{"id":"https://openalex.org/W4234866582","doi":"https://doi.org/10.1109/i2mtc.2013.6555703","title":"Interferometric technique for scanning near-field microwave microscopy applications","display_name":"Interferometric technique for scanning near-field microwave microscopy applications","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W4234866582","doi":"https://doi.org/10.1109/i2mtc.2013.6555703"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2013.6555703","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555703","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035316472","display_name":"Hind Bakli","orcid":"https://orcid.org/0000-0002-5122-1722"},"institutions":[{"id":"https://openalex.org/I2279609970","display_name":"Universit\u00e9 de Lille","ror":"https://ror.org/02kzqn938","country_code":"FR","type":"education","lineage":["https://openalex.org/I2279609970"]},{"id":"https://openalex.org/I4210123471","display_name":"Institut d'\u00e9lectronique de micro\u00e9lectronique et de nanotechnologie","ror":"https://ror.org/02q4res37","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I137614889","https://openalex.org/I2279609970","https://openalex.org/I3132279224","https://openalex.org/I4210095849","https://openalex.org/I4210123471","https://openalex.org/I4387154098","https://openalex.org/I70348806","https://openalex.org/I70348806","https://openalex.org/I7454413"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"H. Bakli","raw_affiliation_strings":["University of Lille1/IEMN, France"],"affiliations":[{"raw_affiliation_string":"University of Lille1/IEMN, France","institution_ids":["https://openalex.org/I2279609970","https://openalex.org/I4210123471"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050947509","display_name":"Kamel Haddadi","orcid":"https://orcid.org/0000-0002-4857-5220"},"institutions":[{"id":"https://openalex.org/I4210123471","display_name":"Institut d'\u00e9lectronique de micro\u00e9lectronique et de nanotechnologie","ror":"https://ror.org/02q4res37","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I137614889","https://openalex.org/I2279609970","https://openalex.org/I3132279224","https://openalex.org/I4210095849","https://openalex.org/I4210123471","https://openalex.org/I4387154098","https://openalex.org/I70348806","https://openalex.org/I70348806","https://openalex.org/I7454413"]},{"id":"https://openalex.org/I2279609970","display_name":"Universit\u00e9 de Lille","ror":"https://ror.org/02kzqn938","country_code":"FR","type":"education","lineage":["https://openalex.org/I2279609970"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"K. Haddadi","raw_affiliation_strings":["University of Lille1/IEMN, France"],"affiliations":[{"raw_affiliation_string":"University of Lille1/IEMN, France","institution_ids":["https://openalex.org/I2279609970","https://openalex.org/I4210123471"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052847527","display_name":"T. Lasri","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123471","display_name":"Institut d'\u00e9lectronique de micro\u00e9lectronique et de nanotechnologie","ror":"https://ror.org/02q4res37","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I137614889","https://openalex.org/I2279609970","https://openalex.org/I3132279224","https://openalex.org/I4210095849","https://openalex.org/I4210123471","https://openalex.org/I4387154098","https://openalex.org/I70348806","https://openalex.org/I70348806","https://openalex.org/I7454413"]},{"id":"https://openalex.org/I2279609970","display_name":"Universit\u00e9 de Lille","ror":"https://ror.org/02kzqn938","country_code":"FR","type":"education","lineage":["https://openalex.org/I2279609970"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"T. Lasri","raw_affiliation_strings":["IEMN - University of Lille, France"],"affiliations":[{"raw_affiliation_string":"IEMN - University of Lille, France","institution_ids":["https://openalex.org/I2279609970","https://openalex.org/I4210123471"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5035316472"],"corresponding_institution_ids":["https://openalex.org/I2279609970","https://openalex.org/I4210123471"],"apc_list":null,"apc_paid":null,"fwci":1.4325,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.82206157,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1694","last_page":"1698"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/attenuator","display_name":"Attenuator (electronics)","score":0.776222825050354},{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.7192912101745605},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.6551916599273682},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.6526994109153748},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5176187753677368},{"id":"https://openalex.org/keywords/coaxial","display_name":"Coaxial","score":0.47367149591445923},{"id":"https://openalex.org/keywords/phase-shift-module","display_name":"Phase shift module","score":0.45473864674568176},{"id":"https://openalex.org/keywords/microwave-imaging","display_name":"Microwave imaging","score":0.44566547870635986},{"id":"https://openalex.org/keywords/spectrum-analyzer","display_name":"Spectrum analyzer","score":0.4344610571861267},{"id":"https://openalex.org/keywords/power-dividers-and-directional-couplers","display_name":"Power dividers and directional couplers","score":0.4167683720588684},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4138030707836151},{"id":"https://openalex.org/keywords/scanning-probe-microscopy","display_name":"Scanning probe microscopy","score":0.41253384947776794},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3428630828857422},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.22441741824150085},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21613895893096924},{"id":"https://openalex.org/keywords/insertion-loss","display_name":"Insertion loss","score":0.17909970879554749},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.1585998237133026},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.15578743815422058},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14218023419380188},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12213557958602905}],"concepts":[{"id":"https://openalex.org/C174847166","wikidata":"https://www.wikidata.org/wiki/Q1269728","display_name":"Attenuator (electronics)","level":3,"score":0.776222825050354},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.7192912101745605},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.6551916599273682},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6526994109153748},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5176187753677368},{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.47367149591445923},{"id":"https://openalex.org/C103864889","wikidata":"https://www.wikidata.org/wiki/Q4480524","display_name":"Phase shift module","level":3,"score":0.45473864674568176},{"id":"https://openalex.org/C2779885931","wikidata":"https://www.wikidata.org/wiki/Q17010029","display_name":"Microwave imaging","level":3,"score":0.44566547870635986},{"id":"https://openalex.org/C158007255","wikidata":"https://www.wikidata.org/wiki/Q1055222","display_name":"Spectrum analyzer","level":2,"score":0.4344610571861267},{"id":"https://openalex.org/C202988678","wikidata":"https://www.wikidata.org/wiki/Q1417986","display_name":"Power dividers and directional couplers","level":2,"score":0.4167683720588684},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4138030707836151},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.41253384947776794},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3428630828857422},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.22441741824150085},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21613895893096924},{"id":"https://openalex.org/C90327742","wikidata":"https://www.wikidata.org/wiki/Q947396","display_name":"Insertion loss","level":2,"score":0.17909970879554749},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.1585998237133026},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.15578743815422058},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14218023419380188},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12213557958602905}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/i2mtc.2013.6555703","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555703","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00877837v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00877837","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2013, 2013, Minneapolis, MN, United States. pp.1694-1698, ⟨10.1109/I2MTC.2013.6555703⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7599999904632568}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W194608437","https://openalex.org/W1571982595","https://openalex.org/W1581615653","https://openalex.org/W2001107887","https://openalex.org/W2012859874","https://openalex.org/W2031838497","https://openalex.org/W2040999896","https://openalex.org/W2056980039","https://openalex.org/W2101128439","https://openalex.org/W2132739674","https://openalex.org/W2137746547","https://openalex.org/W2141855113","https://openalex.org/W2168844231","https://openalex.org/W3106357784","https://openalex.org/W4206892643","https://openalex.org/W4234146197","https://openalex.org/W6634765763","https://openalex.org/W6806864788"],"related_works":["https://openalex.org/W2389772695","https://openalex.org/W2356507289","https://openalex.org/W2368851831","https://openalex.org/W2373477153","https://openalex.org/W2978186478","https://openalex.org/W3094462591","https://openalex.org/W4232953560","https://openalex.org/W4317496708","https://openalex.org/W2024484339","https://openalex.org/W2566727107"],"abstract_inverted_index":{"An":[0],"interferometric":[1],"technique":[2],"for":[3],"scanning":[4,61],"nearfield":[5],"microscopy":[6],"applications":[7],"is":[8,12,65],"proposed.":[9],"The":[10],"method":[11],"based":[13],"on":[14],"the":[15,71,75],"association":[16],"of":[17,46],"a":[18,28,34,37,60],"vector":[19],"network":[20],"analyzer,":[21],"an":[22,40],"evanescent":[23],"microwave":[24,63],"coaxial":[25],"probe":[26],"and":[27,39,52,67],"precise":[29],"interferometer":[30],"built":[31,66],"up":[32],"with":[33],"power":[35],"divider,":[36],"phase-shifter":[38],"attenuator.":[41],"Advantages":[42],"such":[43],"as":[44],"simplicity":[45],"operation,":[47],"broad":[48],"frequency":[49,76],"band":[50],"capabilities":[51],"high":[53],"measurement":[54,72],"sensitivity":[55,73],"are":[56,80],"achieved.":[57],"In":[58],"particular,":[59],"near-field":[62],"microscope":[64],"experiments":[68],"related":[69],"to":[70],"in":[74],"range":[77],"2-6":[78],"GHz":[79],"demonstrated.":[81]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2}],"updated_date":"2026-03-10T16:38:18.471706","created_date":"2025-10-10T00:00:00"}