{"id":"https://openalex.org/W2030892374","doi":"https://doi.org/10.1109/i2mtc.2014.6860516","title":"Defect evaluation using the phase information of an EC-GMR sensor","display_name":"Defect evaluation using the phase information of an EC-GMR sensor","publication_year":2014,"publication_date":"2014-05-01","ids":{"openalex":"https://openalex.org/W2030892374","doi":"https://doi.org/10.1109/i2mtc.2014.6860516","mag":"2030892374"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2014.6860516","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2014.6860516","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085917066","display_name":"Peng Gao","orcid":"https://orcid.org/0000-0002-5176-628X"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Peng Gao","raw_affiliation_strings":["Tianjin University, Tianjin, Tianjin, CN"],"affiliations":[{"raw_affiliation_string":"Tianjin University, Tianjin, Tianjin, CN","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100406987","display_name":"Chao Wang","orcid":"https://orcid.org/0000-0002-4362-947X"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Wang","raw_affiliation_strings":["Tianjin University, Tianjin, Tianjin, CN"],"affiliations":[{"raw_affiliation_string":"Tianjin University, Tianjin, Tianjin, CN","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115602293","display_name":"Yang Li","orcid":"https://orcid.org/0000-0003-4616-4230"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Li","raw_affiliation_strings":["Tianjin University, Tianjin, Tianjin, CN"],"affiliations":[{"raw_affiliation_string":"Tianjin University, Tianjin, Tianjin, CN","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070492439","display_name":"Fanwei Li","orcid":null},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fanwei Li","raw_affiliation_strings":["Tianjin University, Tianjin, Tianjin, CN"],"affiliations":[{"raw_affiliation_string":"Tianjin University, Tianjin, Tianjin, CN","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078729695","display_name":"Yong Yan","orcid":"https://orcid.org/0000-0001-7135-5456"},"institutions":[{"id":"https://openalex.org/I20581793","display_name":"University of Kent","ror":"https://ror.org/00xkeyj56","country_code":"GB","type":"education","lineage":["https://openalex.org/I20581793"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Yong Yan","raw_affiliation_strings":["University of Kent, Canterbury, Kent, GB"],"affiliations":[{"raw_affiliation_string":"University of Kent, Canterbury, Kent, GB","institution_ids":["https://openalex.org/I20581793"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001441001","display_name":"Yonghui Hu","orcid":"https://orcid.org/0000-0002-7228-5418"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yonghui Hu","raw_affiliation_strings":["North China Electric Power University, Beijing, Beijing, CN"],"affiliations":[{"raw_affiliation_string":"North China Electric Power University, Beijing, Beijing, CN","institution_ids":["https://openalex.org/I153473198"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5085917066"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":0.7436,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.74066783,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"304","issue":null,"first_page":"25","last_page":"29"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.6728326082229614},{"id":"https://openalex.org/keywords/giant-magnetoresistance","display_name":"Giant magnetoresistance","score":0.6672556400299072},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5628711581230164},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5345337390899658},{"id":"https://openalex.org/keywords/eddy-current-sensor","display_name":"Eddy-current sensor","score":0.5226143002510071},{"id":"https://openalex.org/keywords/biot-number","display_name":"Biot number","score":0.5171484351158142},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.5069151520729065},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.5047115087509155},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3432944416999817},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.28573036193847656},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28545328974723816},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19499114155769348},{"id":"https://openalex.org/keywords/magnetoresistance","display_name":"Magnetoresistance","score":0.1063447892665863},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10608747601509094},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.10608014464378357},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.09790360927581787}],"concepts":[{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.6728326082229614},{"id":"https://openalex.org/C84154488","wikidata":"https://www.wikidata.org/wiki/Q58353","display_name":"Giant magnetoresistance","level":4,"score":0.6672556400299072},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5628711581230164},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5345337390899658},{"id":"https://openalex.org/C2777897478","wikidata":"https://www.wikidata.org/wiki/Q23718891","display_name":"Eddy-current sensor","level":3,"score":0.5226143002510071},{"id":"https://openalex.org/C115341296","wikidata":"https://www.wikidata.org/wiki/Q864844","display_name":"Biot number","level":2,"score":0.5171484351158142},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.5069151520729065},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.5047115087509155},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3432944416999817},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28573036193847656},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28545328974723816},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19499114155769348},{"id":"https://openalex.org/C117958382","wikidata":"https://www.wikidata.org/wiki/Q58347","display_name":"Magnetoresistance","level":3,"score":0.1063447892665863},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10608747601509094},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.10608014464378357},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.09790360927581787},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/i2mtc.2014.6860516","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2014.6860516","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},{"id":"pmh:oai:kar.kent.ac.uk:41707","is_oa":false,"landing_page_url":"https://kar.kent.ac.uk/41707/","pdf_url":null,"source":{"id":"https://openalex.org/S4377196264","display_name":"Kent Academic Repository (University of Kent)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I20581793","host_organization_name":"University of Kent","host_organization_lineage":["https://openalex.org/I20581793"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference or workshop item"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321106","display_name":"Ministry of Education of the People's Republic of China","ror":"https://ror.org/01mv9t934"},{"id":"https://openalex.org/F4320334924","display_name":"Program for New Century Excellent Talents in University","ror":"https://ror.org/01mv9t934"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W581319240","https://openalex.org/W1167204822","https://openalex.org/W1970554320","https://openalex.org/W1976853603","https://openalex.org/W2035765874","https://openalex.org/W2039298621","https://openalex.org/W2047462507","https://openalex.org/W2088949412","https://openalex.org/W2122815482","https://openalex.org/W2148770102","https://openalex.org/W2172225531","https://openalex.org/W6616868679","https://openalex.org/W6627518276"],"related_works":["https://openalex.org/W2032533659","https://openalex.org/W2371240635","https://openalex.org/W2130539955","https://openalex.org/W2393924909","https://openalex.org/W2371953208","https://openalex.org/W2084189288","https://openalex.org/W1988040182","https://openalex.org/W2392480046","https://openalex.org/W2015118871","https://openalex.org/W3137043229"],"abstract_inverted_index":{"Phase":[0],"information":[1],"is":[2,27,38,49],"employed":[3],"to":[4],"enhance":[5],"evaluating":[6],"defects":[7],"in":[8,40],"the":[9,16,24,42,45,61,77,81],"metals":[10],"by":[11],"eddy":[12,34],"current":[13,35],"testing":[14],"using":[15],"conventional":[17],"probes.":[18],"But":[19],"for":[20,60],"an":[21],"EC-GMR":[22,62],"sensor,":[23],"output":[25,48,64],"phase":[26,43,59,78],"not":[28],"used.":[29],"In":[30],"this":[31],"paper,":[32],"GMR-based":[33],"defect":[36,71],"detection":[37],"studied,":[39],"which":[41],"of":[44,80],"GMR":[46,82],"sensor":[47],"taken":[50],"into":[51],"account.":[52],"Based":[53],"on":[54],"Biot-Savart":[55],"law,":[56],"amplitude":[57],"and":[58],"sensor's":[63,83],"are":[65],"studied.":[66],"This":[67],"paper":[68],"shows":[69],"that":[70],"can":[72],"be":[73],"better":[74],"located":[75],"through":[76],"analysis":[79],"output.":[84]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}