{"id":"https://openalex.org/W3175240327","doi":"https://doi.org/10.1109/i2mtc50364.2021.9460045","title":"Evaluation of a voltage ramp generator for low current calibration","display_name":"Evaluation of a voltage ramp generator for low current calibration","publication_year":2021,"publication_date":"2021-05-17","ids":{"openalex":"https://openalex.org/W3175240327","doi":"https://doi.org/10.1109/i2mtc50364.2021.9460045","mag":"3175240327"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc50364.2021.9460045","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc50364.2021.9460045","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006763788","display_name":"Marcus Vin\u00edcius Viegas Pinto","orcid":"https://orcid.org/0000-0002-4280-2314"},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Marcus Vinicius Viegas Pinto","raw_affiliation_strings":["Dimci/Diele, Inmetro,Duque de Caxias,Brazil","Dimci/Diele, Inmetro, Duque de Caxias, Brazil"],"affiliations":[{"raw_affiliation_string":"Dimci/Diele, Inmetro,Duque de Caxias,Brazil","institution_ids":["https://openalex.org/I40891861"]},{"raw_affiliation_string":"Dimci/Diele, Inmetro, Duque de Caxias, Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038563188","display_name":"Regis Pinheiro Landim","orcid":"https://orcid.org/0000-0003-4222-4072"},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Regis Pinheiro Landim","raw_affiliation_strings":["Dimci/Diele, Inmetro,Duque de Caxias,Brazil","Dimci/Diele, Inmetro, Duque de Caxias, Brazil"],"affiliations":[{"raw_affiliation_string":"Dimci/Diele, Inmetro,Duque de Caxias,Brazil","institution_ids":["https://openalex.org/I40891861"]},{"raw_affiliation_string":"Dimci/Diele, Inmetro, Duque de Caxias, Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079451098","display_name":"Rodrigo David","orcid":null},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Rodrigo Pereira David","raw_affiliation_strings":["Dimci/Dmtic, Inmetro,Duque de Caxias,Brazil","Dimci/Dmtic, Inmetro, Duque de Caxias, Brazil"],"affiliations":[{"raw_affiliation_string":"Dimci/Dmtic, Inmetro,Duque de Caxias,Brazil","institution_ids":["https://openalex.org/I40891861"]},{"raw_affiliation_string":"Dimci/Dmtic, Inmetro, Duque de Caxias, Brazil","institution_ids":["https://openalex.org/I40891861"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5006763788"],"corresponding_institution_ids":["https://openalex.org/I40891861"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09209225,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12468","display_name":"Radiation Effects and Dosimetry","score":0.9085999727249146,"subfield":{"id":"https://openalex.org/subfields/1106","display_name":"Food Science"},"field":{"id":"https://openalex.org/fields/11","display_name":"Agricultural and Biological Sciences"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T12468","display_name":"Radiation Effects and Dosimetry","score":0.9085999727249146,"subfield":{"id":"https://openalex.org/subfields/1106","display_name":"Food Science"},"field":{"id":"https://openalex.org/fields/11","display_name":"Agricultural and Biological Sciences"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/traceability","display_name":"Traceability","score":0.8379529118537903},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7825278043746948},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.7311447858810425},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.6586276292800903},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.6319091320037842},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5487136244773865},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5296081304550171},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4976530373096466},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37968945503234863},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.34786611795425415},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30980008840560913},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19237187504768372},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.12653502821922302},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.07812142372131348}],"concepts":[{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.8379529118537903},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7825278043746948},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.7311447858810425},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.6586276292800903},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6319091320037842},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5487136244773865},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5296081304550171},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4976530373096466},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37968945503234863},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.34786611795425415},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30980008840560913},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19237187504768372},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.12653502821922302},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.07812142372131348},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc50364.2021.9460045","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc50364.2021.9460045","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W2026239514","https://openalex.org/W2073029777","https://openalex.org/W2101211489","https://openalex.org/W2105522406","https://openalex.org/W2119332195","https://openalex.org/W2122226759","https://openalex.org/W2134674599","https://openalex.org/W2135702101","https://openalex.org/W2151709370","https://openalex.org/W2159196747","https://openalex.org/W2294785531","https://openalex.org/W2481735941","https://openalex.org/W2513736124","https://openalex.org/W2769860532","https://openalex.org/W2963536949","https://openalex.org/W2989459258","https://openalex.org/W3013325445","https://openalex.org/W4240654238","https://openalex.org/W4287823576","https://openalex.org/W6680239582","https://openalex.org/W6721822967"],"related_works":["https://openalex.org/W2378709054","https://openalex.org/W4380301954","https://openalex.org/W2803090313","https://openalex.org/W1482465488","https://openalex.org/W2052375654","https://openalex.org/W2376767034","https://openalex.org/W2077453531","https://openalex.org/W3209492875","https://openalex.org/W2011011149","https://openalex.org/W1670618853"],"abstract_inverted_index":{"The":[0],"Brazilian":[1],"National":[2],"Metrology":[3],"Institute":[4],"does":[5],"not":[6],"yet":[7],"provide":[8],"low":[9],"current":[10],"traceability.":[11],"This":[12],"prevents":[13],"calibration":[14],"of":[15,32,40,58],"clinical":[16],"dosimeters":[17],"separated":[18],"from":[19],"its":[20],"ionization":[21],"chamber.":[22],"To":[23],"fill":[24],"this":[25,45,64],"gap":[26],"the":[27,38,41,51,55,59],"authors":[28],"developed":[29],"a":[30,33],"prototype":[31],"ramp":[34,61],"generator":[35],"to":[36],"enable":[37],"use":[39],"capacitor-charging":[42],"method.":[43],"In":[44],"paper,":[46],"we":[47],"evaluate":[48],"and":[49,54],"present":[50],"temporal":[52],"stability":[53],"relative":[56],"variation":[57],"voltage":[60],"obtained":[62],"with":[63],"prototype.":[65]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}