{"id":"https://openalex.org/W4242379649","doi":"https://doi.org/10.1109/i2mtc.2015.7151600","title":"A new dual-modality ECT/ERT technique based on C&lt;sup&gt;4&lt;/sup&gt;D principle","display_name":"A new dual-modality ECT/ERT technique based on C&lt;sup&gt;4&lt;/sup&gt;D principle","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W4242379649","doi":"https://doi.org/10.1109/i2mtc.2015.7151600"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2015.7151600","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151600","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072259811","display_name":"Baoliang Wang","orcid":"https://orcid.org/0000-0002-0045-0576"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Baoliang Wang","raw_affiliation_strings":["Department of Control Science and Engineering, Zhejiang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002822397","display_name":"Zhongbao Gui","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhongbao Gui","raw_affiliation_strings":["Department of Control Science and Engineering, Zhejiang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032223571","display_name":"Wuhao Tan","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wuhao Tan","raw_affiliation_strings":["Department of Control Science and Engineering, Zhejiang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038128825","display_name":"Zhiyao Huang","orcid":"https://orcid.org/0000-0003-1858-5994"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyao Huang","raw_affiliation_strings":["Department of Control Science and Engineering, Zhejiang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069057349","display_name":"Hai\u2010Feng Ji","orcid":"https://orcid.org/0000-0001-5450-0121"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haifeng Ji","raw_affiliation_strings":["Department of Control Science and Engineering, Zhejiang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100675990","display_name":"Haiqing Li","orcid":"https://orcid.org/0000-0003-0329-8933"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiqing Li","raw_affiliation_strings":["Department of Control Science and Engineering, Zhejiang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5072259811"],"corresponding_institution_ids":["https://openalex.org/I76130692"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.32620707,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"140","issue":null,"first_page":"2061","last_page":"2065"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/modality","display_name":"Modality (human\u2013computer interaction)","score":0.7854456901550293},{"id":"https://openalex.org/keywords/dual-mode","display_name":"Dual mode","score":0.7075564861297607},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5674574971199036},{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.5326052904129028},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.5322173833847046},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.4632934331893921},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.42114585638046265},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4111713767051697},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38685324788093567},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3072153329849243},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3032979965209961},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21680104732513428},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.1248033344745636},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.07697829604148865}],"concepts":[{"id":"https://openalex.org/C2780226545","wikidata":"https://www.wikidata.org/wiki/Q6888030","display_name":"Modality (human\u2013computer interaction)","level":2,"score":0.7854456901550293},{"id":"https://openalex.org/C3019325349","wikidata":"https://www.wikidata.org/wiki/Q3874753","display_name":"Dual mode","level":2,"score":0.7075564861297607},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5674574971199036},{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.5326052904129028},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.5322173833847046},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.4632934331893921},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.42114585638046265},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4111713767051697},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38685324788093567},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3072153329849243},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3032979965209961},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21680104732513428},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.1248033344745636},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.07697829604148865},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2015.7151600","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151600","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1971205498","https://openalex.org/W1978679709","https://openalex.org/W2005993487","https://openalex.org/W2011012082","https://openalex.org/W2013470276","https://openalex.org/W2016492141","https://openalex.org/W2034212345","https://openalex.org/W2049772201","https://openalex.org/W2065414514","https://openalex.org/W2071925886","https://openalex.org/W2073407006","https://openalex.org/W2092676657","https://openalex.org/W2109103084","https://openalex.org/W2121265902","https://openalex.org/W2132451085","https://openalex.org/W2141822875","https://openalex.org/W2155537702","https://openalex.org/W2161155039","https://openalex.org/W2170423821","https://openalex.org/W2917311480","https://openalex.org/W6685019425"],"related_works":["https://openalex.org/W2065013354","https://openalex.org/W1974831921","https://openalex.org/W2362942457","https://openalex.org/W2056641994","https://openalex.org/W2364971604","https://openalex.org/W2009640073","https://openalex.org/W1971900134","https://openalex.org/W1973400749","https://openalex.org/W1969121263","https://openalex.org/W2393881606"],"abstract_inverted_index":{"Based":[0],"on":[1],"the":[2,54,59,65,71,74,97,100],"measurement":[3],"principle":[4],"of":[5,70,99],"Capacitively":[6],"Coupled":[7],"Contactless":[8],"Conductivity":[9],"Detection":[10],"(C":[11],"<sup":[12],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[13],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">4</sup>":[14],"D),":[15],"a":[16,25],"new":[17,33,101],"dual-modality":[18,27,34,76,102],"ECT/ERT":[19,28,35,77,103],"technique":[20],"is":[21,30,37,43,50],"proposed":[22],"and":[23,39,56,64,88],"hence":[24,57],"novel":[26,75],"system":[29],"developed.":[31],"A":[32],"sensor":[36],"designed":[38],"its":[40],"mathematical":[41],"model":[42],"presented.":[44],"Phase":[45],"Sensitive":[46],"Demodulation":[47],"(PSD)":[48],"method":[49],"applied":[51],"to":[52],"measure":[53],"impedance":[55],"obtain":[58],"capacitance":[60],"for":[61,67],"ECT":[62,86],"mode":[63,69,87],"resistance":[66],"ERT":[68,89],"fluid.":[72],"With":[73],"system,":[78],"image":[79],"reconstruction":[80],"experiments":[81],"are":[82],"carried":[83],"out":[84],"in":[85],"mode,":[90],"respectively.":[91],"The":[92],"preliminary":[93],"experiment":[94],"results":[95],"verify":[96],"feasibility":[98],"technique.":[104]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}