{"id":"https://openalex.org/W2005713632","doi":"https://doi.org/10.1109/i2mtc.2014.6861024","title":"A set of Virtual Instruments to simulate radiation effects in CMOS circuits","display_name":"A set of Virtual Instruments to simulate radiation effects in CMOS circuits","publication_year":2014,"publication_date":"2014-05-01","ids":{"openalex":"https://openalex.org/W2005713632","doi":"https://doi.org/10.1109/i2mtc.2014.6861024","mag":"2005713632"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2014.6861024","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2014.6861024","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061601200","display_name":"Walter Calienes Bartra","orcid":"https://orcid.org/0000-0001-8355-1841"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Walter Calienes Bartra","raw_affiliation_strings":["Universidade Federal do Rio Grande do Sul, Porto Alegre, RS, BR","Inst. of Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul, Porto Alegre, RS, BR","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Inst. of Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108043721","display_name":"Ricardo Reis","orcid":"https://orcid.org/0000-0001-5781-5858"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Ricardo Reis","raw_affiliation_strings":["Universidade Federal do Rio Grande do Sul, Porto Alegre, RS, BR","Inst. of Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul, Porto Alegre, RS, BR","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Inst. of Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5061601200"],"corresponding_institution_ids":["https://openalex.org/I130442723"],"apc_list":null,"apc_paid":null,"fwci":0.55494261,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.72794645,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1643","last_page":"1646"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7779921293258667},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.7507369518280029},{"id":"https://openalex.org/keywords/avionics","display_name":"Avionics","score":0.7387949824333191},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.6408595442771912},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.5647910833358765},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5045174360275269},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.48622575402259827},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4621584713459015},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.43822962045669556},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4343952238559723},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31160545349121094},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27057206630706787},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1710788905620575},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.10690104961395264},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.06943178176879883}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7779921293258667},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.7507369518280029},{"id":"https://openalex.org/C15792166","wikidata":"https://www.wikidata.org/wiki/Q221329","display_name":"Avionics","level":2,"score":0.7387949824333191},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.6408595442771912},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.5647910833358765},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5045174360275269},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.48622575402259827},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4621584713459015},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.43822962045669556},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4343952238559723},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31160545349121094},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27057206630706787},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1710788905620575},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.10690104961395264},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.06943178176879883},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2014.6861024","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2014.6861024","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5600000023841858}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W335201183","https://openalex.org/W1777937475","https://openalex.org/W1887624250","https://openalex.org/W1994644639","https://openalex.org/W2030501553","https://openalex.org/W2033742819","https://openalex.org/W2054149682","https://openalex.org/W2106865643","https://openalex.org/W2123934961","https://openalex.org/W2151948111","https://openalex.org/W3103339143"],"related_works":["https://openalex.org/W1589297475","https://openalex.org/W2389800961","https://openalex.org/W1995389502","https://openalex.org/W2139254480","https://openalex.org/W1490775144","https://openalex.org/W2501578203","https://openalex.org/W2113108952","https://openalex.org/W3215142653","https://openalex.org/W1487051936","https://openalex.org/W194748710"],"abstract_inverted_index":{"Over":[0],"the":[1,47,57,69],"years,":[2],"it":[3],"has":[4],"become":[5],"necessary":[6],"to":[7,11,31,50,63,67,83,92],"design":[8],"chips":[9,30],"tolerant":[10],"radiation":[12,51,70],"effects":[13,48,71,99],"-":[14],"circuits":[15],"that":[16],"will":[17],"be":[18,32,84],"used":[19,85],"not":[20],"only":[21],"by":[22],"avionics":[23],"and":[24,52,95],"space":[25],"industries,":[26],"but":[27],"also":[28],"for":[29],"operated":[33],"at":[34],"ground":[35],"level.":[36],"Single-Event":[37,39],"Transients,":[38],"Upsets,":[40],"Total":[41],"Ionization":[42],"Doses":[43],"are":[44,90],"some":[45],"of":[46,79],"due":[49],"heavy":[53],"ions":[54],"which":[55],"affects":[56],"electronic":[58],"systems.":[59],"It":[60],"is":[61],"important":[62],"develop":[64],"new":[65],"instruments":[66],"analyze":[68],"in":[72,100],"CMOS":[73,101],"circuits.":[74,102],"We":[75],"developed":[76],"a":[77],"set":[78],"Virtual":[80],"Instruments":[81],"(VI)":[82],"with":[86],"LabVIEW.":[87],"These":[88],"VIs":[89],"use":[91],"simulate,":[93],"measure":[94],"observe":[96],"several":[97],"radiation-related":[98]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}