{"id":"https://openalex.org/W1543616368","doi":"https://doi.org/10.1109/i2mtc.2015.7151491","title":"A novel design of small size DCT with a double tuned sampling circuit","display_name":"A novel design of small size DCT with a double tuned sampling circuit","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1543616368","doi":"https://doi.org/10.1109/i2mtc.2015.7151491","mag":"1543616368"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2015.7151491","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151491","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100412093","display_name":"Zhen Liu","orcid":"https://orcid.org/0000-0003-3406-0039"},"institutions":[{"id":"https://openalex.org/I51629411","display_name":"Siemens (China)","ror":"https://ror.org/00v6g9845","country_code":"CN","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I51629411"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhen Liu","raw_affiliation_strings":["Corporate Technology Siemens Ltd. China, Shanghai, China","Corporate Technology Siemens Ltd. China Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Corporate Technology Siemens Ltd. China, Shanghai, China","institution_ids":["https://openalex.org/I51629411"]},{"raw_affiliation_string":"Corporate Technology Siemens Ltd. China Shanghai, China","institution_ids":["https://openalex.org/I51629411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108067228","display_name":"Weigang Chen","orcid":"https://orcid.org/0000-0002-4880-8186"},"institutions":[{"id":"https://openalex.org/I51629411","display_name":"Siemens (China)","ror":"https://ror.org/00v6g9845","country_code":"CN","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I51629411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weigang Chen","raw_affiliation_strings":["Corporate Technology Siemens Ltd. China, Shanghai, China","Corporate Technology Siemens Ltd. China Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Corporate Technology Siemens Ltd. China, Shanghai, China","institution_ids":["https://openalex.org/I51629411"]},{"raw_affiliation_string":"Corporate Technology Siemens Ltd. China Shanghai, China","institution_ids":["https://openalex.org/I51629411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059054371","display_name":"Feng Du","orcid":"https://orcid.org/0000-0003-1551-1551"},"institutions":[{"id":"https://openalex.org/I51629411","display_name":"Siemens (China)","ror":"https://ror.org/00v6g9845","country_code":"CN","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I51629411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Du","raw_affiliation_strings":["Corporate Technology Siemens Ltd. China, Shanghai, China","Corporate Technology Siemens Ltd. China Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Corporate Technology Siemens Ltd. China, Shanghai, China","institution_ids":["https://openalex.org/I51629411"]},{"raw_affiliation_string":"Corporate Technology Siemens Ltd. China Shanghai, China","institution_ids":["https://openalex.org/I51629411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087458383","display_name":"Yue Zhuo","orcid":"https://orcid.org/0000-0002-4730-2247"},"institutions":[{"id":"https://openalex.org/I51629411","display_name":"Siemens (China)","ror":"https://ror.org/00v6g9845","country_code":"CN","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I51629411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yue Zhuo","raw_affiliation_strings":["Corporate Technology Siemens Ltd. China, Shanghai, China","Corporate Technology Siemens Ltd. China Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Corporate Technology Siemens Ltd. China, Shanghai, China","institution_ids":["https://openalex.org/I51629411"]},{"raw_affiliation_string":"Corporate Technology Siemens Ltd. China Shanghai, China","institution_ids":["https://openalex.org/I51629411"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022017427","display_name":"Michael Anheuser","orcid":null},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael Anheuser","raw_affiliation_strings":["EMLP SnGPRD Siemens, AG Amberg, Germany","EM LP SnG PRD, Siemens AG, Amberg, Germany"],"affiliations":[{"raw_affiliation_string":"EMLP SnGPRD Siemens, AG Amberg, Germany","institution_ids":["https://openalex.org/I1325886976"]},{"raw_affiliation_string":"EM LP SnG PRD, Siemens AG, Amberg, Germany","institution_ids":["https://openalex.org/I1325886976"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100412093"],"corresponding_institution_ids":["https://openalex.org/I51629411"],"apc_list":null,"apc_paid":null,"fwci":0.1973,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.55826956,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1456","last_page":"1459"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.8450716733932495},{"id":"https://openalex.org/keywords/discrete-cosine-transform","display_name":"Discrete cosine transform","score":0.6881557703018188},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5543681979179382},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.5107512474060059},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4268154501914978},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41589632630348206},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37743669748306274},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.20547688007354736},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19358187913894653},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12449443340301514},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08524471521377563}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.8450716733932495},{"id":"https://openalex.org/C2221639","wikidata":"https://www.wikidata.org/wiki/Q2877","display_name":"Discrete cosine transform","level":3,"score":0.6881557703018188},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5543681979179382},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.5107512474060059},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4268154501914978},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41589632630348206},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37743669748306274},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.20547688007354736},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19358187913894653},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12449443340301514},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08524471521377563},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2015.7151491","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151491","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1979351500","https://openalex.org/W2049527033","https://openalex.org/W2152470603","https://openalex.org/W2168125565"],"related_works":["https://openalex.org/W1916685473","https://openalex.org/W2055682261","https://openalex.org/W1993363272","https://openalex.org/W2186390138","https://openalex.org/W2060035984","https://openalex.org/W2790129917","https://openalex.org/W2992856432","https://openalex.org/W2100638064","https://openalex.org/W2366751370","https://openalex.org/W1974041046"],"abstract_inverted_index":{"DCT":[0,42,71,88],"(Differential":[1],"Current":[2,11],"Transformer)":[3],"is":[4,14,43,61],"an":[5,29,73],"important":[6],"part":[7],"of":[8,20,41,50,59,70,85,101,108],"RCD":[9,60,78],"(Residual":[10],"Device),":[12],"which":[13],"used":[15],"to":[16,113],"detect":[17],"the":[18,24,64,98,114,122],"existence":[19],"residual":[21],"current":[22,65],"in":[23,47],"power":[25],"line.":[26],"To":[27],"guarantee":[28],"adequate":[30],"sensitivity":[31,102,111],"and":[32,45,55,103,110,126],"linearity":[33,109],"at":[34],"a":[35,38,53,82,90],"low":[36],"current,":[37],"certain":[39],"volume":[40],"required":[44,62,99],"results":[46],"large":[48,68,115],"size":[49,69,77,87,116,124],"RCD.":[51],"However,":[52],"smaller":[54,123],"more":[56],"compact":[57],"structure":[58],"by":[63,121],"market.":[66],"The":[67],"becomes":[72],"obstacle":[74],"for":[75],"small":[76,86],"development.":[79],"We":[80],"propose":[81],"novel":[83],"design":[84],"with":[89],"double":[91],"tunable":[92],"sampling":[93],"circuit":[94],"that":[95],"can":[96,118],"meet":[97],"performance":[100],"linearity.":[104],"A":[105],"similar":[106],"value":[107],"comparable":[112],"DCTs":[117,125],"be":[119],"produced":[120],"our":[127],"proposed":[128],"sensing":[129],"circuit.":[130]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}