{"id":"https://openalex.org/W3038914666","doi":"https://doi.org/10.1109/i2mtc43012.2020.9128477","title":"A Novel CS-based Measurement Method for Impairments Identification in Wireline Channels","display_name":"A Novel CS-based Measurement Method for Impairments Identification in Wireline Channels","publication_year":2020,"publication_date":"2020-05-01","ids":{"openalex":"https://openalex.org/W3038914666","doi":"https://doi.org/10.1109/i2mtc43012.2020.9128477","mag":"3038914666"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc43012.2020.9128477","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc43012.2020.9128477","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029530605","display_name":"Eulalia Balestrieri","orcid":"https://orcid.org/0000-0002-9155-5989"},"institutions":[{"id":"https://openalex.org/I16337185","display_name":"University of Sannio","ror":"https://ror.org/04vc81p87","country_code":"IT","type":"education","lineage":["https://openalex.org/I16337185"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Eulalia Balestrieri","raw_affiliation_strings":["Department of Engineering, University of Sannio, Benevento, ITALY"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Sannio, Benevento, ITALY","institution_ids":["https://openalex.org/I16337185"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074293414","display_name":"Luca De Vito","orcid":"https://orcid.org/0000-0003-1896-2614"},"institutions":[{"id":"https://openalex.org/I16337185","display_name":"University of Sannio","ror":"https://ror.org/04vc81p87","country_code":"IT","type":"education","lineage":["https://openalex.org/I16337185"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca De Vito","raw_affiliation_strings":["Department of Engineering, University of Sannio, Benevento, ITALY"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Sannio, Benevento, ITALY","institution_ids":["https://openalex.org/I16337185"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087692673","display_name":"Francesco Picariello","orcid":"https://orcid.org/0000-0001-6854-3026"},"institutions":[{"id":"https://openalex.org/I16337185","display_name":"University of Sannio","ror":"https://ror.org/04vc81p87","country_code":"IT","type":"education","lineage":["https://openalex.org/I16337185"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Francesco Picariello","raw_affiliation_strings":["Department of Engineering, University of Sannio, Benevento, ITALY"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Sannio, Benevento, ITALY","institution_ids":["https://openalex.org/I16337185"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010415569","display_name":"Sergio Rapuano","orcid":"https://orcid.org/0000-0003-3249-0473"},"institutions":[{"id":"https://openalex.org/I16337185","display_name":"University of Sannio","ror":"https://ror.org/04vc81p87","country_code":"IT","type":"education","lineage":["https://openalex.org/I16337185"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Sergio Rapuano","raw_affiliation_strings":["Department of Engineering, University of Sannio, Benevento, ITALY"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Sannio, Benevento, ITALY","institution_ids":["https://openalex.org/I16337185"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087673689","display_name":"Ioan Tudosa","orcid":"https://orcid.org/0000-0002-5127-578X"},"institutions":[{"id":"https://openalex.org/I16337185","display_name":"University of Sannio","ror":"https://ror.org/04vc81p87","country_code":"IT","type":"education","lineage":["https://openalex.org/I16337185"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Ioan Tudosa","raw_affiliation_strings":["Department of Engineering, University of Sannio, Benevento, ITALY"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Sannio, Benevento, ITALY","institution_ids":["https://openalex.org/I16337185"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5029530605"],"corresponding_institution_ids":["https://openalex.org/I16337185"],"apc_list":null,"apc_paid":null,"fwci":0.1027,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.41398443,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wireline","display_name":"Wireline","score":0.9720190167427063},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.6380469799041748},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6192340850830078},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.6048687696456909},{"id":"https://openalex.org/keywords/impulse","display_name":"Impulse (physics)","score":0.5345681309700012},{"id":"https://openalex.org/keywords/discontinuity","display_name":"Discontinuity (linguistics)","score":0.5116358399391174},{"id":"https://openalex.org/keywords/side-channel-attack","display_name":"Side channel attack","score":0.5109612345695496},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.5088708400726318},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.508293092250824},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4152142107486725},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3886135220527649},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3497788906097412},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.20188680291175842},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1821477711200714},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.13528919219970703},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.10485300421714783},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0687423050403595}],"concepts":[{"id":"https://openalex.org/C2776951270","wikidata":"https://www.wikidata.org/wiki/Q8026910","display_name":"Wireline","level":3,"score":0.9720190167427063},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.6380469799041748},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6192340850830078},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.6048687696456909},{"id":"https://openalex.org/C70836080","wikidata":"https://www.wikidata.org/wiki/Q837940","display_name":"Impulse (physics)","level":2,"score":0.5345681309700012},{"id":"https://openalex.org/C2777042112","wikidata":"https://www.wikidata.org/wiki/Q5281658","display_name":"Discontinuity (linguistics)","level":2,"score":0.5116358399391174},{"id":"https://openalex.org/C49289754","wikidata":"https://www.wikidata.org/wiki/Q2267081","display_name":"Side channel attack","level":3,"score":0.5109612345695496},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5088708400726318},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.508293092250824},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4152142107486725},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3886135220527649},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3497788906097412},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.20188680291175842},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1821477711200714},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.13528919219970703},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.10485300421714783},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0687423050403595},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc43012.2020.9128477","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc43012.2020.9128477","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.4399999976158142,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1558713520","https://openalex.org/W1560461109","https://openalex.org/W1980445654","https://openalex.org/W2013646154","https://openalex.org/W2123789133","https://openalex.org/W2128012341","https://openalex.org/W2140856955","https://openalex.org/W2161872369","https://openalex.org/W2899871452","https://openalex.org/W2968844918","https://openalex.org/W2973123740","https://openalex.org/W2980336161","https://openalex.org/W6678120686"],"related_works":["https://openalex.org/W2368190399","https://openalex.org/W2374510365","https://openalex.org/W4200241224","https://openalex.org/W1964703610","https://openalex.org/W2759444425","https://openalex.org/W2085787479","https://openalex.org/W2015115382","https://openalex.org/W4246159570","https://openalex.org/W2381888053","https://openalex.org/W2356623904"],"abstract_inverted_index":{"The":[0,23,69,97],"paper":[1],"proposes":[2],"a":[3,18],"new":[4],"measurement":[5],"method":[6,24,76,99],"for":[7,107],"impairments":[8,83],"identification":[9],"in":[10,37],"wireline":[11],"channels":[12],"(i.e.":[13],"wire":[14],"cables)":[15],"by":[16],"exploiting":[17],"Compressive":[19],"Sampling":[20],"(CS)-based":[21],"technique.":[22],"consists":[25],"of":[26,32,45,79,92,110,114],"two-phases:":[27],"(i)":[28],"acquisition":[29],"and":[30,42,117],"reconstruction":[31],"the":[33,38,46,74,81,90,93,111],"channel":[34,47,65,82,95],"impulse":[35],"response":[36],"nominal":[39],"working":[40],"condition":[41],"(ii)":[43],"analysis":[44],"state":[48],"to":[49,59,103,118],"detect":[50],"any":[51],"physical":[52,112],"anomaly/discontinuity":[53],"like":[54],"deterioration":[55],"(e.g.":[56,67],"aging":[57],"due":[58],"harsh":[60],"environment)":[61],"or":[62],"unauthorized":[63],"side":[64],"attacks":[66],"taps).":[68],"first":[70],"results":[71],"demonstrate":[72],"that":[73,87],"proposed":[75,98],"is":[77],"capable":[78],"estimating":[80],"with":[84],"an":[85],"accuracy":[86],"could":[88,100],"allow":[89],"classification":[91],"main":[94],"impairments.":[96],"be":[101],"used":[102],"develop":[104],"low-cost":[105],"instrumentation":[106],"continuous":[108],"monitoring":[109],"layer":[113],"data":[115],"networks":[116],"improve":[119],"their":[120],"hardware":[121],"security.":[122]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}