{"id":"https://openalex.org/W1545980094","doi":"https://doi.org/10.1109/i2mtc.2015.7151596","title":"Automated robust metric calibration of multi-focus plenoptic cameras","display_name":"Automated robust metric calibration of multi-focus plenoptic cameras","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1545980094","doi":"https://doi.org/10.1109/i2mtc.2015.7151596","mag":"1545980094"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2015.7151596","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151596","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102949117","display_name":"Christian Heinze","orcid":"https://orcid.org/0000-0002-9114-8080"},"institutions":[{"id":"https://openalex.org/I4210164599","display_name":"Clinical Research Center Kiel","ror":"https://ror.org/05sw1mq09","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210164599"]},{"id":"https://openalex.org/I4210131146","display_name":"Schauenburg (Germany)","ror":"https://ror.org/037ngs497","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210131146"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Christian Heinze","raw_affiliation_strings":["Raytrix GmbH, Kiel, Germany","Raytrix GmbH, Schauenburgerstr. 116, Kiel, Germany"],"affiliations":[{"raw_affiliation_string":"Raytrix GmbH, Kiel, Germany","institution_ids":[]},{"raw_affiliation_string":"Raytrix GmbH, Schauenburgerstr. 116, Kiel, Germany","institution_ids":["https://openalex.org/I4210164599","https://openalex.org/I4210131146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023677140","display_name":"Stefano Spyropoulos","orcid":"https://orcid.org/0000-0002-2826-1339"},"institutions":[{"id":"https://openalex.org/I4210131146","display_name":"Schauenburg (Germany)","ror":"https://ror.org/037ngs497","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210131146"]},{"id":"https://openalex.org/I4210164599","display_name":"Clinical Research Center Kiel","ror":"https://ror.org/05sw1mq09","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210164599"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stefano Spyropoulos","raw_affiliation_strings":["Raytrix GmbH, Kiel, Germany","Raytrix GmbH, Schauenburgerstr. 116, Kiel, Germany"],"affiliations":[{"raw_affiliation_string":"Raytrix GmbH, Kiel, Germany","institution_ids":[]},{"raw_affiliation_string":"Raytrix GmbH, Schauenburgerstr. 116, Kiel, Germany","institution_ids":["https://openalex.org/I4210164599","https://openalex.org/I4210131146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001586663","display_name":"Stephan Hu\u00dfmann","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131906","display_name":"West Coast University of Applied Sciences","ror":"https://ror.org/03bthq143","country_code":"DE","type":"education","lineage":["https://openalex.org/I4210131906"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stephan Hussmann","raw_affiliation_strings":["Faculty of Engineering, West Coast University of Applied Sciences, Heide, Germany","Senior Member IEEE, Faculty of Engineering, West Coast University of Applied Sciences, Heide, Germany"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, West Coast University of Applied Sciences, Heide, Germany","institution_ids":["https://openalex.org/I4210131906"]},{"raw_affiliation_string":"Senior Member IEEE, Faculty of Engineering, West Coast University of Applied Sciences, Heide, Germany","institution_ids":["https://openalex.org/I4210131906"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110222469","display_name":"Christian Perwa\u00df","orcid":null},"institutions":[{"id":"https://openalex.org/I4210164599","display_name":"Clinical Research Center Kiel","ror":"https://ror.org/05sw1mq09","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210164599"]},{"id":"https://openalex.org/I4210131146","display_name":"Schauenburg (Germany)","ror":"https://ror.org/037ngs497","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210131146"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christian Perwass","raw_affiliation_strings":["Raytrix GmbH, Kiel, Germany","Raytrix GmbH, Schauenburgerstr. 116, Kiel, Germany"],"affiliations":[{"raw_affiliation_string":"Raytrix GmbH, Kiel, Germany","institution_ids":[]},{"raw_affiliation_string":"Raytrix GmbH, Schauenburgerstr. 116, Kiel, Germany","institution_ids":["https://openalex.org/I4210164599","https://openalex.org/I4210131146"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5102949117"],"corresponding_institution_ids":["https://openalex.org/I4210131146","https://openalex.org/I4210164599"],"apc_list":null,"apc_paid":null,"fwci":1.2887,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.85921745,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"2038","last_page":"2043"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microlens","display_name":"Microlens","score":0.8442122936248779},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.780548095703125},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7768591046333313},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7380994558334351},{"id":"https://openalex.org/keywords/stereo-camera","display_name":"Stereo camera","score":0.6983581781387329},{"id":"https://openalex.org/keywords/camera-resectioning","display_name":"Camera resectioning","score":0.6971288919448853},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6109785437583923},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.5892439484596252},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.5278605818748474},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.49252113699913025},{"id":"https://openalex.org/keywords/camera-auto-calibration","display_name":"Camera auto-calibration","score":0.4770471453666687},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.4766548275947571},{"id":"https://openalex.org/keywords/stereoscopy","display_name":"Stereoscopy","score":0.4436430335044861},{"id":"https://openalex.org/keywords/camera-lens","display_name":"Camera lens","score":0.43139657378196716},{"id":"https://openalex.org/keywords/lens","display_name":"Lens (geology)","score":0.41407907009124756},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11687701940536499},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1065499484539032},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10557326674461365}],"concepts":[{"id":"https://openalex.org/C192560794","wikidata":"https://www.wikidata.org/wiki/Q500199","display_name":"Microlens","level":3,"score":0.8442122936248779},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.780548095703125},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7768591046333313},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7380994558334351},{"id":"https://openalex.org/C185078393","wikidata":"https://www.wikidata.org/wiki/Q313783","display_name":"Stereo camera","level":2,"score":0.6983581781387329},{"id":"https://openalex.org/C110898773","wikidata":"https://www.wikidata.org/wiki/Q2933935","display_name":"Camera resectioning","level":2,"score":0.6971288919448853},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6109785437583923},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.5892439484596252},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.5278605818748474},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.49252113699913025},{"id":"https://openalex.org/C94816000","wikidata":"https://www.wikidata.org/wiki/Q5026006","display_name":"Camera auto-calibration","level":3,"score":0.4770471453666687},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.4766548275947571},{"id":"https://openalex.org/C126057942","wikidata":"https://www.wikidata.org/wiki/Q35158","display_name":"Stereoscopy","level":2,"score":0.4436430335044861},{"id":"https://openalex.org/C2778022956","wikidata":"https://www.wikidata.org/wiki/Q192234","display_name":"Camera lens","level":3,"score":0.43139657378196716},{"id":"https://openalex.org/C15336307","wikidata":"https://www.wikidata.org/wiki/Q1766051","display_name":"Lens (geology)","level":2,"score":0.41407907009124756},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11687701940536499},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1065499484539032},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10557326674461365},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C78762247","wikidata":"https://www.wikidata.org/wiki/Q1273174","display_name":"Petroleum engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2015.7151596","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151596","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W248834415","https://openalex.org/W1600713188","https://openalex.org/W2028310195","https://openalex.org/W2043408784","https://openalex.org/W2060167709","https://openalex.org/W2124535811","https://openalex.org/W2128268941","https://openalex.org/W2137313943","https://openalex.org/W2259186566","https://openalex.org/W3212737926","https://openalex.org/W6678568671","https://openalex.org/W6680152570","https://openalex.org/W6692257441","https://openalex.org/W6803984101"],"related_works":["https://openalex.org/W2160252628","https://openalex.org/W2096059205","https://openalex.org/W2321086849","https://openalex.org/W2366688168","https://openalex.org/W2018226387","https://openalex.org/W2333223448","https://openalex.org/W2089184644","https://openalex.org/W2658949336","https://openalex.org/W1974334735","https://openalex.org/W188716338"],"abstract_inverted_index":{"The":[0,58],"concept":[1],"of":[2,54],"plenoptic":[3,108],"cameras":[4,26],"has":[5],"existed":[6],"since":[7],"the":[8,32,55],"early":[9],"1900s,":[10],"with":[11,34],"recent":[12],"advances":[13],"in":[14,52,66],"computational":[15],"power":[16],"making":[17],"them":[18],"a":[19,40,48,85,94,106],"viable":[20],"tool":[21],"for":[22],"industrial":[23],"applications.":[24],"Plenoptic":[25],"can":[27],"give":[28],"3D":[29],"information":[30],"about":[31],"scene":[33],"one":[35,37],"camera,":[36],"lens,":[38],"and":[39],"single":[41],"image.":[42],"This":[43,91],"is":[44,61],"possible":[45],"by":[46],"placing":[47],"microlens":[49,68],"array":[50],"directly":[51],"front":[53],"image":[56],"sensor.":[57],"depth":[59,80],"estimation":[60],"based":[62],"on":[63],"disparities":[64],"observed":[65],"individual":[67],"images,":[69],"similar":[70],"to":[71,82,104],"stereo":[72],"camera":[73,86,97],"approaches.":[74],"To":[75],"relate":[76],"these":[77],"so-called":[78],"virtual":[79],"units":[81],"metric":[83],"distances,":[84],"calibration":[87,98],"must":[88],"be":[89],"performed.":[90],"paper":[92],"presents":[93],"robust,":[95],"automated":[96],"technique,":[99],"which":[100],"introduces":[101],"new":[102],"ways":[103],"model":[105],"multi-focus":[107],"camera.":[109]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}