{"id":"https://openalex.org/W3174641164","doi":"https://doi.org/10.1109/i2mtc50364.2021.9460040","title":"An Image Reconstruction Algorithm Based on Two-Step Iterative Shrinkage/Thresholding for Electrical Resistance Tomography","display_name":"An Image Reconstruction Algorithm Based on Two-Step Iterative Shrinkage/Thresholding for Electrical Resistance Tomography","publication_year":2021,"publication_date":"2021-05-17","ids":{"openalex":"https://openalex.org/W3174641164","doi":"https://doi.org/10.1109/i2mtc50364.2021.9460040","mag":"3174641164"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc50364.2021.9460040","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc50364.2021.9460040","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083925869","display_name":"Shouxiao Li","orcid":"https://orcid.org/0000-0003-3886-3840"},"institutions":[{"id":"https://openalex.org/I11849452","display_name":"Tianjin Agricultural University","ror":"https://ror.org/0010b6s72","country_code":"CN","type":"education","lineage":["https://openalex.org/I11849452"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shouxiao Li","raw_affiliation_strings":["College of Computer and Information Engineering, Tianjin Agricultural University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"College of Computer and Information Engineering, Tianjin Agricultural University, Tianjin, China","institution_ids":["https://openalex.org/I11849452"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044822199","display_name":"Joanna N. Chen","orcid":"https://orcid.org/0000-0002-6258-9311"},"institutions":[{"id":"https://openalex.org/I136765683","display_name":"Tianjin University of Technology","ror":"https://ror.org/00zbe0w13","country_code":"CN","type":"education","lineage":["https://openalex.org/I136765683"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Joanna N. Chen","raw_affiliation_strings":["College of Science, Tianjin University of Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"College of Science, Tianjin University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I136765683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060150695","display_name":"Huaxiang Wang","orcid":"https://orcid.org/0000-0003-1584-6925"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaxiang Wang","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084651271","display_name":"Ziqiang Cui","orcid":"https://orcid.org/0000-0003-0498-9955"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziqiang Cui","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5083925869"],"corresponding_institution_ids":["https://openalex.org/I11849452"],"apc_list":null,"apc_paid":null,"fwci":0.2005,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.49694022,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"64","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.6251826882362366},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6134692430496216},{"id":"https://openalex.org/keywords/thresholding","display_name":"Thresholding","score":0.5880643725395203},{"id":"https://openalex.org/keywords/inverse-problem","display_name":"Inverse problem","score":0.5429707169532776},{"id":"https://openalex.org/keywords/shrinkage","display_name":"Shrinkage","score":0.5399605631828308},{"id":"https://openalex.org/keywords/iterative-method","display_name":"Iterative method","score":0.5348073244094849},{"id":"https://openalex.org/keywords/singular-value-decomposition","display_name":"Singular value decomposition","score":0.527406632900238},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4399668276309967},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.4354827404022217},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.34141671657562256},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.3246413469314575},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.29559555649757385},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.22435754537582397}],"concepts":[{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.6251826882362366},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6134692430496216},{"id":"https://openalex.org/C191178318","wikidata":"https://www.wikidata.org/wiki/Q2256906","display_name":"Thresholding","level":3,"score":0.5880643725395203},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.5429707169532776},{"id":"https://openalex.org/C180145272","wikidata":"https://www.wikidata.org/wiki/Q7504144","display_name":"Shrinkage","level":2,"score":0.5399605631828308},{"id":"https://openalex.org/C159694833","wikidata":"https://www.wikidata.org/wiki/Q2321565","display_name":"Iterative method","level":2,"score":0.5348073244094849},{"id":"https://openalex.org/C22789450","wikidata":"https://www.wikidata.org/wiki/Q420904","display_name":"Singular value decomposition","level":2,"score":0.527406632900238},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4399668276309967},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.4354827404022217},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.34141671657562256},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.3246413469314575},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.29559555649757385},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.22435754537582397},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc50364.2021.9460040","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc50364.2021.9460040","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7903843713","display_name":null,"funder_award_id":"11701420,61671319,61627803","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2021363669","https://openalex.org/W2028349405","https://openalex.org/W2035414577","https://openalex.org/W2049772201","https://openalex.org/W2141002303","https://openalex.org/W2146932085","https://openalex.org/W2615241640","https://openalex.org/W2625234991","https://openalex.org/W6659228770","https://openalex.org/W6662948601"],"related_works":["https://openalex.org/W2391958761","https://openalex.org/W2765453142","https://openalex.org/W2356780078","https://openalex.org/W2154277349","https://openalex.org/W2107386309","https://openalex.org/W2545869789","https://openalex.org/W2141090006","https://openalex.org/W1964555484","https://openalex.org/W3048932468","https://openalex.org/W2148504016"],"abstract_inverted_index":{"Electrical":[0],"Resistance":[1],"Tomography":[2],"(ERT)":[3],"aims":[4],"to":[5,37,55,100],"estimate":[6],"the":[7,11,39,58,82,93,102,105,114,119],"electrical":[8],"properties":[9],"at":[10],"interior":[12],"of":[13,24,61,104],"an":[14,65],"object":[15],"from":[16],"current-voltage":[17],"measurements":[18],"on":[19,72],"its":[20],"boundary.":[21],"Image":[22],"reconstruction":[23],"ERT":[25],"is":[26,35,48,75],"a":[27,49],"nonlinear":[28],"and":[29,42,90,109],"ill-posed":[30],"inverse":[31,40],"problem.":[32],"Regularization":[33],"technique":[34],"used":[36],"solve":[38],"problems":[41],"two-step":[43,67],"iterative":[44,62,68],"shrinkage/thresholding":[45,69],"algorithm":[46,70],"(TwIST)":[47],"relatively":[50],"effective":[51],"method.":[52],"In":[53],"order":[54],"further":[56],"improve":[57,118],"noise":[59],"immunity":[60],"threshold":[63],"algorithm,":[64],"improved":[66],"based":[71],"3D":[73],"modelling":[74],"presented":[76],"in":[77],"this":[78],"paper.":[79],"We":[80],"transform":[81],"sensitivity":[83],"matrix":[84],"by":[85],"singular":[86,95],"value":[87],"decomposition":[88],"(SVD),":[89],"then":[91],"remove":[92],"small":[94],"values":[96],"which":[97],"are":[98],"easy":[99],"cause":[101],"instability":[103],"solution.":[106],"Both":[107],"simulation":[108],"experimental":[110],"results":[111],"demonstrate":[112],"that":[113],"proposed":[115],"method":[116],"can":[117],"imaging":[120],"quality":[121],"obviously.":[122]},"counts_by_year":[{"year":2022,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}