12528899312019348}],"concepts":[{"id":"https://openalex.org/C2778113609","wikidata":"https://www.wikidata.org/wiki/Q10897","display_name":"Lambda","level":2,"score":0.6977428793907166},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.6830487847328186},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6046196222305298},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.5475432276725769},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.5335882902145386},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.5276110172271729},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.51643967628479},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.47483760118484497},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.46493691205978394},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4558585286140442},{"id":"https://openalex.org/C140311924","wikidata":"https://www.wikidata.org/wiki/Q200928","display_name":"Electric power transmission","level":2,"score":0.42801299691200256},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4114551544189453},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39974209666252136},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3444531559944153},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.34006258845329285},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.28825145959854126},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2626851797103882},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.24447205662727356},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22353675961494446},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1782817840576172},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17466500401496887},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15974101424217224},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.12528899312019348},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc53148.2023.10175977","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/i2mtc53148.2023.10175977","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W627295303","https://openalex.org/W1562102649","https://openalex.org/W1970254922","https://openalex.org/W2009300823","https://openalex.org/W2145850560","https://openalex.org/W2755864291","https://openalex.org/W3086281953","https://openalex.org/W3172130055","https://openalex.org/W4248288458"],"related_works":["https://openalex.org/W2951695430","https://openalex.org/W4402659219","https://openalex.org/W1129759607","https://openalex.org/W2983241332","https://openalex.org/W2073182597","https://openalex.org/W3115307632","https://openalex.org/W4255886484","https://openalex.org/W787855002","https://openalex.org/W2949628984","https://openalex.org/W2096055231"],"abstract_inverted_index":{"Microwave":[0],"materials":[1,48,52,98],"characterization":[2,49],"can":[3],"be":[4],"performed":[5],"using":[6],"a":[7,43],"number":[8],"of":[9,50,61,76],"well-established":[10],"measurement":[11,34,56,73,94],"approaches.":[12],"One":[13],"such":[14],"approach,":[15,24],"the":[16,55,59,84,87,92],"short-circuited":[17],"rectangular":[18],"waveguide":[19],"(SC-RWG)":[20],"filled":[21],"transmission":[22],"line":[23],"is":[25,68,83],"known":[26],"to":[27,33],"have":[28,91],"sample":[29,62],"placement":[30],"restrictions":[31,57],"related":[32],"reliability.":[35],"This":[36],"work":[37],"focuses":[38],"on":[39],"this":[40],"approach":[41],"as":[42],"viable":[44],"solution":[45],"for":[46],"microwave":[47],"liquid":[51],"and":[53,64,72],"addresses":[54],"within":[58],"context":[60],"length":[63,77],"dielectric":[65,101],"properties.":[66],"It":[67],"shown":[69],"via":[70],"simulation":[71],"that":[74],"samples":[75],"greater":[78],"than":[79],"<tex>$\\lambda_{g}/6$</tex>":[80],"(where":[81],"<tex>$\\lambda_{g}$</tex>":[82],"wavelength":[85],"in":[86],"RWG)":[88],"do":[89,97],"not":[90],"reported":[93],"restrictions,":[95],"nor":[96],"with":[99],"high":[100],"permittivity":[102],"and/or":[103],"loss":[104],"factor":[105],"(of":[106],"any":[107],"length).":[108]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}