{"id":"https://openalex.org/W1531689933","doi":"https://doi.org/10.1109/i2mtc.2015.7151597","title":"Reconstruction of EIT images via patch based sparse representation over learned dictionaries","display_name":"Reconstruction of EIT images via patch based sparse representation over learned dictionaries","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1531689933","doi":"https://doi.org/10.1109/i2mtc.2015.7151597","mag":"1531689933"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2015.7151597","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151597","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061867895","display_name":"Qi Wang","orcid":"https://orcid.org/0000-0002-5339-5427"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qi Wang","raw_affiliation_strings":["School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China","School of Electronics and Information Engineering, Tianjin Polytechnic University, China"],"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]},{"raw_affiliation_string":"School of Electronics and Information Engineering, Tianjin Polytechnic University, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028287603","display_name":"Kongjun Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kongjun Sun","raw_affiliation_strings":["School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China","School of Electronics and Information Engineering, Tianjin Polytechnic University, China"],"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]},{"raw_affiliation_string":"School of Electronics and Information Engineering, Tianjin Polytechnic University, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100707504","display_name":"Jianming Wang","orcid":"https://orcid.org/0000-0002-6235-1362"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianming Wang","raw_affiliation_strings":["School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China","School of Electronics and Information Engineering, Tianjin Polytechnic University, China"],"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]},{"raw_affiliation_string":"School of Electronics and Information Engineering, Tianjin Polytechnic University, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100739599","display_name":"Ronghua Zhang","orcid":"https://orcid.org/0000-0002-2507-2989"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ronghua Zhang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Tianjin Polytechnic University, Tianjin, China","School of electrical engineering and automation, Tianjin Polytechnic University, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]},{"raw_affiliation_string":"School of electrical engineering and automation, Tianjin Polytechnic University, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101809949","display_name":"Huaxiang Wang","orcid":"https://orcid.org/0000-0002-8792-0760"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaxiang Wang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Tianjin University, Tianjin, China","School of Electrical Engineering and Automation, Tianjin University, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]},{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin University, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5061867895"],"corresponding_institution_ids":["https://openalex.org/I198091727"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.02291554,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"54","issue":null,"first_page":"2044","last_page":"2048"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6980034708976746},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6361228823661804},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6227721571922302},{"id":"https://openalex.org/keywords/sparse-approximation","display_name":"Sparse approximation","score":0.6181566119194031},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.6171469688415527},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.5190489888191223},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.4081348478794098},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3542299270629883}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6980034708976746},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6361228823661804},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6227721571922302},{"id":"https://openalex.org/C124066611","wikidata":"https://www.wikidata.org/wiki/Q28684319","display_name":"Sparse approximation","level":2,"score":0.6181566119194031},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.6171469688415527},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.5190489888191223},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.4081348478794098},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3542299270629883},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2015.7151597","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151597","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Quality Education","id":"https://metadata.un.org/sdg/4","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1517883765","https://openalex.org/W1979724394","https://openalex.org/W1988714249","https://openalex.org/W2012195770","https://openalex.org/W2021363669","https://openalex.org/W2035414577","https://openalex.org/W2097391269","https://openalex.org/W2138838870","https://openalex.org/W2141168890","https://openalex.org/W2153663612","https://openalex.org/W2160547390","https://openalex.org/W2168668658","https://openalex.org/W2296616510","https://openalex.org/W2897807752","https://openalex.org/W4250955649"],"related_works":["https://openalex.org/W2990531703","https://openalex.org/W2166044122","https://openalex.org/W2790481334","https://openalex.org/W3109244347","https://openalex.org/W1983610137","https://openalex.org/W2517246325","https://openalex.org/W1558171043","https://openalex.org/W2093747323","https://openalex.org/W2044495222","https://openalex.org/W3011087369"],"abstract_inverted_index":{"Image":[0],"reconstruction":[1,43,64],"for":[2,23,45,78],"electrical":[3],"impedance":[4],"tomography":[5],"(EIT)":[6],"is":[7,15,52],"a":[8,40,85],"nonlinear":[9],"problem.":[10],"A":[11],"generalized":[12],"inverse":[13],"operator":[14],"usually":[16],"ill-posed":[17],"and":[18,28,62],"ill-conditioned.":[19],"Therefore,":[20],"the":[21,32,37,58,92],"solutions":[22],"EIT":[24,46],"are":[25,65],"not":[26],"unique":[27],"highly":[29],"sensitive":[30],"to":[31],"measurement":[33],"noise.":[34],"To":[35],"improve":[36],"image":[38,42,63],"quality,":[39],"new":[41],"algorithm":[44,70],"based":[47],"on":[48],"patch-based":[49],"sparse":[50],"representation":[51],"proposed.":[53],"For":[54],"each":[55],"iterative":[56],"step,":[57],"sparsifying":[59],"dictionary":[60],"optimization":[61],"performed":[66],"alternately.":[67],"The":[68],"proposed":[69],"has":[71],"been":[72],"evaluated":[73],"by":[74],"simulation":[75],"with":[76],"noise":[77,90],"different":[79],"conductivity":[80],"distributions.":[81],"It":[82],"can":[83],"tolerate":[84],"relatively":[86],"high":[87],"level":[88],"of":[89,95],"in":[91],"measured":[93],"voltages":[94],"EIT.":[96]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}