{"id":"https://openalex.org/W4283735036","doi":"https://doi.org/10.1109/i2mtc48687.2022.9806615","title":"Range extension of a scanning confocal chromatic sensor for precise robotic inline 3D measurements","display_name":"Range extension of a scanning confocal chromatic sensor for precise robotic inline 3D measurements","publication_year":2022,"publication_date":"2022-05-16","ids":{"openalex":"https://openalex.org/W4283735036","doi":"https://doi.org/10.1109/i2mtc48687.2022.9806615"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc48687.2022.9806615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc48687.2022.9806615","pdf_url":null,"source":{"id":"https://openalex.org/S4363607934","display_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066142094","display_name":"Daniel Wertjanz","orcid":"https://orcid.org/0000-0001-7346-8630"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Daniel Wertjanz","raw_affiliation_strings":["Technische Universit&#x00E4;t Wien,Christian Doppler Laboratory for Precision Engineering for Automated In-Line Metrology Automation and Control Institute (ACIN),Vienna,Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Universit&#x00E4;t Wien,Christian Doppler Laboratory for Precision Engineering for Automated In-Line Metrology Automation and Control Institute (ACIN),Vienna,Austria","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068947460","display_name":"Nikolaus Berlakovich","orcid":"https://orcid.org/0000-0003-4431-7272"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nikolaus Berlakovich","raw_affiliation_strings":["Technische Universit&#x00E4;t Wien,Christian Doppler Laboratory for Precision Engineering for Automated In-Line Metrology Automation and Control Institute (ACIN),Vienna,Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Universit&#x00E4;t Wien,Christian Doppler Laboratory for Precision Engineering for Automated In-Line Metrology Automation and Control Institute (ACIN),Vienna,Austria","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048523710","display_name":"Ernst Csencsics","orcid":"https://orcid.org/0000-0002-0896-1928"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ernst Csencsics","raw_affiliation_strings":["Technische Universit&#x00E4;t Wien,Christian Doppler Laboratory for Precision Engineering for Automated In-Line Metrology Automation and Control Institute (ACIN),Vienna,Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Universit&#x00E4;t Wien,Christian Doppler Laboratory for Precision Engineering for Automated In-Line Metrology Automation and Control Institute (ACIN),Vienna,Austria","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085447908","display_name":"Georg Schitter","orcid":"https://orcid.org/0000-0002-8746-5892"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Georg Schitter","raw_affiliation_strings":["Technische Universit&#x00E4;t Wien,Christian Doppler Laboratory for Precision Engineering for Automated In-Line Metrology Automation and Control Institute (ACIN),Vienna,Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Universit&#x00E4;t Wien,Christian Doppler Laboratory for Precision Engineering for Automated In-Line Metrology Automation and Control Institute (ACIN),Vienna,Austria","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.059,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.24448073,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"85","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11569","display_name":"Optical Coherence Tomography Applications","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.630405843257904},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6249457597732544},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5436737537384033},{"id":"https://openalex.org/keywords/micrometer","display_name":"Micrometer","score":0.5193632245063782},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.48571687936782837},{"id":"https://openalex.org/keywords/position","display_name":"Position (finance)","score":0.4592123031616211},{"id":"https://openalex.org/keywords/tracking","display_name":"Tracking (education)","score":0.45140162110328674},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.44792577624320984},{"id":"https://openalex.org/keywords/chromatic-scale","display_name":"Chromatic scale","score":0.4360642731189728},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2528429925441742},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19287317991256714},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.13434410095214844}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.630405843257904},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6249457597732544},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5436737537384033},{"id":"https://openalex.org/C171635847","wikidata":"https://www.wikidata.org/wiki/Q406983","display_name":"Micrometer","level":2,"score":0.5193632245063782},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.48571687936782837},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.4592123031616211},{"id":"https://openalex.org/C2775936607","wikidata":"https://www.wikidata.org/wiki/Q466845","display_name":"Tracking (education)","level":2,"score":0.45140162110328674},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.44792577624320984},{"id":"https://openalex.org/C196956537","wikidata":"https://www.wikidata.org/wiki/Q202021","display_name":"Chromatic scale","level":2,"score":0.4360642731189728},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2528429925441742},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19287317991256714},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.13434410095214844},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C19417346","wikidata":"https://www.wikidata.org/wiki/Q7922","display_name":"Pedagogy","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc48687.2022.9806615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc48687.2022.9806615","pdf_url":null,"source":{"id":"https://openalex.org/S4363607934","display_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1568447228","https://openalex.org/W1968906559","https://openalex.org/W1969883785","https://openalex.org/W1977969429","https://openalex.org/W2028349249","https://openalex.org/W2037061351","https://openalex.org/W2065066538","https://openalex.org/W2071180781","https://openalex.org/W2083624955","https://openalex.org/W2092268189","https://openalex.org/W2520098368","https://openalex.org/W2584508145","https://openalex.org/W2754265591","https://openalex.org/W2755224179","https://openalex.org/W2951215190","https://openalex.org/W2962814882","https://openalex.org/W3047647210","https://openalex.org/W3127657427","https://openalex.org/W3186021568","https://openalex.org/W3200158033","https://openalex.org/W4252849936","https://openalex.org/W6666692306","https://openalex.org/W6726878944","https://openalex.org/W7037435474"],"related_works":["https://openalex.org/W2369690001","https://openalex.org/W2036343926","https://openalex.org/W2375402774","https://openalex.org/W2084086966","https://openalex.org/W2354511375","https://openalex.org/W856559578","https://openalex.org/W2077520503","https://openalex.org/W2181667894","https://openalex.org/W2437149038","https://openalex.org/W2027514401"],"abstract_inverted_index":{"This":[0],"paper":[1],"introduces":[2],"the":[3,37,55,67,70,73,77,86,119,129,149,159,161],"intermediate":[4],"range":[5,133],"extension":[6,127],"concept":[7],"of":[8,39,49,58,85,118,128,169],"a":[9,27,51,113,135,167],"precision":[10],"3D":[11,40,83,100,121,152],"measurement":[12,32,81,132,162],"module":[13],"for":[14,35,63],"robotic":[15],"inline":[16],"measurements.":[17],"A":[18,99],"scanning":[19],"confocal":[20],"chromatic":[21],"sensor":[22],"(SCCS)":[23],"is":[24,47,107,164],"integrated":[25],"with":[26,42,93,158],"magnetically":[28],"levitated":[29],"and":[30,69,103,115],"actuated":[31],"platform":[33],"(MP)":[34],"enabling":[36],"acquisition":[38],"images":[41],"sub-micrometer":[43,146],"resolution.":[44],"The":[45],"MP":[46,74],"capable":[48],"tracking":[50],"sample":[52],"surface":[53,87],"in":[54,109,148],"out-of-plane":[56],"degrees":[57],"freedom":[59],"to":[60,75,111,138,155],"actively":[61],"compensate":[62],"relative":[64],"motion":[65],"between":[66,96],"SCCS":[68,78],"sample.":[71],"Using":[72],"position":[76],"at":[79],"multiple":[80],"locations,":[82],"measurements":[84],"structure":[88],"under":[89],"test":[90],"are":[91],"acquired":[92],"overlapping":[94],"regions":[95],"neighbouring":[97],"frames.":[98],"image":[101],"processing":[102],"parallel":[104],"registration":[105],"algorithm":[106],"implemented":[108],"order":[110],"ensure":[112],"robust":[114],"precise":[116],"merging":[117],"individual":[120],"images.":[122],"Experimental":[123],"results":[124],"demonstrate":[125],"an":[126],"SCCS\u2019":[130],"lateral":[131],"by":[134,166],"factor":[136,168],"3":[137],"about":[139],"500\u00d7500\u00b5m":[140],"<sup":[141],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[142],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[143],"while":[144],"achieving":[145],"resolution":[147],"entire":[150],"range-extended":[151],"measurement.":[153],"Compared":[154],"state-of-the-art":[156],"repositioning":[157],"robot,":[160],"accuracy":[163],"increased":[165],"9.":[170]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}