{"id":"https://openalex.org/W1596169574","doi":"https://doi.org/10.1109/i2mtc.2015.7151577","title":"An extension to IEEE Std. 1241 sine fit for analog-to-information converters testing","display_name":"An extension to IEEE Std. 1241 sine fit for analog-to-information converters testing","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1596169574","doi":"https://doi.org/10.1109/i2mtc.2015.7151577","mag":"1596169574"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2015.7151577","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151577","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034361203","display_name":"Pasquale Daponte","orcid":"https://orcid.org/0000-0002-5215-3661"},"institutions":[{"id":"https://openalex.org/I16337185","display_name":"University of Sannio","ror":"https://ror.org/04vc81p87","country_code":"IT","type":"education","lineage":["https://openalex.org/I16337185"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Pasquale Daponte","raw_affiliation_strings":["Department of Engineering, University of Sannio, Benevento, Italy","Department of Engineering, University of Sannio, Benevento, Italy 82100#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Sannio, Benevento, Italy","institution_ids":["https://openalex.org/I16337185"]},{"raw_affiliation_string":"Department of Engineering, University of Sannio, Benevento, Italy 82100#TAB#","institution_ids":["https://openalex.org/I16337185"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074293414","display_name":"Luca De Vito","orcid":"https://orcid.org/0000-0003-1896-2614"},"institutions":[{"id":"https://openalex.org/I16337185","display_name":"University of Sannio","ror":"https://ror.org/04vc81p87","country_code":"IT","type":"education","lineage":["https://openalex.org/I16337185"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca De Vito","raw_affiliation_strings":["Department of Engineering, University of Sannio, Benevento, Italy","Department of Engineering, University of Sannio, Benevento, Italy 82100#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Sannio, Benevento, Italy","institution_ids":["https://openalex.org/I16337185"]},{"raw_affiliation_string":"Department of Engineering, University of Sannio, Benevento, Italy 82100#TAB#","institution_ids":["https://openalex.org/I16337185"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010415569","display_name":"Sergio Rapuano","orcid":"https://orcid.org/0000-0003-3249-0473"},"institutions":[{"id":"https://openalex.org/I16337185","display_name":"University of Sannio","ror":"https://ror.org/04vc81p87","country_code":"IT","type":"education","lineage":["https://openalex.org/I16337185"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Sergio Rapuano","raw_affiliation_strings":["Department of Engineering, University of Sannio, Benevento, Italy","Department of Engineering, University of Sannio, Benevento, Italy 82100#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Sannio, Benevento, Italy","institution_ids":["https://openalex.org/I16337185"]},{"raw_affiliation_string":"Department of Engineering, University of Sannio, Benevento, Italy 82100#TAB#","institution_ids":["https://openalex.org/I16337185"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5034361203"],"corresponding_institution_ids":["https://openalex.org/I16337185"],"apc_list":null,"apc_paid":null,"fwci":1.0621,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.75634966,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"26","issue":null,"first_page":"1933","last_page":"1937"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7780706882476807},{"id":"https://openalex.org/keywords/sine","display_name":"Sine","score":0.679318904876709},{"id":"https://openalex.org/keywords/demodulation","display_name":"Demodulation","score":0.6723167896270752},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5708580017089844},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5688939094543457},{"id":"https://openalex.org/keywords/extension","display_name":"Extension (predicate logic)","score":0.5479058623313904},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5344217419624329},{"id":"https://openalex.org/keywords/sine-wave","display_name":"Sine wave","score":0.4422605633735657},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2245776653289795},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21763890981674194},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14956656098365784},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1463983654975891},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12078264355659485}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7780706882476807},{"id":"https://openalex.org/C186661526","wikidata":"https://www.wikidata.org/wiki/Q13647261","display_name":"Sine","level":2,"score":0.679318904876709},{"id":"https://openalex.org/C195251586","wikidata":"https://www.wikidata.org/wiki/Q1185939","display_name":"Demodulation","level":3,"score":0.6723167896270752},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5708580017089844},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5688939094543457},{"id":"https://openalex.org/C2778029271","wikidata":"https://www.wikidata.org/wiki/Q5421931","display_name":"Extension (predicate logic)","level":2,"score":0.5479058623313904},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5344217419624329},{"id":"https://openalex.org/C66907618","wikidata":"https://www.wikidata.org/wiki/Q207527","display_name":"Sine wave","level":3,"score":0.4422605633735657},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2245776653289795},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21763890981674194},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14956656098365784},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1463983654975891},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12078264355659485},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2015.7151577","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151577","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W228380312","https://openalex.org/W1714723846","https://openalex.org/W1738044847","https://openalex.org/W2012589467","https://openalex.org/W2049846394","https://openalex.org/W2050146435","https://openalex.org/W2110005331","https://openalex.org/W2533057217","https://openalex.org/W2542170364","https://openalex.org/W6637463291","https://openalex.org/W6637868309"],"related_works":["https://openalex.org/W2886467464","https://openalex.org/W2379854577","https://openalex.org/W2362063739","https://openalex.org/W2351293857","https://openalex.org/W2424761688","https://openalex.org/W2487672730","https://openalex.org/W2409813437","https://openalex.org/W1997184869","https://openalex.org/W2029762691","https://openalex.org/W2387185277"],"abstract_inverted_index":{"The":[0,46],"paper":[1],"proposes":[2],"a":[3,58],"test":[4],"method":[5,30,48],"for":[6],"Analog-to-Information":[7],"Converters":[8],"(AICs)":[9],"in":[10,21,72],"the":[11,16,25,73],"time":[12],"domain,":[13],"by":[14,52,55],"extending":[15],"three-parameter":[17],"sine":[18],"fit":[19],"proposed":[20,47],"clause":[22],"5.2":[23],"of":[24,57,64],"IEEE":[26],"Std.":[27],"1241.":[28],"Such":[29],"can":[31],"be":[32],"easily":[33],"applied":[34],"to":[35],"several":[36],"AIC":[37,61],"architectures,":[38],"based":[39],"on":[40],"random":[41,44,59],"sampling":[42,60],"or":[43],"demodulation.":[45],"has":[49],"been":[50],"validated":[51],"simulations":[53],"and":[54,70],"means":[56],"architecture.":[62],"Results":[63],"both":[65],"validation":[66],"phases":[67],"are":[68],"reported":[69],"discussed":[71],"paper.":[74]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}