{"id":"https://openalex.org/W2734505768","doi":"https://doi.org/10.1109/i2mtc.2017.7969949","title":"Experimental performance assessment of compressive sampling-based THz imaging systems","display_name":"Experimental performance assessment of compressive sampling-based THz imaging systems","publication_year":2017,"publication_date":"2017-05-01","ids":{"openalex":"https://openalex.org/W2734505768","doi":"https://doi.org/10.1109/i2mtc.2017.7969949","mag":"2734505768"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2017.7969949","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2017.7969949","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046390329","display_name":"Leopoldo Angrisani","orcid":"https://orcid.org/0000-0001-6932-6891"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Leopoldo Angrisani","raw_affiliation_strings":["Dept. of Technology Information and Electrical Engineering"],"affiliations":[{"raw_affiliation_string":"Dept. of Technology Information and Electrical Engineering","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075309288","display_name":"Francesco Bonavolont\u00e0","orcid":"https://orcid.org/0000-0003-0666-0942"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Francesco Bonavolonta","raw_affiliation_strings":["Dept. of Technology Information and Electrical Engineering"],"affiliations":[{"raw_affiliation_string":"Dept. of Technology Information and Electrical Engineering","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015187471","display_name":"Giovanni Cavallo","orcid":"https://orcid.org/0000-0001-7873-8396"},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giovanni Cavallo","raw_affiliation_strings":["Dept. of Technology Information and Electrical Engineering, Dept. of Industrial Engineering, Universit\u00e0 di Napoli Federico II, Naples, Italy"],"affiliations":[{"raw_affiliation_string":"Dept. of Technology Information and Electrical Engineering, Dept. of Industrial Engineering, Universit\u00e0 di Napoli Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013549141","display_name":"Annalisa Liccardo","orcid":"https://orcid.org/0000-0003-1270-4948"},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Annalisa Liccardo","raw_affiliation_strings":["Dept. of Technology Information and Electrical Engineering, Dept. of Industrial Engineering, Universit\u00e0 di Napoli Federico II, Naples, Italy"],"affiliations":[{"raw_affiliation_string":"Dept. of Technology Information and Electrical Engineering, Dept. of Industrial Engineering, Universit\u00e0 di Napoli Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040014017","display_name":"Rosario Schiano Lo Moriello","orcid":"https://orcid.org/0000-0003-4875-2845"},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Rosario Schiano Lo Moriello","raw_affiliation_strings":["Dept. of Industrial Engineering, Universit\u00e0 di Napoli Federico II, Naples, Italy"],"affiliations":[{"raw_affiliation_string":"Dept. of Industrial Engineering, Universit\u00e0 di Napoli Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061935092","display_name":"A. Andreone","orcid":"https://orcid.org/0000-0002-6603-8162"},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonello Andreone","raw_affiliation_strings":["Dipartimento di Fisica \u201cEttore Pancini\u201d, Universit\u00e0 di Napoli Federico II, Naples, Italy","Dipartimento di Fisica \"Ettore Pancini\", Universit\u00e0 di Napoli Federico II, Naples, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Fisica \u201cEttore Pancini\u201d, Universit\u00e0 di Napoli Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]},{"raw_affiliation_string":"Dipartimento di Fisica \"Ettore Pancini\", Universit\u00e0 di Napoli Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061460999","display_name":"Gian Paolo Papari","orcid":"https://orcid.org/0000-0003-2368-0064"},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gianpaolo Papari","raw_affiliation_strings":["Dipartimento di Fisica \u201cEttore Pancini\u201d, Universit\u00e0 di Napoli Federico II, Naples, Italy","Dipartimento di Fisica \"Ettore Pancini\", Universit\u00e0 di Napoli Federico II, Naples, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Fisica \u201cEttore Pancini\u201d, Universit\u00e0 di Napoli Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]},{"raw_affiliation_string":"Dipartimento di Fisica \"Ettore Pancini\", Universit\u00e0 di Napoli Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5046390329"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.43,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.64625343,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.7617296576499939},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6590904593467712},{"id":"https://openalex.org/keywords/terahertz-radiation","display_name":"Terahertz radiation","score":0.6489481925964355},{"id":"https://openalex.org/keywords/raster-graphics","display_name":"Raster graphics","score":0.595409631729126},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5874009728431702},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.575574517250061},{"id":"https://openalex.org/keywords/compressed-sensing","display_name":"Compressed sensing","score":0.5740058422088623},{"id":"https://openalex.org/keywords/raster-scan","display_name":"Raster scan","score":0.5369159579277039},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.5364990830421448},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.4890023469924927},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.45834633708000183},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.41694408655166626},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3539361357688904},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.33321118354797363},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.32218268513679504},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3106305003166199},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21273839473724365},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.18678274750709534},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.10107883810997009},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07593047618865967}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.7617296576499939},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6590904593467712},{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.6489481925964355},{"id":"https://openalex.org/C181844469","wikidata":"https://www.wikidata.org/wiki/Q182270","display_name":"Raster graphics","level":2,"score":0.595409631729126},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5874009728431702},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.575574517250061},{"id":"https://openalex.org/C124851039","wikidata":"https://www.wikidata.org/wiki/Q2665459","display_name":"Compressed sensing","level":2,"score":0.5740058422088623},{"id":"https://openalex.org/C145406643","wikidata":"https://www.wikidata.org/wiki/Q2641959","display_name":"Raster scan","level":2,"score":0.5369159579277039},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.5364990830421448},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.4890023469924927},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.45834633708000183},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.41694408655166626},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3539361357688904},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33321118354797363},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.32218268513679504},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3106305003166199},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21273839473724365},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.18678274750709534},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.10107883810997009},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07593047618865967},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2017.7969949","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2017.7969949","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","score":0.46000000834465027,"display_name":"Sustainable cities and communities"},{"id":"https://metadata.un.org/sdg/9","score":0.4300000071525574,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W284784117","https://openalex.org/W1968545999","https://openalex.org/W2009997378","https://openalex.org/W2052255254","https://openalex.org/W2065175246","https://openalex.org/W2109357213","https://openalex.org/W2122548617","https://openalex.org/W2133665775","https://openalex.org/W2136446693","https://openalex.org/W2164452299","https://openalex.org/W2167697843","https://openalex.org/W2167862216","https://openalex.org/W2174358748","https://openalex.org/W2352616222","https://openalex.org/W2394523206","https://openalex.org/W2963713691","https://openalex.org/W4250955649","https://openalex.org/W6610331208","https://openalex.org/W6711838394"],"related_works":["https://openalex.org/W2093392189","https://openalex.org/W1984055937","https://openalex.org/W4385770201","https://openalex.org/W1974004953","https://openalex.org/W2072796508","https://openalex.org/W204409194","https://openalex.org/W4397293267","https://openalex.org/W2377833861","https://openalex.org/W2028294394","https://openalex.org/W2027078417"],"abstract_inverted_index":{"The":[0],"paper":[1],"aims":[2],"at":[3,72],"experimentally":[4],"assessing":[5],"the":[6,43,60,70,83,86,95,99,106,139,142,146],"metrological":[7,112],"performance":[8],"of":[9,26,45,52,62,98,101,135,141,145,156],"a":[10,55,111,131,151],"compressive":[11],"sampling":[12],"(CS)-based":[13],"terahertz":[14],"(THz)":[15],"imaging":[16],"system,":[17],"an":[18],"emerging":[19],"technology":[20],"for":[21,122],"carrying":[22],"out":[23],"non-destructive":[24],"tests":[25],"materials":[27],"in":[28,48,54,77,118,138,154],"order":[29],"to":[30,59,90,129,149],"detect":[31],"defects":[32],"and":[33,79],"flaws.":[34],"Differently":[35],"from":[36],"systems":[37],"based":[38],"on":[39,94,105],"traditional":[40],"raster":[41],"scan,":[42],"exploitation":[44],"CS":[46],"allows,":[47],"fact,":[49],"obtaining":[50],"images":[51],"interest":[53],"reduced":[56],"observation":[57],"interval":[58],"detriment":[61],"accuracy.":[63],"In":[64],"literature,":[65],"several":[66],"studies":[67],"have":[68,88],"faced":[69],"topic":[71],"hand":[73],"showing":[74],"results":[75],"obtained":[76],"simulated":[78],"real":[80],"conditions.":[81],"On":[82],"same":[84],"way,":[85],"authors":[87],"decided":[89],"focus":[91],"their":[92],"attention":[93],"experimental":[96],"investigation":[97],"impact":[100],"some":[102],"uncertainty":[103],"sources":[104],"final":[107],"image":[108],"reconstruction":[109,157],"realizing":[110],"characterization":[113],"that":[114],"could":[115],"be":[116],"used":[117],"different":[119],"fields":[120],"as":[121],"example":[123],"aerospace.":[124],"It":[125],"is":[126],"so":[127],"possible":[128],"provide":[130],"preliminary":[132],"roadmap":[133],"capable":[134],"driving":[136],"experimenters":[137],"definition":[140],"main":[143],"features":[144],"measurement":[147],"setup":[148],"achieve":[150],"defined":[152],"goal":[153],"term":[155],"quality.":[158]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}