{"id":"https://openalex.org/W2477641787","doi":"https://doi.org/10.1109/i2mtc.2016.7520350","title":"A variable-threshold voltage technique to enhance the linearity of folding-integration/cyclic cascaded ADCs","display_name":"A variable-threshold voltage technique to enhance the linearity of folding-integration/cyclic cascaded ADCs","publication_year":2016,"publication_date":"2016-05-01","ids":{"openalex":"https://openalex.org/W2477641787","doi":"https://doi.org/10.1109/i2mtc.2016.7520350","mag":"2477641787"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2016.7520350","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2016.7520350","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057946342","display_name":"Tongxi Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Tongxi Wang","raw_affiliation_strings":["Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan"],"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","institution_ids":["https://openalex.org/I1298590031"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065338590","display_name":"Shoji Kawahito","orcid":"https://orcid.org/0000-0003-4456-5006"},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shoji Kawahito","raw_affiliation_strings":["Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan"],"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","institution_ids":["https://openalex.org/I1298590031"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5057946342"],"corresponding_institution_ids":["https://openalex.org/I1298590031"],"apc_list":null,"apc_paid":null,"fwci":0.1709,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.5613077,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.7252193093299866},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.6986541748046875},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.6561598777770996},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6071575880050659},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5998649597167969},{"id":"https://openalex.org/keywords/input-offset-voltage","display_name":"Input offset voltage","score":0.5795133709907532},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5306885242462158},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5248938798904419},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.45314157009124756},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4478868842124939},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.33369529247283936},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2841030955314636},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1950802206993103}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.7252193093299866},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.6986541748046875},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.6561598777770996},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6071575880050659},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5998649597167969},{"id":"https://openalex.org/C63651839","wikidata":"https://www.wikidata.org/wiki/Q478566","display_name":"Input offset voltage","level":5,"score":0.5795133709907532},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5306885242462158},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5248938798904419},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.45314157009124756},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4478868842124939},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.33369529247283936},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2841030955314636},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1950802206993103}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2016.7520350","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2016.7520350","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6299999952316284,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1646646757","https://openalex.org/W1971149908","https://openalex.org/W1975545060","https://openalex.org/W2059556568","https://openalex.org/W2133992557","https://openalex.org/W2137328380","https://openalex.org/W2147887812","https://openalex.org/W6637004267"],"related_works":["https://openalex.org/W2107423283","https://openalex.org/W2354856110","https://openalex.org/W2797920886","https://openalex.org/W1560414352","https://openalex.org/W2791607411","https://openalex.org/W2896215207","https://openalex.org/W2292853912","https://openalex.org/W3214591077","https://openalex.org/W2049107348","https://openalex.org/W2795128066"],"abstract_inverted_index":{"A":[0],"variable-threshold":[1,37,62],"voltage":[2,38,63],"technique":[3,89,97],"for":[4],"folding-integration":[5],"(FI)":[6],"analog-to-digital":[7],"converters":[8],"(ADCs)":[9],"with":[10],"1-bit":[11,43],"quantizer":[12],"is":[13,39,64,90,98],"proposed":[14,88],"to":[15,41,48,66,76],"enhance":[16],"the":[17,26,42,77,96],"linearity":[18],"of":[19,30,33,45,53,58,79,82,87],"folding-integration/cyclic":[20],"cascaded":[21],"(FICC)":[22],"ADCs.":[23],"Based":[24],"on":[25],"modeling":[27],"and":[28,55,72,100],"analysis":[29],"behavioral":[31],"operation":[32,47],"FICC":[34,83],"ADCs,":[35],"a":[36],"applied":[40],"sub-ADC":[44],"FI":[46],"decrease":[49],"errors":[50],"from":[51],"offset":[52],"comparator":[54],"imperfect":[56],"amplification":[57],"switch-capacitor":[59],"amplifier.":[60],"The":[61,85],"designed":[65],"be":[67],"automatically":[68],"adjustable":[69],"by":[70,92],"measurement":[71],"feedback":[73],"control":[74],"according":[75],"scale":[78],"input":[80],"signal":[81],"ADC.":[84],"effectiveness":[86],"confirmed":[91],"behavioral-level":[93],"simulation.":[94],"Then":[95],"implemented":[99],"simulated":[101],"in":[102],"65nm":[103],"CMOS":[104],"technology.":[105]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}