{"id":"https://openalex.org/W2502086978","doi":"https://doi.org/10.1109/i2mtc.2016.7520345","title":"Estimating the impact of defects in photovoltaic cells and panels","display_name":"Estimating the impact of defects in photovoltaic cells and panels","publication_year":2016,"publication_date":"2016-05-01","ids":{"openalex":"https://openalex.org/W2502086978","doi":"https://doi.org/10.1109/i2mtc.2016.7520345","mag":"2502086978"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2016.7520345","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2016.7520345","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009753625","display_name":"Christian Schuss","orcid":"https://orcid.org/0000-0001-7758-3628"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Christian Schuss","raw_affiliation_strings":["Electronics Laboratory, University of Oulu, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics Laboratory, University of Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083175940","display_name":"Kari Remes","orcid":"https://orcid.org/0000-0002-4371-7939"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Kari Remes","raw_affiliation_strings":["Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058899126","display_name":"Kimmo Lepp\u00e4nen","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kimmo Leppanen","raw_affiliation_strings":["Oy G.W. Berg & Co Ab, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Oy G.W. Berg & Co Ab, Finland","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020308370","display_name":"Juha Saarela","orcid":null},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Juha Saarela","raw_affiliation_strings":["Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087171304","display_name":"Tapio Fabritius","orcid":"https://orcid.org/0000-0003-4729-8740"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Tapio Fabritius","raw_affiliation_strings":["Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026900447","display_name":"Bernd Eichberger","orcid":"https://orcid.org/0000-0002-5165-1458"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bernd Eichberger","raw_affiliation_strings":["Oy G.W. Berg & Co Ab, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Oy G.W. Berg & Co Ab, Finland","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088828732","display_name":"Timo Rahkonen","orcid":"https://orcid.org/0000-0002-1343-1120"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Timo Rahkonen","raw_affiliation_strings":["Electronics Laboratory, University of Oulu, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics Laboratory, University of Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.421,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.66957311,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photovoltaic-system","display_name":"Photovoltaic system","score":0.8229053020477295},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.612941563129425},{"id":"https://openalex.org/keywords/voltage-drop","display_name":"Voltage drop","score":0.5790696740150452},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5007636547088623},{"id":"https://openalex.org/keywords/thermography","display_name":"Thermography","score":0.4892098903656006},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.47726649045944214},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4458049535751343},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4237772822380066},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.41943639516830444},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.35661840438842773},{"id":"https://openalex.org/keywords/environmental-science","display_name":"Environmental science","score":0.3240053951740265},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19833466410636902},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.13147512078285217},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10846677422523499},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.10268610715866089}],"concepts":[{"id":"https://openalex.org/C41291067","wikidata":"https://www.wikidata.org/wiki/Q1897785","display_name":"Photovoltaic system","level":2,"score":0.8229053020477295},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.612941563129425},{"id":"https://openalex.org/C82178898","wikidata":"https://www.wikidata.org/wiki/Q166839","display_name":"Voltage drop","level":3,"score":0.5790696740150452},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5007636547088623},{"id":"https://openalex.org/C2779222261","wikidata":"https://www.wikidata.org/wiki/Q624587","display_name":"Thermography","level":3,"score":0.4892098903656006},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.47726649045944214},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4458049535751343},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4237772822380066},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.41943639516830444},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.35661840438842773},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.3240053951740265},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19833466410636902},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.13147512078285217},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10846677422523499},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.10268610715866089},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2016.7520345","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2016.7520345","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320323692","display_name":"Oulun Yliopisto","ror":"https://ror.org/03yj89h83"},{"id":"https://openalex.org/F4320336704","display_name":"Infotech Oulu","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1595955602","https://openalex.org/W1971357786","https://openalex.org/W1990778647","https://openalex.org/W1995023200","https://openalex.org/W2005974006","https://openalex.org/W2034226332","https://openalex.org/W2062558731","https://openalex.org/W2081986461","https://openalex.org/W2086607465","https://openalex.org/W2095284697","https://openalex.org/W2105877423","https://openalex.org/W2106176530","https://openalex.org/W2122855803","https://openalex.org/W2126814208","https://openalex.org/W2161457969","https://openalex.org/W2180460518","https://openalex.org/W2328413760","https://openalex.org/W2470163211","https://openalex.org/W4243729171"],"related_works":["https://openalex.org/W2620662450","https://openalex.org/W174278852","https://openalex.org/W2069527050","https://openalex.org/W2368607384","https://openalex.org/W2016009248","https://openalex.org/W1553428650","https://openalex.org/W2008280940","https://openalex.org/W2391588106","https://openalex.org/W612498122","https://openalex.org/W3212153468"],"abstract_inverted_index":{"This":[0],"paper":[1],"investigates":[2],"defects":[3,126],"in":[4,13,28,54,118,127],"photovoltaic":[5],"cells":[6,85,114,129],"and":[7,58,130],"panels":[8],"which":[9,26,88],"cause":[10],"notable":[11],"losses":[12],"output":[14,35,41,135],"performances.":[15,136],"Here,":[16],"the":[17,21,33,39,48,60,67,74,80,91,99,106,109,132],"focus":[18],"lies":[19],"on":[20,134],"impact":[22,133],"of":[23,32,50,69,83,101,112,124],"hairline":[24],"cracks":[25],"result":[27],"a":[29,102],"remarkable":[30],"drop":[31],"available":[34,40,110],"current":[36],"and,":[37],"thus,":[38],"power.":[42],"Firstly,":[43],"samples":[44,63],"were":[45,64],"characterised":[46],"with":[47,66,115],"help":[49,68],"synchronized":[51],"thermography":[52],"(ST)":[53],"order":[55],"to":[56,72,90,98],"localise":[57],"analyse":[59],"defects.":[61],"Secondly,":[62],"measured":[65],"electrical":[70],"verification":[71],"obtain":[73],"characteristic":[75],"I-V":[76],"(Current-Voltage)":[77],"curve.":[78],"Finally,":[79],"geometric":[81],"area":[82,93],"PV":[84,113,128],"was":[86],"calculated":[87],"corresponds":[89],"effective":[92],"for":[94],"energy":[95],"production":[96],"due":[97],"presence":[100],"defect.":[103],"Results":[104],"show":[105],"correlation":[107],"between":[108],"power":[111],"temperature":[116],"variations":[117],"IR-emissions.":[119],"Proposed":[120],"methods":[121],"are":[122],"capable":[123],"detecting":[125],"quantise":[131]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":4},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}