{"id":"https://openalex.org/W2949488304","doi":"https://doi.org/10.1109/i2mtc.2017.7969787","title":"Calibration setup for ultralow-current transresistance amplifiers","display_name":"Calibration setup for ultralow-current transresistance amplifiers","publication_year":2017,"publication_date":"2017-05-01","ids":{"openalex":"https://openalex.org/W2949488304","doi":"https://doi.org/10.1109/i2mtc.2017.7969787","mag":"2949488304"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2017.7969787","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2017.7969787","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057992623","display_name":"Ilaria Finardi","orcid":"https://orcid.org/0000-0003-0088-3344"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]},{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Ilaria Finardi","raw_affiliation_strings":["INRIM-Istituto Nazionale di Ricerca Metrologica, Torino, Italy","Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"INRIM-Istituto Nazionale di Ricerca Metrologica, Torino, Italy","institution_ids":["https://openalex.org/I4210136559"]},{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086308147","display_name":"Luca Callegaro","orcid":"https://orcid.org/0000-0001-5997-9960"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Callegaro","raw_affiliation_strings":["INRIM-Istituto Nazionale di Ricerca Metrologica, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"INRIM-Istituto Nazionale di Ricerca Metrologica, Torino, Italy","institution_ids":["https://openalex.org/I4210136559"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5057992623"],"corresponding_institution_ids":["https://openalex.org/I177477856","https://openalex.org/I4210136559"],"apc_list":null,"apc_paid":null,"fwci":0.267,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.50709349,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"37","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11434","display_name":"Electrochemical Analysis and Applications","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1603","display_name":"Electrochemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11434","display_name":"Electrochemical Analysis and Applications","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1603","display_name":"Electrochemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9872999787330627,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.8216502070426941},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.7350590229034424},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6883389353752136},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5650955438613892},{"id":"https://openalex.org/keywords/current-sense-amplifier","display_name":"Current sense amplifier","score":0.5277317762374878},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5010919570922852},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4927575886249542},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.475950688123703},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35272371768951416},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32810840010643005},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3162001967430115},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.2961161136627197},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.16761305928230286},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1363847851753235},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.12157869338989258},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10782787203788757}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.8216502070426941},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.7350590229034424},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6883389353752136},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5650955438613892},{"id":"https://openalex.org/C182442803","wikidata":"https://www.wikidata.org/wiki/Q5195113","display_name":"Current sense amplifier","level":5,"score":0.5277317762374878},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5010919570922852},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4927575886249542},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.475950688123703},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35272371768951416},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32810840010643005},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3162001967430115},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.2961161136627197},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.16761305928230286},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1363847851753235},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.12157869338989258},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10782787203788757},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/i2mtc.2017.7969787","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2017.7969787","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},{"id":"pmh:oai:iris.inrim.it:11696/56731","is_oa":false,"landing_page_url":"http://hdl.handle.net/11696/56731","pdf_url":null,"source":{"id":"https://openalex.org/S4306400708","display_name":"CINECA IRIS Institutional Research Information System (IRIS Istituto Nazionale di Ricerca Metrologica)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I27837315","host_organization_name":"University of Michigan","host_organization_lineage":["https://openalex.org/I27837315"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1646685143","https://openalex.org/W1681823979","https://openalex.org/W1870912220","https://openalex.org/W1986621522","https://openalex.org/W1998246386","https://openalex.org/W2027722045","https://openalex.org/W2034870529","https://openalex.org/W2038008859","https://openalex.org/W2071140067","https://openalex.org/W2073029777","https://openalex.org/W2092152843","https://openalex.org/W2101211489","https://openalex.org/W2105522406","https://openalex.org/W2119332195","https://openalex.org/W2122226759","https://openalex.org/W2139126750","https://openalex.org/W2148492330","https://openalex.org/W2151709370","https://openalex.org/W2159196747","https://openalex.org/W2336386441","https://openalex.org/W2339502709","https://openalex.org/W2481735941","https://openalex.org/W2989459258","https://openalex.org/W3100399333","https://openalex.org/W3101833901","https://openalex.org/W6721822967","https://openalex.org/W6891873627"],"related_works":["https://openalex.org/W2157802116","https://openalex.org/W994323718","https://openalex.org/W200089558","https://openalex.org/W2022738546","https://openalex.org/W2024941792","https://openalex.org/W1594109447","https://openalex.org/W1585300074","https://openalex.org/W2032596396","https://openalex.org/W2477444208","https://openalex.org/W3047813805"],"abstract_inverted_index":{"We":[0],"describe":[1],"a":[2],"calibration":[3,17,54],"setup":[4,33],"for":[5,28],"the":[6,13,22,49,69,73],"transre-sistance":[7],"of":[8,25,59,62,68],"low-current":[9],"amplifiers,":[10],"based":[11],"on":[12],"capacitance-charging":[14],"method.":[15],"The":[16,32,53,64],"can":[18],"be":[19,43],"performed":[20],"in":[21,45,72],"current":[23],"range":[24],"typical":[26],"interest":[27],"electron":[29],"counting":[30],"experiments.":[31],"implementation":[34,70],"is":[35,40,51,55,71],"simple":[36],"and":[37,39,61],"rugged,":[38],"suitable":[41],"to":[42,57],"embedded":[44],"larger":[46],"experiments":[47],"where":[48],"amplifier":[50],"employed.":[52],"traceable":[56],"units":[58],"capacitance":[60],"time.":[63],"base":[65],"relative":[66],"accuracy":[67],"10":[74],"<sup":[75],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[76],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-5</sup>":[77],"range.":[78]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}