{"id":"https://openalex.org/W3039062572","doi":"https://doi.org/10.1109/i2mtc43012.2020.9129535","title":"Eddy Current Phase Gradient and Its Identification of Conductive Material Defects","display_name":"Eddy Current Phase Gradient and Its Identification of Conductive Material Defects","publication_year":2020,"publication_date":"2020-05-01","ids":{"openalex":"https://openalex.org/W3039062572","doi":"https://doi.org/10.1109/i2mtc43012.2020.9129535","mag":"3039062572"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc43012.2020.9129535","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc43012.2020.9129535","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100667081","display_name":"Xiaoxiao Ma","orcid":"https://orcid.org/0009-0007-6289-6120"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaoxiao Ma","raw_affiliation_strings":["College of Electrical Engineering and Automation, Tiangong University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Automation, Tiangong University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100383966","display_name":"Hongli Li","orcid":"https://orcid.org/0000-0001-6442-8995"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongli Li","raw_affiliation_strings":["College of Electrical Engineering and Automation, Tiangong University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Automation, Tiangong University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020561920","display_name":"Ye Song","orcid":"https://orcid.org/0000-0003-3921-5941"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Song Ye","raw_affiliation_strings":["College of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101933300","display_name":"Qian Zhao","orcid":"https://orcid.org/0000-0003-0891-0896"},"institutions":[{"id":"https://openalex.org/I202126657","display_name":"Qufu Normal University","ror":"https://ror.org/03ceheh96","country_code":"CN","type":"education","lineage":["https://openalex.org/I202126657"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qian Zhao","raw_affiliation_strings":["College of Engineering, Qufu Normal University, Shandong, China"],"affiliations":[{"raw_affiliation_string":"College of Engineering, Qufu Normal University, Shandong, China","institution_ids":["https://openalex.org/I202126657"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100732225","display_name":"Wuliang Yin","orcid":"https://orcid.org/0000-0001-5927-3052"},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Wuliang Yin","raw_affiliation_strings":["College of Engineering, Manchester University, Manchester, UK"],"affiliations":[{"raw_affiliation_string":"College of Engineering, Manchester University, Manchester, UK","institution_ids":["https://openalex.org/I28407311"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100667081"],"corresponding_institution_ids":["https://openalex.org/I198091727"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.07045792,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"36","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.683692991733551},{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"Eddy-current testing","score":0.68071448802948},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6387912631034851},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5933913588523865},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5909002423286438},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.5604988932609558},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.5360199809074402},{"id":"https://openalex.org/keywords/demodulation","display_name":"Demodulation","score":0.5260453224182129},{"id":"https://openalex.org/keywords/eddy-current-sensor","display_name":"Eddy-current sensor","score":0.5228893160820007},{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.4793182611465454},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.4470401704311371},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.4203068017959595},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3716859221458435},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34726426005363464},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.22954481840133667},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.20193922519683838},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18822309374809265},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1373540461063385},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11959856748580933},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08680674433708191}],"concepts":[{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.683692991733551},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.68071448802948},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6387912631034851},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5933913588523865},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5909002423286438},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.5604988932609558},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.5360199809074402},{"id":"https://openalex.org/C195251586","wikidata":"https://www.wikidata.org/wiki/Q1185939","display_name":"Demodulation","level":3,"score":0.5260453224182129},{"id":"https://openalex.org/C2777897478","wikidata":"https://www.wikidata.org/wiki/Q23718891","display_name":"Eddy-current sensor","level":3,"score":0.5228893160820007},{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.4793182611465454},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.4470401704311371},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.4203068017959595},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3716859221458435},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34726426005363464},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.22954481840133667},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.20193922519683838},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18822309374809265},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1373540461063385},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11959856748580933},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08680674433708191},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc43012.2020.9129535","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc43012.2020.9129535","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1967786605","https://openalex.org/W1980221648","https://openalex.org/W1989298934","https://openalex.org/W2115578677","https://openalex.org/W2129756534","https://openalex.org/W2148229507","https://openalex.org/W2983448899","https://openalex.org/W2983477691"],"related_works":["https://openalex.org/W2085805524","https://openalex.org/W2003522138","https://openalex.org/W4296871629","https://openalex.org/W2551942315","https://openalex.org/W2333795440","https://openalex.org/W2325202533","https://openalex.org/W2744634501","https://openalex.org/W1973763794","https://openalex.org/W4384009611","https://openalex.org/W2120224426"],"abstract_inverted_index":{"In":[0],"this":[1,88],"paper,":[2],"the":[3,9,18,27,37,52,81,115,121,127],"phase":[4,19,28,103,110],"gradient":[5,29,111],"is":[6,33,112],"taken":[7],"as":[8,114],"characteristic":[10,116],"quantity":[11,117],"of":[12,23,30,49,80,106,123],"defect":[13],"testing":[14,31],"signal":[15,32,67],"by":[16,35],"using":[17,36],"spectrum":[20,104],"analysis":[21,105],"method":[22],"spatial":[24,107],"domain,":[25],"and":[26,45,63,77,95],"extracted":[34],"digital":[38],"phase-":[39],"sensitive":[40],"demodulation":[41],"technology":[42],"to":[43,70,118],"detect":[44,93],"classify":[46],"different":[47],"types":[48],"defects":[50,76,79],"in":[51],"plate":[53],"metal":[54],"sample.":[55,82],"Dual":[56],"air":[57],"core":[58],"coil":[59],"eddy":[60],"current":[61],"sensor":[62],"1-10kHz":[64],"multi-frequency":[65],"excitation":[66],"are":[68],"used":[69,113],"identify":[71],"surface":[72,75],"defects,":[73,94],"lower":[74],"internal":[78],"The":[83,109],"experimental":[84,89],"results":[85,98,129],"show":[86],"that":[87],"system":[90],"can":[91,99],"effectively":[92,119],"visual":[96],"detection":[97,128],"be":[100],"obtained":[101],"through":[102],"domain.":[108],"suppress":[120],"influence":[122],"lift-off":[124],"effect,":[125],"making":[126],"more":[130],"accurate.":[131]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}