{"id":"https://openalex.org/W1501716115","doi":"https://doi.org/10.1109/i2mtc.2015.7151428","title":"Fast pursuit method for greedy algorithms in Distributed Compressive Sensing","display_name":"Fast pursuit method for greedy algorithms in Distributed Compressive Sensing","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1501716115","doi":"https://doi.org/10.1109/i2mtc.2015.7151428","mag":"1501716115"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2015.7151428","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151428","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102144042","display_name":"Hongwei Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210161462","display_name":"Heilongjiang Institute of Technology","ror":"https://ror.org/05x0m9n95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210161462"]},{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hongwei Xu","raw_affiliation_strings":["Dept. of Automatic Test and Control, Harbin Institute of Technology, Harbin, Heilongjiang Province, P.R. China","Dept. of Automatic Test and Control, Harbin Institute of Technology, No. 2, YiKuang Street, NanGang District, 150080, Heilongjiang Province, China"],"affiliations":[{"raw_affiliation_string":"Dept. of Automatic Test and Control, Harbin Institute of Technology, Harbin, Heilongjiang Province, P.R. China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Dept. of Automatic Test and Control, Harbin Institute of Technology, No. 2, YiKuang Street, NanGang District, 150080, Heilongjiang Province, China","institution_ids":["https://openalex.org/I4210161462","https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025061441","display_name":"Ning Fu","orcid":"https://orcid.org/0000-0002-0317-9697"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]},{"id":"https://openalex.org/I4210161462","display_name":"Heilongjiang Institute of Technology","ror":"https://ror.org/05x0m9n95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210161462"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Fu","raw_affiliation_strings":["Dept. of Automatic Test and Control, Harbin Institute of Technology, Harbin, Heilongjiang Province, P.R. China","Dept. of Automatic Test and Control, Harbin Institute of Technology, No. 2, YiKuang Street, NanGang District, 150080, Heilongjiang Province, China"],"affiliations":[{"raw_affiliation_string":"Dept. of Automatic Test and Control, Harbin Institute of Technology, Harbin, Heilongjiang Province, P.R. China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Dept. of Automatic Test and Control, Harbin Institute of Technology, No. 2, YiKuang Street, NanGang District, 150080, Heilongjiang Province, China","institution_ids":["https://openalex.org/I4210161462","https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006333473","display_name":"Liyan Qiao","orcid":"https://orcid.org/0000-0002-7397-3458"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]},{"id":"https://openalex.org/I4210161462","display_name":"Heilongjiang Institute of Technology","ror":"https://ror.org/05x0m9n95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210161462"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liyan Qiao","raw_affiliation_strings":["Dept. of Automatic Test and Control, Harbin Institute of Technology, Harbin, Heilongjiang Province, P.R. China","Dept. of Automatic Test and Control, Harbin Institute of Technology, No. 2, YiKuang Street, NanGang District, 150080, Heilongjiang Province, China"],"affiliations":[{"raw_affiliation_string":"Dept. of Automatic Test and Control, Harbin Institute of Technology, Harbin, Heilongjiang Province, P.R. China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Dept. of Automatic Test and Control, Harbin Institute of Technology, No. 2, YiKuang Street, NanGang District, 150080, Heilongjiang Province, China","institution_ids":["https://openalex.org/I4210161462","https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019735827","display_name":"Xiyuan Peng","orcid":"https://orcid.org/0000-0001-7424-1008"},"institutions":[{"id":"https://openalex.org/I4210161462","display_name":"Heilongjiang Institute of Technology","ror":"https://ror.org/05x0m9n95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210161462"]},{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiyuan Peng","raw_affiliation_strings":["Dept. of Automatic Test and Control, Harbin Institute of Technology, Harbin, Heilongjiang Province, P.R. China","Dept. of Automatic Test and Control, Harbin Institute of Technology, No. 2, YiKuang Street, NanGang District, 150080, Heilongjiang Province, China"],"affiliations":[{"raw_affiliation_string":"Dept. of Automatic Test and Control, Harbin Institute of Technology, Harbin, Heilongjiang Province, P.R. China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Dept. of Automatic Test and Control, Harbin Institute of Technology, No. 2, YiKuang Street, NanGang District, 150080, Heilongjiang Province, China","institution_ids":["https://openalex.org/I4210161462","https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5102144042"],"corresponding_institution_ids":["https://openalex.org/I204983213","https://openalex.org/I4210161462"],"apc_list":null,"apc_paid":null,"fwci":0.6498,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.67808448,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1118","last_page":"1122"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11447","display_name":"Blind Source Separation Techniques","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/compressed-sensing","display_name":"Compressed sensing","score":0.8831549286842346},{"id":"https://openalex.org/keywords/greedy-algorithm","display_name":"Greedy algorithm","score":0.8318828344345093},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6958911418914795},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6137984991073608},{"id":"https://openalex.org/keywords/minification","display_name":"Minification","score":0.47888320684432983},{"id":"https://openalex.org/keywords/signal-reconstruction","display_name":"Signal reconstruction","score":0.4554124176502228},{"id":"https://openalex.org/keywords/signal-recovery","display_name":"Signal recovery","score":0.446318656206131},{"id":"https://openalex.org/keywords/matching-pursuit","display_name":"Matching pursuit","score":0.4177040457725525},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.41059935092926025},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.3088710308074951},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.07374212145805359},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.061440348625183105}],"concepts":[{"id":"https://openalex.org/C124851039","wikidata":"https://www.wikidata.org/wiki/Q2665459","display_name":"Compressed sensing","level":2,"score":0.8831549286842346},{"id":"https://openalex.org/C51823790","wikidata":"https://www.wikidata.org/wiki/Q504353","display_name":"Greedy algorithm","level":2,"score":0.8318828344345093},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6958911418914795},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6137984991073608},{"id":"https://openalex.org/C147764199","wikidata":"https://www.wikidata.org/wiki/Q6865248","display_name":"Minification","level":2,"score":0.47888320684432983},{"id":"https://openalex.org/C70958404","wikidata":"https://www.wikidata.org/wiki/Q7512728","display_name":"Signal reconstruction","level":4,"score":0.4554124176502228},{"id":"https://openalex.org/C2989281035","wikidata":"https://www.wikidata.org/wiki/Q120811","display_name":"Signal recovery","level":3,"score":0.446318656206131},{"id":"https://openalex.org/C156872377","wikidata":"https://www.wikidata.org/wiki/Q6786281","display_name":"Matching pursuit","level":3,"score":0.4177040457725525},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.41059935092926025},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.3088710308074951},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.07374212145805359},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.061440348625183105},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2015.7151428","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151428","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1583589866","https://openalex.org/W1848264314","https://openalex.org/W1875923193","https://openalex.org/W2036962109","https://openalex.org/W2046658845","https://openalex.org/W2049808850","https://openalex.org/W2096185893","https://openalex.org/W2106407813","https://openalex.org/W2127271355","https://openalex.org/W2129131372","https://openalex.org/W2129638195","https://openalex.org/W2132793452","https://openalex.org/W2145096794","https://openalex.org/W2151693816","https://openalex.org/W2156246827","https://openalex.org/W2160979406","https://openalex.org/W2164452299","https://openalex.org/W2165409093","https://openalex.org/W2289917018","https://openalex.org/W2296616510","https://openalex.org/W2954811775","https://openalex.org/W4250955649","https://openalex.org/W4285719527","https://openalex.org/W6635032797","https://openalex.org/W6638711514","https://openalex.org/W6765286134"],"related_works":["https://openalex.org/W2378166785","https://openalex.org/W2382972663","https://openalex.org/W2388133936","https://openalex.org/W3015194228","https://openalex.org/W2340242818","https://openalex.org/W1555738523","https://openalex.org/W4200575023","https://openalex.org/W2012574959","https://openalex.org/W2381127329","https://openalex.org/W2465351041"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,95],"fast":[4,96],"pursuit":[5,97],"method":[6,98],"for":[7,34],"greedy":[8,72,125],"algorithms":[9,73],"when":[10,121],"reconstructing":[11],"multi-signals":[12],"under":[13],"Distributed":[14],"Compressive":[15,64],"Sensing":[16,65],"(DCS)":[17],"framework.":[18],"DCS":[19,61],"takes":[20],"advantage":[21],"of":[22,104],"both":[23],"intra-":[24],"and":[25,46,68],"inter-signal":[26],"correlation":[27],"structures":[28],"to":[29,63,74,108,119],"reduce":[30,109],"the":[31,78,85,101,110,129],"measurements":[32],"required":[33],"signals":[35],"recovery.":[36],"Greedy":[37],"algorithms,":[38,52,126],"much":[39],"faster":[40],"than":[41],"l":[42,47],"<sub":[43,48],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[44,49,116],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">0</sub>":[45],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">1</sub>":[50],"minimization":[51],"are":[53],"widely":[54],"used":[55],"in":[56,124],"DCS.":[57],"General":[58],"approaches":[59],"transform":[60],"model":[62,67],"(CS)":[66],"then":[69],"directly":[70],"use":[71],"reconstruct":[75],"signals,":[76],"but":[77],"recovery":[79,130,135],"speed":[80,131],"becomes":[81],"very":[82],"slow":[83],"as":[84],"signal":[86],"number":[87],"n":[88],"increasing.":[89],"In":[90],"this":[91],"paper,":[92],"we":[93],"propose":[94],"which":[99,127],"exploits":[100],"structural":[102],"features":[103],"joint":[105],"measurement":[106],"matrix":[107],"computational":[111],"complexity":[112],"form":[113],"O(n":[114],"<sup":[115],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[117],")":[118],"O(n)":[120],"calculating":[122],"inner-product":[123],"improves":[128],"significantly":[132],"without":[133],"reducing":[134],"accuracy.":[136]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}