{"id":"https://openalex.org/W3039897110","doi":"https://doi.org/10.1109/i2mtc43012.2020.9129008","title":"Application Of Uncertainty Analysis To Experimental Reliability Of Sensors By Thermal Shock Test","display_name":"Application Of Uncertainty Analysis To Experimental Reliability Of Sensors By Thermal Shock Test","publication_year":2020,"publication_date":"2020-05-01","ids":{"openalex":"https://openalex.org/W3039897110","doi":"https://doi.org/10.1109/i2mtc43012.2020.9129008","mag":"3039897110"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc43012.2020.9129008","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc43012.2020.9129008","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076676421","display_name":"Giulio D\u2019Emilia","orcid":"https://orcid.org/0000-0002-9285-3355"},"institutions":[{"id":"https://openalex.org/I26415053","display_name":"University of L'Aquila","ror":"https://ror.org/01j9p1r26","country_code":"IT","type":"education","lineage":["https://openalex.org/I26415053"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Giulio D'Emilia","raw_affiliation_strings":["Department of Industrial and Information Engineering and of Economics, University of L'Aquila, L'Aquila, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Industrial and Information Engineering and of Economics, University of L'Aquila, L'Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007545542","display_name":"David Di Gasbarro","orcid":"https://orcid.org/0000-0002-5567-3363"},"institutions":[{"id":"https://openalex.org/I26415053","display_name":"University of L'Aquila","ror":"https://ror.org/01j9p1r26","country_code":"IT","type":"education","lineage":["https://openalex.org/I26415053"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"David Di Gasbarro","raw_affiliation_strings":["Department of Industrial and Information Engineering and of Economics, University of L\u2019Aquila, L\u2019Aquila, Italy","Department of Industrial and Information Engineering and of Economics, University of L'Aquila, L'Aquila, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Industrial and Information Engineering and of Economics, University of L\u2019Aquila, L\u2019Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]},{"raw_affiliation_string":"Department of Industrial and Information Engineering and of Economics, University of L'Aquila, L'Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078642212","display_name":"Antonella Gaspari","orcid":"https://orcid.org/0000-0002-9535-6848"},"institutions":[{"id":"https://openalex.org/I26415053","display_name":"University of L'Aquila","ror":"https://ror.org/01j9p1r26","country_code":"IT","type":"education","lineage":["https://openalex.org/I26415053"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonella Gaspari","raw_affiliation_strings":["Department of Industrial and Information Engineering and of Economics, University of L\u2019Aquila, L\u2019Aquila, Italy","Department of Industrial and Information Engineering and of Economics, University of L'Aquila, L'Aquila, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Industrial and Information Engineering and of Economics, University of L\u2019Aquila, L\u2019Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]},{"raw_affiliation_string":"Department of Industrial and Information Engineering and of Economics, University of L'Aquila, L'Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082639121","display_name":"Emanuela Natale","orcid":"https://orcid.org/0000-0002-4547-0538"},"institutions":[{"id":"https://openalex.org/I26415053","display_name":"University of L'Aquila","ror":"https://ror.org/01j9p1r26","country_code":"IT","type":"education","lineage":["https://openalex.org/I26415053"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Emanuela Natale","raw_affiliation_strings":["Department of Industrial and Information Engineering and of Economics, University of L\u2019Aquila, L\u2019Aquila, Italy","Department of Industrial and Information Engineering and of Economics, University of L'Aquila, L'Aquila, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Industrial and Information Engineering and of Economics, University of L\u2019Aquila, L\u2019Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]},{"raw_affiliation_string":"Department of Industrial and Information Engineering and of Economics, University of L'Aquila, L'Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018513027","display_name":"David Delaux","orcid":null},"institutions":[{"id":"https://openalex.org/I220619192","display_name":"Valeo (France)","ror":"https://ror.org/04ryqpf83","country_code":"FR","type":"company","lineage":["https://openalex.org/I220619192"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"David Delaux","raw_affiliation_strings":["Regulation \u2013 Reliability Senior Expert Valeo Thermal System, Paris, France"],"affiliations":[{"raw_affiliation_string":"Regulation \u2013 Reliability Senior Expert Valeo Thermal System, Paris, France","institution_ids":["https://openalex.org/I220619192"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049262386","display_name":"Thomas Illing","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112099","display_name":"Valeo (Germany)","ror":"https://ror.org/01zkeq752","country_code":"DE","type":"company","lineage":["https://openalex.org/I220619192","https://openalex.org/I4210112099"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Illing","raw_affiliation_strings":["Validation Metier CDV Driving Assistance, Valeo Corporate CDV, Bietigheim, Germany"],"affiliations":[{"raw_affiliation_string":"Validation Metier CDV Driving Assistance, Valeo Corporate CDV, Bietigheim, Germany","institution_ids":["https://openalex.org/I4210112099"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5076676421"],"corresponding_institution_ids":["https://openalex.org/I26415053"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06564674,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"104","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13312","display_name":"Mechanical and Thermal Properties Analysis","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7499762773513794},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.661064624786377},{"id":"https://openalex.org/keywords/interpolation","display_name":"Interpolation (computer graphics)","score":0.6432141661643982},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.5518487691879272},{"id":"https://openalex.org/keywords/shock","display_name":"Shock (circulatory)","score":0.4874477684497833},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.4802951514720917},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4596834182739258},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4387727379798889},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4141434133052826},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2903149127960205},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.28302645683288574},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17925918102264404},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.13939428329467773},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.098907470703125}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7499762773513794},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.661064624786377},{"id":"https://openalex.org/C137800194","wikidata":"https://www.wikidata.org/wiki/Q11713455","display_name":"Interpolation (computer graphics)","level":3,"score":0.6432141661643982},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.5518487691879272},{"id":"https://openalex.org/C2781300812","wikidata":"https://www.wikidata.org/wiki/Q178061","display_name":"Shock (circulatory)","level":2,"score":0.4874477684497833},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.4802951514720917},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4596834182739258},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4387727379798889},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4141434133052826},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2903149127960205},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.28302645683288574},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17925918102264404},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.13939428329467773},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.098907470703125},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc43012.2020.9129008","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc43012.2020.9129008","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1553386146","https://openalex.org/W2004425845","https://openalex.org/W2015848050","https://openalex.org/W2059318089","https://openalex.org/W2109935178","https://openalex.org/W2143956342","https://openalex.org/W2474948873","https://openalex.org/W2500972901","https://openalex.org/W2612053329","https://openalex.org/W2619995254","https://openalex.org/W2930427503","https://openalex.org/W4252523572"],"related_works":["https://openalex.org/W1998546186","https://openalex.org/W2061967405","https://openalex.org/W2923974939","https://openalex.org/W2174860717","https://openalex.org/W2392646414","https://openalex.org/W2110528520","https://openalex.org/W2590542424","https://openalex.org/W2755767658","https://openalex.org/W3015838480","https://openalex.org/W1980429525"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"an":[3,50],"example":[4],"is":[5,63,80],"discussed":[6],"concerning":[7],"the":[8,28,59,70,83,114],"possibility":[9],"of":[10,16,22,31,40,56,61,73,86,107,116,119],"using":[11],"metrological":[12],"concepts,":[13],"like":[14],"uncertainty":[15],"measurement,":[17,78],"systematic":[18],"effects,":[19],"statistical":[20],"distribution":[21],"measurements,":[23],"in":[24,36,52],"order":[25],"to":[26,48,69,82,90,100,110,122],"improve":[27],"interpretation":[29],"capability":[30],"a":[32,37,53,117],"specific":[33],"failure":[34],"mechanism":[35],"controlled":[38],"field":[39],"influences.":[41],"This":[42],"approach":[43],"has":[44],"been":[45],"also":[46],"used":[47],"set":[49],"interpolation":[51],"certain":[54],"range":[55],"condition":[57],"when":[58],"temperature":[60],"tests":[62,108,125],"changed.":[64],"The":[65,96,105],"case":[66],"study":[67],"refers":[68],"degradation":[71],"assessment":[72],"ultrasonic":[74],"sensors":[75],"for":[76],"distance":[77],"which":[79],"ascribed":[81],"quality":[84],"decay":[85],"solder":[87],"joints":[88],"due":[89],"cracks":[91],"or":[92],"remarkable":[93],"shrink":[94],"holes.":[95],"components":[97],"are":[98],"subjected":[99],"ALT":[101],"cyclic":[102],"thermal":[103],"stresses.":[104],"results":[106],"allowed":[109],"gaining":[111],"information":[112],"about":[113],"validation":[115],"model":[118],"fault,":[120],"useful":[121],"design":[123],"accelerated":[124],"at":[126],"higher":[127],"temperatures.":[128]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}