{"id":"https://openalex.org/W1506208322","doi":"https://doi.org/10.1109/i2mtc.2015.7151568","title":"Electrical characterization of inkjet printed conductive traces using LinuxCNC","display_name":"Electrical characterization of inkjet printed conductive traces using LinuxCNC","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1506208322","doi":"https://doi.org/10.1109/i2mtc.2015.7151568","mag":"1506208322"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2015.7151568","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151568","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011155105","display_name":"Christoph Beisteiner","orcid":null},"institutions":[{"id":"https://openalex.org/I121883995","display_name":"Johannes Kepler University of Linz","ror":"https://ror.org/052r2xn60","country_code":"AT","type":"education","lineage":["https://openalex.org/I121883995"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Christoph Beisteiner","raw_affiliation_strings":["Johannes Kepler University Linz, Institute for Measurement Technology, Linz, Austria","Johannes Kepler University Linz, Institute for Measurement Technology, Altenberger Stra\u00dfe 69, 4040, Austria"],"affiliations":[{"raw_affiliation_string":"Johannes Kepler University Linz, Institute for Measurement Technology, Linz, Austria","institution_ids":["https://openalex.org/I121883995"]},{"raw_affiliation_string":"Johannes Kepler University Linz, Institute for Measurement Technology, Altenberger Stra\u00dfe 69, 4040, Austria","institution_ids":["https://openalex.org/I121883995"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112164842","display_name":"Robert Wallner","orcid":null},"institutions":[{"id":"https://openalex.org/I121883995","display_name":"Johannes Kepler University of Linz","ror":"https://ror.org/052r2xn60","country_code":"AT","type":"education","lineage":["https://openalex.org/I121883995"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Robert Wallner","raw_affiliation_strings":["Johannes Kepler University Linz, Institute for Measurement Technology, Linz, Austria","Johannes Kepler University Linz, Institute for Measurement Technology, Altenberger Stra\u00dfe 69, 4040, Austria"],"affiliations":[{"raw_affiliation_string":"Johannes Kepler University Linz, Institute for Measurement Technology, Linz, Austria","institution_ids":["https://openalex.org/I121883995"]},{"raw_affiliation_string":"Johannes Kepler University Linz, Institute for Measurement Technology, Altenberger Stra\u00dfe 69, 4040, Austria","institution_ids":["https://openalex.org/I121883995"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076185486","display_name":"Bernhard G. Zagar","orcid":"https://orcid.org/0000-0002-0695-2657"},"institutions":[{"id":"https://openalex.org/I121883995","display_name":"Johannes Kepler University of Linz","ror":"https://ror.org/052r2xn60","country_code":"AT","type":"education","lineage":["https://openalex.org/I121883995"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Bernhard G. Zagar","raw_affiliation_strings":["Johannes Kepler University Linz, Institute for Measurement Technology, Linz, Austria","Johannes Kepler University Linz, Institute for Measurement Technology, Altenberger Stra\u00dfe 69, 4040, Austria"],"affiliations":[{"raw_affiliation_string":"Johannes Kepler University Linz, Institute for Measurement Technology, Linz, Austria","institution_ids":["https://openalex.org/I121883995"]},{"raw_affiliation_string":"Johannes Kepler University Linz, Institute for Measurement Technology, Altenberger Stra\u00dfe 69, 4040, Austria","institution_ids":["https://openalex.org/I121883995"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5011155105"],"corresponding_institution_ids":["https://openalex.org/I121883995"],"apc_list":null,"apc_paid":null,"fwci":0.6498,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.67820366,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"5374","issue":null,"first_page":"1883","last_page":"1888"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11255","display_name":"Microfluidic and Bio-sensing Technologies","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.7568188905715942},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.6633599996566772},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5712630748748779},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.524795413017273},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.5156406164169312},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.5138952732086182},{"id":"https://openalex.org/keywords/usability","display_name":"Usability","score":0.4665503203868866},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.4370405972003937},{"id":"https://openalex.org/keywords/printed-electronics","display_name":"Printed electronics","score":0.4283120930194855},{"id":"https://openalex.org/keywords/conductive-ink","display_name":"Conductive ink","score":0.4240679144859314},{"id":"https://openalex.org/keywords/3d-printed","display_name":"3d printed","score":0.42275339365005493},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.4180218577384949},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4012645483016968},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38212862610816956},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.352150022983551},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.3298247754573822},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28035444021224976},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.17198240756988525},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12832742929458618},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.12701314687728882}],"concepts":[{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.7568188905715942},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.6633599996566772},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5712630748748779},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.524795413017273},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.5156406164169312},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.5138952732086182},{"id":"https://openalex.org/C170130773","wikidata":"https://www.wikidata.org/wiki/Q216378","display_name":"Usability","level":2,"score":0.4665503203868866},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.4370405972003937},{"id":"https://openalex.org/C25435620","wikidata":"https://www.wikidata.org/wiki/Q1497629","display_name":"Printed electronics","level":3,"score":0.4283120930194855},{"id":"https://openalex.org/C2777892344","wikidata":"https://www.wikidata.org/wiki/Q5159386","display_name":"Conductive ink","level":4,"score":0.4240679144859314},{"id":"https://openalex.org/C3019308078","wikidata":"https://www.wikidata.org/wiki/Q229367","display_name":"3d printed","level":2,"score":0.42275339365005493},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.4180218577384949},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4012645483016968},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38212862610816956},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.352150022983551},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.3298247754573822},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28035444021224976},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.17198240756988525},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12832742929458618},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.12701314687728882},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C136229726","wikidata":"https://www.wikidata.org/wiki/Q327092","display_name":"Biomedical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C107457646","wikidata":"https://www.wikidata.org/wiki/Q207434","display_name":"Human\u2013computer interaction","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C66825105","wikidata":"https://www.wikidata.org/wiki/Q354718","display_name":"Sheet resistance","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2015.7151568","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151568","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320328079","display_name":"\u00d6sterreichische Forschungsgemeinschaft","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1573950249","https://openalex.org/W1616878403","https://openalex.org/W1914353042","https://openalex.org/W1972786293","https://openalex.org/W1975923127","https://openalex.org/W2014661468","https://openalex.org/W2014865252","https://openalex.org/W2036653829","https://openalex.org/W2038937326","https://openalex.org/W2048195770","https://openalex.org/W2068557538","https://openalex.org/W2101092680","https://openalex.org/W2132734977","https://openalex.org/W3039083618","https://openalex.org/W3208201226","https://openalex.org/W6662665171","https://openalex.org/W6667717723"],"related_works":["https://openalex.org/W2391741149","https://openalex.org/W2383240207","https://openalex.org/W4378376787","https://openalex.org/W4401507403","https://openalex.org/W2971700672","https://openalex.org/W3144307858","https://openalex.org/W2024808593","https://openalex.org/W2090725357","https://openalex.org/W2786334518","https://openalex.org/W2942071105"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,18,39,77,112,137,143],"method":[4],"of":[5,11,29,50,68,88,150,153],"measurement":[6,99,134,146],"to":[7,65,116],"characterize":[8],"the":[9,27,30,34,44,48,66,69,73,86,105,151],"quality":[10,152],"inkjet":[12,154],"printed":[13,51,76,155],"conductive":[14,52],"traces":[15,74,122,156],"created":[16],"with":[17,136],"commercially":[19],"available":[20],"desktop":[21],"printer.":[22],"Its":[23],"focus":[24],"lies":[25],"on":[26,71],"investigation":[28],"electrical":[31,55],"connectivity":[32],"and":[33,128,142],"current":[35],"density":[36],"distribution":[37],"within":[38],"trace,":[40],"as":[41,111,120],"these":[42],"are":[43,75],"main":[45],"indicators":[46],"for":[47],"usability":[49],"traces.":[53],"Usually":[54],"circuit":[56],"boards":[57],"(PCBs)":[58],"contain":[59],"arbitrary":[60],"plain":[61],"geometries,":[62,118],"but":[63],"due":[64],"flexibility":[67],"substrate":[70],"which":[72,92],"3D":[78],"scanning":[79],"measuring":[80],"system":[81,115,135],"is":[82,94],"needed,":[83],"this":[84,103,133],"allows":[85],"traversing":[87],"all":[89],"axes":[90],"simultaneously":[91],"usually":[93],"not":[95],"implemented":[96],"in":[97],"state-of-the-art":[98],"systems.":[100],"To":[101],"overcome":[102],"constraint":[104],"open-source":[106],"project":[107],"LinuxCNC":[108],"was":[109,157],"selected":[110],"numerical":[113],"control":[114],"scan":[117],"such":[119],"helical":[121],"(e.g.,":[123],"coils),":[124],"by":[125],"using":[126],"linear":[127],"circular":[129],"movements.":[130],"By":[131],"combining":[132],"giant":[138],"magnetoresistance":[139],"sensor":[140],"(GMR)":[141],"four-point":[144],"probe":[145],"method,":[147],"rapid":[148],"characterization":[149],"possible.":[158]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}