{"id":"https://openalex.org/W2736037874","doi":"https://doi.org/10.1109/i2mtc.2017.7969897","title":"Measuring the thickness of transparent objects using a confocal displacement sensor","display_name":"Measuring the thickness of transparent objects using a confocal displacement sensor","publication_year":2017,"publication_date":"2017-05-01","ids":{"openalex":"https://openalex.org/W2736037874","doi":"https://doi.org/10.1109/i2mtc.2017.7969897","mag":"2736037874"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2017.7969897","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2017.7969897","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041670079","display_name":"Chun-Jen Weng","orcid":"https://orcid.org/0000-0003-1489-5194"},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Applied Research Laboratories","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"funder","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chun-Jen Weng","raw_affiliation_strings":["Instrument Technology Research Center, National Applied Research Laboratories"],"affiliations":[{"raw_affiliation_string":"Instrument Technology Research Center, National Applied Research Laboratories","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075212078","display_name":"Borong Lu","orcid":"https://orcid.org/0000-0002-6142-3731"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Bo-Rong Lu","raw_affiliation_strings":["Department of Mechanical Engineering, National Chiao Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103706009","display_name":"Pi-Ying Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Pi-Ying Cheng","raw_affiliation_strings":["Department of Mechanical Engineering, National Chiao Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052774947","display_name":"Chi-Hung Hwang","orcid":"https://orcid.org/0000-0003-4492-8647"},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Applied Research Laboratories","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"funder","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chi-Hung Hwang","raw_affiliation_strings":["Instrument Technology Research Center, National Applied Research Laboratories"],"affiliations":[{"raw_affiliation_string":"Instrument Technology Research Center, National Applied Research Laboratories","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024549249","display_name":"Chih\u2010Yen Chen","orcid":"https://orcid.org/0000-0001-6519-3614"},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Applied Research Laboratories","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"funder","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Yen Chen","raw_affiliation_strings":["Instrument Technology Research Center, National Applied Research Laboratories"],"affiliations":[{"raw_affiliation_string":"Instrument Technology Research Center, National Applied Research Laboratories","institution_ids":["https://openalex.org/I4210166867"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5041670079"],"corresponding_institution_ids":["https://openalex.org/I4210166867"],"apc_list":null,"apc_paid":null,"fwci":0.4407,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.6465738,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"78","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.7235870361328125},{"id":"https://openalex.org/keywords/displacement","display_name":"Displacement (psychology)","score":0.6723787784576416},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5923569202423096},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.5909597277641296},{"id":"https://openalex.org/keywords/confocal","display_name":"Confocal","score":0.5467686057090759},{"id":"https://openalex.org/keywords/optical-power","display_name":"Optical power","score":0.5134897828102112},{"id":"https://openalex.org/keywords/focal-length","display_name":"Focal length","score":0.4907892644405365},{"id":"https://openalex.org/keywords/lens","display_name":"Lens (geology)","score":0.48945489525794983},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.46640104055404663},{"id":"https://openalex.org/keywords/cardinal-point","display_name":"Cardinal point","score":0.4544515907764435},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.21770909428596497},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17751842737197876}],"concepts":[{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7235870361328125},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.6723787784576416},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5923569202423096},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.5909597277641296},{"id":"https://openalex.org/C136009344","wikidata":"https://www.wikidata.org/wiki/Q336201","display_name":"Confocal","level":2,"score":0.5467686057090759},{"id":"https://openalex.org/C191161701","wikidata":"https://www.wikidata.org/wiki/Q559265","display_name":"Optical power","level":3,"score":0.5134897828102112},{"id":"https://openalex.org/C82552819","wikidata":"https://www.wikidata.org/wiki/Q193540","display_name":"Focal length","level":3,"score":0.4907892644405365},{"id":"https://openalex.org/C15336307","wikidata":"https://www.wikidata.org/wiki/Q1766051","display_name":"Lens (geology)","level":2,"score":0.48945489525794983},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.46640104055404663},{"id":"https://openalex.org/C138395690","wikidata":"https://www.wikidata.org/wiki/Q376733","display_name":"Cardinal point","level":2,"score":0.4544515907764435},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.21770909428596497},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17751842737197876},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2017.7969897","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2017.7969897","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2009929691","https://openalex.org/W2012100795","https://openalex.org/W2039838494","https://openalex.org/W2051162467","https://openalex.org/W2054357070","https://openalex.org/W2072969966","https://openalex.org/W2093599762","https://openalex.org/W2163322630","https://openalex.org/W2170504874","https://openalex.org/W2479760928","https://openalex.org/W2519418804","https://openalex.org/W4285719527","https://openalex.org/W6721682579"],"related_works":["https://openalex.org/W2362982972","https://openalex.org/W4310508253","https://openalex.org/W2899776212","https://openalex.org/W2149109886","https://openalex.org/W3009804950","https://openalex.org/W2468858520","https://openalex.org/W2391906101","https://openalex.org/W1986315617","https://openalex.org/W2077215251","https://openalex.org/W2382178103"],"abstract_inverted_index":{"This":[0],"paper":[1],"reports":[2],"on":[3],"a":[4,36,97],"confocal":[5],"displacement":[6],"sensor":[7],"with":[8,65],"varifocal":[9,24],"lens":[10,25],"used":[11,86,94],"to":[12,54,60,87,95],"measure":[13,74,88],"the":[14,23,30,41,44,66,79,89,104,115,118],"thickness":[15,116],"of":[16,22,43,69,112,117],"transparent":[17,37],"materials.":[18],"The":[19,62,100],"focal":[20,45],"length":[21,46],"is":[26,85,93],"adjusted":[27],"by":[28],"varying":[29],"current.":[31],"Laser":[32],"light":[33],"passing":[34],"through":[35],"target":[38],"lying":[39],"within":[40],"range":[42],"crosses":[47],"two":[48,105],"interfaces;":[49],"i.e.,":[50],"first":[51],"from":[52,58],"air":[53],"glass":[55,59],"and":[56,91],"then":[57],"air.":[61],"signals":[63],"associated":[64],"interface":[67],"were":[68],"higher":[70],"intensity":[71],"than":[72],"that":[73],"at":[75],"other":[76],"points":[77],"along":[78],"z":[80],"axis.":[81],"A":[82],"power":[83,90],"meter":[84],"LabVIEW":[92],"record":[96],"power-current":[98],"graph.":[99],"current":[101],"gap":[102],"between":[103],"peaks":[106],"can":[107],"be":[108],"translated":[109],"into":[110],"values":[111],"displacement,":[113],"indicating":[114],"material.":[119]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}