{"id":"https://openalex.org/W2735405390","doi":"https://doi.org/10.1109/i2mtc.2017.7969685","title":"An automatic system for testing of low-cost electric energy meters under distorted conditions","display_name":"An automatic system for testing of low-cost electric energy meters under distorted conditions","publication_year":2017,"publication_date":"2017-05-01","ids":{"openalex":"https://openalex.org/W2735405390","doi":"https://doi.org/10.1109/i2mtc.2017.7969685","mag":"2735405390"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2017.7969685","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2017.7969685","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035166375","display_name":"Giovanni Bucci","orcid":"https://orcid.org/0000-0002-5605-1136"},"institutions":[{"id":"https://openalex.org/I26415053","display_name":"University of L'Aquila","ror":"https://ror.org/01j9p1r26","country_code":"IT","type":"education","lineage":["https://openalex.org/I26415053"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Giovanni Bucci","raw_affiliation_strings":["Dipartimento di Ingegneria Industriale e dell'Informazione e di Economia, Universit\u00e0 degli Studi dell'Aquila, L'Aquila, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria Industriale e dell'Informazione e di Economia, Universit\u00e0 degli Studi dell'Aquila, L'Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000206566","display_name":"Fabrizio Ciancetta","orcid":"https://orcid.org/0000-0002-1676-5273"},"institutions":[{"id":"https://openalex.org/I26415053","display_name":"University of L'Aquila","ror":"https://ror.org/01j9p1r26","country_code":"IT","type":"education","lineage":["https://openalex.org/I26415053"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Fabrizio Ciancetta","raw_affiliation_strings":["Dipartimento di Ingegneria Industriale e dell'Informazione e di Economia, Universit\u00e0 degli Studi dell'Aquila, L'Aquila, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria Industriale e dell'Informazione e di Economia, Universit\u00e0 degli Studi dell'Aquila, L'Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011601212","display_name":"Flavio D'Innocenzo","orcid":null},"institutions":[{"id":"https://openalex.org/I26415053","display_name":"University of L'Aquila","ror":"https://ror.org/01j9p1r26","country_code":"IT","type":"education","lineage":["https://openalex.org/I26415053"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Flavio D'Innocenzo","raw_affiliation_strings":["Dipartimento di Ingegneria Industriale e dell'Informazione e di Economia, Universit\u00e0 degli Studi dell'Aquila, L'Aquila, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria Industriale e dell'Informazione e di Economia, Universit\u00e0 degli Studi dell'Aquila, L'Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036826718","display_name":"Edoardo Fiorucci","orcid":"https://orcid.org/0000-0001-6244-5521"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Edoardo Fiorucci","raw_affiliation_strings":["Dipartimento di Ingegneria Industriale e dell'Informazione, Seconda Universit\u00e0 di, Napoli Aversa, CE, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria Industriale e dell'Informazione, Seconda Universit\u00e0 di, Napoli Aversa, CE, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090407044","display_name":"Daniele Gallo","orcid":"https://orcid.org/0000-0002-1553-7498"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Daniele Gallo","raw_affiliation_strings":["Dipartimento di Ingegneria Industriale e dell'Informazione, Seconda Universit\u00e0 di, Napoli Aversa, CE, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria Industriale e dell'Informazione, Seconda Universit\u00e0 di, Napoli Aversa, CE, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058303973","display_name":"Carmine Landi","orcid":"https://orcid.org/0000-0003-0922-883X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Carmine Landi","raw_affiliation_strings":["Dipartimento di Ingegneria Industriale e dell'Informazione, Seconda Universit\u00e0 di, Napoli Aversa, CE, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria Industriale e dell'Informazione, Seconda Universit\u00e0 di, Napoli Aversa, CE, Italy","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011115933","display_name":"Mario Luiso","orcid":"https://orcid.org/0000-0003-1311-9791"},"institutions":[{"id":"https://openalex.org/I26415053","display_name":"University of L'Aquila","ror":"https://ror.org/01j9p1r26","country_code":"IT","type":"education","lineage":["https://openalex.org/I26415053"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Mario Luiso","raw_affiliation_strings":["Dipartimento di Ingegneria Industriale e dell'Informazione e di Economia, Universit\u00e0 degli Studi dell'Aquila, L'Aquila, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria Industriale e dell'Informazione e di Economia, Universit\u00e0 degli Studi dell'Aquila, L'Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5035166375"],"corresponding_institution_ids":["https://openalex.org/I26415053"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.07797664,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"58","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.720399022102356},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.6893821954727173},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.5873031616210938},{"id":"https://openalex.org/keywords/electricity-meter","display_name":"Electricity meter","score":0.5752953886985779},{"id":"https://openalex.org/keywords/metre","display_name":"Metre","score":0.5663209557533264},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5333459377288818},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.4975939095020294},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.49743178486824036},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.48884743452072144},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.4814009666442871},{"id":"https://openalex.org/keywords/energy-cost","display_name":"Energy cost","score":0.4789998233318329},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.421691358089447},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3510444462299347},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3285660743713379},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.22796612977981567},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.09552463889122009},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08306419849395752},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.070370614528656}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.720399022102356},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.6893821954727173},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.5873031616210938},{"id":"https://openalex.org/C67172668","wikidata":"https://www.wikidata.org/wiki/Q622756","display_name":"Electricity meter","level":3,"score":0.5752953886985779},{"id":"https://openalex.org/C151011524","wikidata":"https://www.wikidata.org/wiki/Q11573","display_name":"Metre","level":2,"score":0.5663209557533264},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5333459377288818},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.4975939095020294},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.49743178486824036},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.48884743452072144},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.4814009666442871},{"id":"https://openalex.org/C3019966295","wikidata":"https://www.wikidata.org/wiki/Q1341368","display_name":"Energy cost","level":2,"score":0.4789998233318329},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.421691358089447},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3510444462299347},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3285660743713379},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.22796612977981567},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.09552463889122009},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08306419849395752},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.070370614528656},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C170154142","wikidata":"https://www.wikidata.org/wiki/Q150737","display_name":"Architectural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2017.7969685","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2017.7969685","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8700000047683716,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1515271041","https://openalex.org/W1981676841","https://openalex.org/W2041787566","https://openalex.org/W2062461680","https://openalex.org/W2091353523","https://openalex.org/W2117971900","https://openalex.org/W2122078810","https://openalex.org/W2127411560","https://openalex.org/W2141766451","https://openalex.org/W2142732517","https://openalex.org/W2168285483","https://openalex.org/W2548078389","https://openalex.org/W2566503032"],"related_works":["https://openalex.org/W2886943583","https://openalex.org/W1993178475","https://openalex.org/W1999617696","https://openalex.org/W1484726954","https://openalex.org/W2119346672","https://openalex.org/W2058431428","https://openalex.org/W4402811721","https://openalex.org/W2062747959","https://openalex.org/W4387693526","https://openalex.org/W1635126885"],"abstract_inverted_index":{"Often":[0],"low":[1,59,79],"cost":[2,60,80],"electrical":[3],"energy":[4,61],"meters":[5,62],"are":[6,22],"required":[7],"to":[8,53],"perform":[9,54],"their":[10,27],"measurement":[11],"task":[12],"in":[13,19,64],"distorted":[14,65],"conditions":[15],"far":[16],"from":[17],"those":[18],"which":[20],"they":[21],"designed":[23,50],"and":[24,51,85],"tested.":[25],"For":[26],"metrological":[28,56],"characterization,":[29],"the":[30,74],"use":[31],"of":[32,58,70,76],"primary":[33],"systems":[34],"is":[35],"inappropriate":[36],"or":[37],"at":[38],"least":[39],"excessively":[40],"expensive.":[41],"This":[42],"paper":[43],"introduces":[44],"an":[45],"automated":[46],"test":[47],"system":[48,72],"specifically":[49],"implemented":[52],"a":[55,77],"characterization":[57,75],"even":[63],"conditions.":[66],"The":[67],"experimental":[68],"application":[69],"developed":[71],"for":[73],"commercial":[78],"meter":[81],"shows":[82],"satisfying":[83],"performance":[84],"wide":[86],"versatility.":[87]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}