{"id":"https://openalex.org/W2965664303","doi":"https://doi.org/10.1109/i2mtc.2019.8826926","title":"Waveguide Joint Design and Validation for use in Acoustic Vector-corrected Network Analysers","display_name":"Waveguide Joint Design and Validation for use in Acoustic Vector-corrected Network Analysers","publication_year":2019,"publication_date":"2019-05-01","ids":{"openalex":"https://openalex.org/W2965664303","doi":"https://doi.org/10.1109/i2mtc.2019.8826926","mag":"2965664303"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2019.8826926","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2019.8826926","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087921525","display_name":"Marcus MacDonell","orcid":null},"institutions":[{"id":"https://openalex.org/I52179390","display_name":"University of Waikato","ror":"https://ror.org/013fsnh78","country_code":"NZ","type":"education","lineage":["https://openalex.org/I52179390"]}],"countries":["NZ"],"is_corresponding":true,"raw_author_name":"Marcus MacDonell","raw_affiliation_strings":["Department of Engineering, University of Waikato, Hamilton, NZ"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Waikato, Hamilton, NZ","institution_ids":["https://openalex.org/I52179390"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086374222","display_name":"Keshav Basnet","orcid":"https://orcid.org/0000-0001-8145-9654"},"institutions":[{"id":"https://openalex.org/I52179390","display_name":"University of Waikato","ror":"https://ror.org/013fsnh78","country_code":"NZ","type":"education","lineage":["https://openalex.org/I52179390"]}],"countries":["NZ"],"is_corresponding":false,"raw_author_name":"Keshav Basnet","raw_affiliation_strings":["Department of Engineering, University of Waikato, Hamilton, NZ"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Waikato, Hamilton, NZ","institution_ids":["https://openalex.org/I52179390"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055888119","display_name":"Jonathan Scott","orcid":"https://orcid.org/0000-0001-8408-5176"},"institutions":[{"id":"https://openalex.org/I52179390","display_name":"University of Waikato","ror":"https://ror.org/013fsnh78","country_code":"NZ","type":"education","lineage":["https://openalex.org/I52179390"]}],"countries":["NZ"],"is_corresponding":false,"raw_author_name":"Jonathan Scott","raw_affiliation_strings":["Department of Engineering, University of Waikato, Hamilton, NZ"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Waikato, Hamilton, NZ","institution_ids":["https://openalex.org/I52179390"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5087921525"],"corresponding_institution_ids":["https://openalex.org/I52179390"],"apc_list":null,"apc_paid":null,"fwci":0.242,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55207379,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"41","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/repeatability","display_name":"Repeatability","score":0.8065701723098755},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7273962497711182},{"id":"https://openalex.org/keywords/waveguide","display_name":"Waveguide","score":0.603225588798523},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5845379829406738},{"id":"https://openalex.org/keywords/analyser","display_name":"Analyser","score":0.573124349117279},{"id":"https://openalex.org/keywords/rigidity","display_name":"Rigidity (electromagnetism)","score":0.5464287400245667},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.5005958080291748},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45764464139938354},{"id":"https://openalex.org/keywords/torque","display_name":"Torque","score":0.4155321717262268},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3299660384654999},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.31756308674812317},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2507147789001465},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16214320063591003},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.09744930267333984},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08270218968391418}],"concepts":[{"id":"https://openalex.org/C154020017","wikidata":"https://www.wikidata.org/wiki/Q520171","display_name":"Repeatability","level":2,"score":0.8065701723098755},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7273962497711182},{"id":"https://openalex.org/C200687136","wikidata":"https://www.wikidata.org/wiki/Q11233438","display_name":"Waveguide","level":2,"score":0.603225588798523},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5845379829406738},{"id":"https://openalex.org/C26834552","wikidata":"https://www.wikidata.org/wiki/Q3275846","display_name":"Analyser","level":2,"score":0.573124349117279},{"id":"https://openalex.org/C160343418","wikidata":"https://www.wikidata.org/wiki/Q185256","display_name":"Rigidity (electromagnetism)","level":2,"score":0.5464287400245667},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.5005958080291748},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45764464139938354},{"id":"https://openalex.org/C144171764","wikidata":"https://www.wikidata.org/wiki/Q48103","display_name":"Torque","level":2,"score":0.4155321717262268},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3299660384654999},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.31756308674812317},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2507147789001465},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16214320063591003},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.09744930267333984},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08270218968391418},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/i2mtc.2019.8826926","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2019.8826926","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},{"id":"pmh:oai:researchcommons.waikato.ac.nz:10289/12757","is_oa":false,"landing_page_url":"https://hdl.handle.net/10289/12757","pdf_url":null,"source":{"id":"https://openalex.org/S4306400944","display_name":"Research Commons (University of Waikato)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I52179390","host_organization_name":"University of Waikato","host_organization_lineage":["https://openalex.org/I52179390"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2019 IEEE International Instrumentation and Measurement Technology Conference","raw_type":"Conference Contribution"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1256458364","https://openalex.org/W1486344534","https://openalex.org/W2033785394","https://openalex.org/W2042625099","https://openalex.org/W2060635605","https://openalex.org/W2065079224","https://openalex.org/W2093668796","https://openalex.org/W2095441168","https://openalex.org/W2336645852","https://openalex.org/W2773005604","https://openalex.org/W2775779065","https://openalex.org/W6661095022","https://openalex.org/W6746866548"],"related_works":["https://openalex.org/W1904432136","https://openalex.org/W2774752550","https://openalex.org/W4288084846","https://openalex.org/W2893816048","https://openalex.org/W2039934116","https://openalex.org/W3168747143","https://openalex.org/W2315867670","https://openalex.org/W1968795594","https://openalex.org/W1973547290","https://openalex.org/W2387488705"],"abstract_inverted_index":{"The":[0,66,87],"Vector-corrected":[1],"Network":[2],"Analyser":[3],"(VNA)":[4],"has":[5,61],"been":[6,62,95],"an":[7,48],"indispensable":[8],"tool":[9],"for":[10,31,117,147],"many":[11],"decades":[12],"in":[13,43,133],"the":[14,22,44,76,79,124,130,150],"field":[15],"of":[16,24,68,78,90,137,149,161],"RF":[17],"and":[18,26,35,64,71,82,103,110,139,144,159],"microwave":[19],"engineering":[20],"where":[21],"availability":[23],"calibrated":[25,34],"traceable":[27,36],"results":[28],"is":[29,141],"taken":[30],"granted.":[32],"However,":[33],"measurements":[37,134],"are":[38],"not":[39],"so":[40],"easily":[41],"available":[42],"acoustic":[45,56,84,91],"domain.":[46],"In":[47],"effort":[49],"to":[50,105,115],"allow":[51,116,146],"such":[52],"measurements,":[53],"a":[54,99,111,118],"dual-port":[55],"vector":[57],"network":[58],"analyser":[59],"(AVNA)":[60],"designed":[63,104],"built.":[65],"calibration":[67,148],"this":[69],"test":[70],"measurement":[72],"system":[73,81,114],"hinges":[74],"on":[75],"repeatability":[77],"uncalibrated":[80],"its":[83],"waveguide":[85,92],"joints.":[86],"first":[88],"generation":[89],"joints":[93,155],"have":[94],"3D":[96],"printed":[97,153],"with":[98],"high":[100],"precision":[101],"printer":[102],"include":[106],"alignment":[107],"pins,":[108],"O-rings,":[109],"reinforcing":[112],"`clip'":[113],"consistent":[119],"bolt":[120],"torque":[121],"without":[122],"damaging":[123],"plastic":[125],"waveguide.":[126],"We":[127],"show":[128,156],"that":[129],"resulting":[131],"variation":[132],"between":[135],"cycles":[136],"disassembly":[138],"reassembly":[140],"acceptably":[142],"small":[143],"will":[145],"system.":[151],"Three-dimensional":[152],"titanium":[154],"increased":[157],"rigidity":[158],"ease":[160],"use":[162],"but":[163],"similar":[164],"repeatability.":[165]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}