{"id":"https://openalex.org/W1571144827","doi":"https://doi.org/10.1109/i2mtc.2015.7151290","title":"High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations","display_name":"High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1571144827","doi":"https://doi.org/10.1109/i2mtc.2015.7151290","mag":"1571144827"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2015.7151290","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151290","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032831613","display_name":"Fahim Hami","orcid":null},"institutions":[{"id":"https://openalex.org/I2802505300","display_name":"\u00c9cole Sup\u00e9rieure d'Ing\u00e9nieurs en G\u00e9nie \u00c9lectrique","ror":"https://ror.org/01apwkd48","country_code":"FR","type":"education","lineage":["https://openalex.org/I2802505300"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Fahim Hami","raw_affiliation_strings":["IRSEEM-ESIGELEC, Embedded Electronic Systems Research Institute, Saint Etienne du Rouvray, France","Smart Low-Carbon Vehicle and Mobility, Versailles, France"],"affiliations":[{"raw_affiliation_string":"IRSEEM-ESIGELEC, Embedded Electronic Systems Research Institute, Saint Etienne du Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]},{"raw_affiliation_string":"Smart Low-Carbon Vehicle and Mobility, Versailles, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037337488","display_name":"Habib Boulzazen","orcid":"https://orcid.org/0000-0002-5829-2865"},"institutions":[{"id":"https://openalex.org/I2802505300","display_name":"\u00c9cole Sup\u00e9rieure d'Ing\u00e9nieurs en G\u00e9nie \u00c9lectrique","ror":"https://ror.org/01apwkd48","country_code":"FR","type":"education","lineage":["https://openalex.org/I2802505300"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Habib Boulzazen","raw_affiliation_strings":["IRSEEM-ESIGELEC, Embedded Electronic Systems Research Institute, Saint Etienne du Rouvray, France"],"affiliations":[{"raw_affiliation_string":"IRSEEM-ESIGELEC, Embedded Electronic Systems Research Institute, Saint Etienne du Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080140521","display_name":"Moncef Kadi","orcid":"https://orcid.org/0000-0002-6336-830X"},"institutions":[{"id":"https://openalex.org/I2802505300","display_name":"\u00c9cole Sup\u00e9rieure d'Ing\u00e9nieurs en G\u00e9nie \u00c9lectrique","ror":"https://ror.org/01apwkd48","country_code":"FR","type":"education","lineage":["https://openalex.org/I2802505300"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Moncef Kadi","raw_affiliation_strings":["IRSEEM-ESIGELEC, Embedded Electronic Systems Research Institute, Saint Etienne du Rouvray, France"],"affiliations":[{"raw_affiliation_string":"IRSEEM-ESIGELEC, Embedded Electronic Systems Research Institute, Saint Etienne du Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5032831613"],"corresponding_institution_ids":["https://openalex.org/I2802505300"],"apc_list":null,"apc_paid":null,"fwci":0.8005,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.75510283,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"334","last_page":"339"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.8139251470565796},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.7141135334968567},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6223611831665039},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5438395738601685},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5069997310638428},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5045822858810425},{"id":"https://openalex.org/keywords/ranging","display_name":"Ranging","score":0.4783465564250946},{"id":"https://openalex.org/keywords/electronic-component","display_name":"Electronic component","score":0.45087170600891113},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4378681182861328},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.43436264991760254},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4102640151977539},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.36073029041290283},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.31030914187431335},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22906634211540222},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21523171663284302},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11466854810714722}],"concepts":[{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.8139251470565796},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.7141135334968567},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6223611831665039},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5438395738601685},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5069997310638428},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5045822858810425},{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.4783465564250946},{"id":"https://openalex.org/C81060104","wikidata":"https://www.wikidata.org/wiki/Q11653","display_name":"Electronic component","level":2,"score":0.45087170600891113},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4378681182861328},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.43436264991760254},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4102640151977539},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.36073029041290283},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.31030914187431335},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22906634211540222},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21523171663284302},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11466854810714722},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/i2mtc.2015.7151290","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151290","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-02306892v1","is_oa":false,"landing_page_url":"https://normandie-univ.hal.science/hal-02306892","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), May 2015, Pisa, Italy. pp.334-339, ⟨10.1109/I2MTC.2015.7151290⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8500000238418579,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W91150539","https://openalex.org/W1973363261","https://openalex.org/W1980467434","https://openalex.org/W2008411802","https://openalex.org/W2026975535","https://openalex.org/W2079842697","https://openalex.org/W2090771284","https://openalex.org/W2099485497","https://openalex.org/W2107147480","https://openalex.org/W2117924042","https://openalex.org/W2123670467","https://openalex.org/W2135795438","https://openalex.org/W2137736364","https://openalex.org/W2146977332","https://openalex.org/W6675730676"],"related_works":["https://openalex.org/W4384112194","https://openalex.org/W2783354812","https://openalex.org/W2103009189","https://openalex.org/W4312958259","https://openalex.org/W4390813131","https://openalex.org/W2349383066","https://openalex.org/W4308259661","https://openalex.org/W4328132048","https://openalex.org/W2164584982","https://openalex.org/W1981336133"],"abstract_inverted_index":{"All":[0],"types":[1,26],"of":[2,9,16,27,44,98,110],"passive":[3,28],"components":[4,29,100],"present":[5],"variations":[6],"for":[7,53],"most":[8],"their":[10,142],"electric":[11],"parameters":[12],"as":[13],"a":[14],"function":[15],"several":[17,69],"operating":[18],"conditions":[19],"(temperature,":[20],"frequency,":[21],"voltage).":[22],"Capacitors,":[23],"unlike":[24],"other":[25],"(resistors":[30],"and":[31,46,68,80,103,123],"coils),":[32],"are":[33,78,134],"more":[34],"sensitive":[35],"to":[36,59,88,91,120,129,137,140],"these":[37,64,99],"variations.":[38,107],"This":[39],"paper":[40],"presents":[41],"the":[42,95,111],"effects":[43],"temperature":[45,102,124],"bias":[47,105,113],"voltage":[48,106,114],"on":[49,73],"power":[50],"electronic":[51],"capacitors":[52],"frequencies":[54],"ranging":[55,125],"from":[56,116,126],"10":[57],"kHz":[58],"1":[60,121],"GHz.":[61],"To":[62],"study":[63],"effects,":[65],"characterization":[66],"methods":[67],"test":[70],"benches":[71],"based":[72],"Vector":[74],"Network":[75],"Analyzer":[76],"(VNA)":[77],"developed":[79,132],"introduced":[81],"in":[82,144],"this":[83],"paper.":[84],"The":[85,108,131],"aim":[86],"is":[87,115],"be":[89],"able":[90],"predict,":[92],"by":[93],"simulation,":[94],"frequency":[96],"behavior":[97],"under":[101],"high":[104],"range":[109],"applied":[112],"0":[117],"Volt":[118],"up":[119,128],"kVolt":[122],"-40\u00b0C":[127],"140\u00b0C.":[130],"models":[133],"then":[135],"translated":[136],"VHDL-AMS":[138],"languages":[139],"facilitate":[141],"implementation":[143],"various":[145],"electrical":[146],"simulators.":[147]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-03-10T16:38:18.471706","created_date":"2025-10-10T00:00:00"}