{"id":"https://openalex.org/W2816814518","doi":"https://doi.org/10.1109/i2mtc.2018.8409649","title":"Prior based state reduction in backprojection type imaging algorithms for electrical tomography","display_name":"Prior based state reduction in backprojection type imaging algorithms for electrical tomography","publication_year":2018,"publication_date":"2018-05-01","ids":{"openalex":"https://openalex.org/W2816814518","doi":"https://doi.org/10.1109/i2mtc.2018.8409649","mag":"2816814518"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2018.8409649","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2018.8409649","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045815402","display_name":"Markus Neumayer","orcid":"https://orcid.org/0000-0003-1975-8578"},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"M. Neumayer","raw_affiliation_strings":["Institute of Electrical Measurement and Measurement Signal Processing, Graz University of Technology, Graz, Austria"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical Measurement and Measurement Signal Processing, Graz University of Technology, Graz, Austria","institution_ids":["https://openalex.org/I4092182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048869434","display_name":"Matthias Flatscher","orcid":"https://orcid.org/0000-0001-5343-6017"},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"M. Flatscher","raw_affiliation_strings":["Institute of Electrical Measurement and Measurement Signal Processing, Graz University of Technology, Graz, Austria"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical Measurement and Measurement Signal Processing, Graz University of Technology, Graz, Austria","institution_ids":["https://openalex.org/I4092182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053054916","display_name":"Thomas Bretterklieber","orcid":"https://orcid.org/0000-0003-4890-6672"},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"T. Bretterklieber","raw_affiliation_strings":["Institute of Electrical Measurement and Measurement Signal Processing, Graz University of Technology, Graz, Austria"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical Measurement and Measurement Signal Processing, Graz University of Technology, Graz, Austria","institution_ids":["https://openalex.org/I4092182"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082370719","display_name":"Stefan Puttinger","orcid":"https://orcid.org/0000-0002-7992-1229"},"institutions":[{"id":"https://openalex.org/I121883995","display_name":"Johannes Kepler University of Linz","ror":"https://ror.org/052r2xn60","country_code":"AT","type":"education","lineage":["https://openalex.org/I121883995"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"S. Puttinger","raw_affiliation_strings":["Department of Particulate Flow Modelling, Johannes Kepler University, Linz, Austria"],"affiliations":[{"raw_affiliation_string":"Department of Particulate Flow Modelling, Johannes Kepler University, Linz, Austria","institution_ids":["https://openalex.org/I121883995"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5045815402"],"corresponding_institution_ids":["https://openalex.org/I4092182"],"apc_list":null,"apc_paid":null,"fwci":0.2575,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.56305512,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"83","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9871000051498413,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.841600775718689},{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.8279648423194885},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7384538054466248},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.6775229573249817},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5312471389770508},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5110300779342651},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.48234933614730835},{"id":"https://openalex.org/keywords/inverse-problem","display_name":"Inverse problem","score":0.47069811820983887},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4389406740665436},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.2894279956817627},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.24407732486724854},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18734893202781677},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1070617139339447},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.08351007103919983}],"concepts":[{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.841600775718689},{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.8279648423194885},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7384538054466248},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.6775229573249817},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5312471389770508},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5110300779342651},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.48234933614730835},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.47069811820983887},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4389406740665436},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2894279956817627},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.24407732486724854},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18734893202781677},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1070617139339447},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.08351007103919983},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2018.8409649","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2018.8409649","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.4399999976158142,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W967780236","https://openalex.org/W1531455566","https://openalex.org/W2041717489","https://openalex.org/W2133922432","https://openalex.org/W2228680147","https://openalex.org/W2501135295","https://openalex.org/W2530307286","https://openalex.org/W2738713754","https://openalex.org/W2897807752","https://openalex.org/W3140903534","https://openalex.org/W6689226347","https://openalex.org/W6792625320"],"related_works":["https://openalex.org/W2170544729","https://openalex.org/W2090093661","https://openalex.org/W2031832834","https://openalex.org/W3211685995","https://openalex.org/W2532315310","https://openalex.org/W2061980133","https://openalex.org/W2097442821","https://openalex.org/W2157674401","https://openalex.org/W1974104633","https://openalex.org/W2725829804"],"abstract_inverted_index":{"Electrical":[0],"tomography":[1,30],"systems":[2],"are":[3,24],"imaging":[4,36],"based":[5],"measurement":[6],"systems,":[7],"which":[8],"draw":[9],"information":[10],"about":[11],"an":[12,16],"inner":[13],"state":[14,87,95],"of":[15,55,57,75,85,107],"object":[17],"from":[18],"electrical":[19,25,28,32],"impedance":[20,26],"systems.":[21],"Among":[22],"them":[23],"tomography,":[27],"capacitance":[29],"or":[31],"resistance":[33],"tomography.":[34],"For":[35],"reconstruction":[37,50,101],"a":[38,53,86],"highly":[39],"dimensional,":[40],"ill-posed":[41],"inverse":[42],"problem":[43],"has":[44],"to":[45,69,90,113],"be":[46],"solved.":[47],"Back-projection":[48],"type":[49,100],"methods":[51],"mark":[52],"class":[54],"algorithms":[56],"low":[58],"computational":[59],"complexity.":[60],"Still,":[61],"the":[62,70,73,83,92,105],"high":[63,93],"dimensionality":[64],"causes":[65],"restrictions":[66],"with":[67,111],"respect":[68,112],"quality":[71],"and":[72,117],"robustness":[74,116],"these":[76],"methods.":[77,102],"In":[78],"this":[79,108],"work":[80],"we":[81],"show":[82,118],"incorporation":[84],"reduction":[88],"technique":[89],"reduce":[91],"dimensional":[94],"vector":[96],"within":[97],"different":[98],"backprojection":[99],"We":[103],"demonstrate":[104],"usefulness":[106],"approach":[109],"e.g.":[110],"its":[114,119],"enhanced":[115],"application":[120],"for":[121],"measurements":[122],"in":[123],"non-stationary":[124],"industrial":[125],"flow":[126],"monitoring.":[127]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}