{"id":"https://openalex.org/W1963774565","doi":"https://doi.org/10.1109/i2mtc.2013.6555686","title":"Performance measurements of an optical detector designed for monolithic integration with a power VDMOS","display_name":"Performance measurements of an optical detector designed for monolithic integration with a power VDMOS","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W1963774565","doi":"https://doi.org/10.1109/i2mtc.2013.6555686","mag":"1963774565"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2013.6555686","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555686","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110271749","display_name":"Raha Vafaei","orcid":null},"institutions":[{"id":"https://openalex.org/I4210165697","display_name":"Laboratoire de G\u00e9nie \u00c9lectrique de Grenoble","ror":"https://ror.org/05hyx5a17","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210165697","https://openalex.org/I899635006","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Raha Vafaei","raw_affiliation_strings":["G2Elab, Centre National de la Recherche Scientifique, Grenoble, France","G2Elab, Univ. of Grenoble Alpes, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"G2Elab, Centre National de la Recherche Scientifique, Grenoble, France","institution_ids":["https://openalex.org/I4210165697","https://openalex.org/I899635006"]},{"raw_affiliation_string":"G2Elab, Univ. of Grenoble Alpes, Grenoble, France","institution_ids":["https://openalex.org/I899635006"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021833676","display_name":"Jean-Christophe Cr\u00e9bier","orcid":"https://orcid.org/0000-0002-3009-1543"},"institutions":[{"id":"https://openalex.org/I4210165697","display_name":"Laboratoire de G\u00e9nie \u00c9lectrique de Grenoble","ror":"https://ror.org/05hyx5a17","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210165697","https://openalex.org/I899635006","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Jean-Christophe Crebier","raw_affiliation_strings":["G2Elab, Centre National de la Recherche Scientifique, Grenoble, France","G2Elab, Univ. of Grenoble Alpes, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"G2Elab, Centre National de la Recherche Scientifique, Grenoble, France","institution_ids":["https://openalex.org/I4210165697","https://openalex.org/I899635006"]},{"raw_affiliation_string":"G2Elab, Univ. of Grenoble Alpes, Grenoble, France","institution_ids":["https://openalex.org/I899635006"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051441847","display_name":"Nicolas Rouger","orcid":"https://orcid.org/0000-0002-2161-9043"},"institutions":[{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210165697","display_name":"Laboratoire de G\u00e9nie \u00c9lectrique de Grenoble","ror":"https://ror.org/05hyx5a17","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210165697","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Nicolas Rouger","raw_affiliation_strings":["G2Elab, Centre National de la Recherche Scientifique, Grenoble, France","G2Elab, Univ. of Grenoble Alpes, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"G2Elab, Centre National de la Recherche Scientifique, Grenoble, France","institution_ids":["https://openalex.org/I4210165697","https://openalex.org/I899635006"]},{"raw_affiliation_string":"G2Elab, Univ. of Grenoble Alpes, Grenoble, France","institution_ids":["https://openalex.org/I899635006"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5110271749"],"corresponding_institution_ids":["https://openalex.org/I4210165697","https://openalex.org/I899635006"],"apc_list":null,"apc_paid":null,"fwci":0.4798,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.67397107,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1609","last_page":"1614"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.7374361753463745},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.7076923847198486},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.67995285987854},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6516655683517456},{"id":"https://openalex.org/keywords/photodetector","display_name":"Photodetector","score":0.6000780463218689},{"id":"https://openalex.org/keywords/wavelength","display_name":"Wavelength","score":0.5921703577041626},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5499139428138733},{"id":"https://openalex.org/keywords/optical-power","display_name":"Optical power","score":0.5292983055114746},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5227180123329163},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.508847713470459},{"id":"https://openalex.org/keywords/quantum-efficiency","display_name":"Quantum efficiency","score":0.4675779640674591},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.43783149123191833},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23438575863838196},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.21795380115509033},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.10343095660209656}],"concepts":[{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.7374361753463745},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.7076923847198486},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.67995285987854},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6516655683517456},{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.6000780463218689},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.5921703577041626},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5499139428138733},{"id":"https://openalex.org/C191161701","wikidata":"https://www.wikidata.org/wiki/Q559265","display_name":"Optical power","level":3,"score":0.5292983055114746},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5227180123329163},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.508847713470459},{"id":"https://openalex.org/C205507967","wikidata":"https://www.wikidata.org/wiki/Q900625","display_name":"Quantum efficiency","level":2,"score":0.4675779640674591},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.43783149123191833},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23438575863838196},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.21795380115509033},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.10343095660209656},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/i2mtc.2013.6555686","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555686","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00828612v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00828612","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"I2MTC 2013, May 2013, Minn\u00e9apolis, United States","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1985225095","https://openalex.org/W2058636698","https://openalex.org/W2098780263","https://openalex.org/W2122510424","https://openalex.org/W2124110891","https://openalex.org/W2124127112","https://openalex.org/W2139795508","https://openalex.org/W2170041687","https://openalex.org/W2170128832","https://openalex.org/W4299835276"],"related_works":["https://openalex.org/W2371692126","https://openalex.org/W2991406138","https://openalex.org/W2117349001","https://openalex.org/W4280542801","https://openalex.org/W2389601183","https://openalex.org/W2000803821","https://openalex.org/W4214754971","https://openalex.org/W2008977342","https://openalex.org/W2137810906","https://openalex.org/W4253159378"],"abstract_inverted_index":{"This":[0],"paper":[1],"demonstrates":[2],"an":[3,15],"accurate":[4],"measurement":[5,65],"procedure":[6],"to":[7,39],"characterize":[8],"the":[9,51],"DC":[10],"and":[11,64,75,105,110,121],"AC":[12],"performance":[13],"of":[14,48,103],"optical":[16,91],"detector":[17],"designed":[18],"for":[19,70,99],"monolithic":[20],"integration":[21],"with":[22,86],"a":[23,100],"600":[24],"V":[25],"vertical":[26],"power":[27],"MOS":[28],"transistor.":[29],"The":[30,61,89],"spectral":[31],"quantum":[32],"efficiency":[33],"(QE)":[34],"from":[35],"400":[36],"nm":[37,53,56],"up":[38],"1":[40],"\u03bcm":[41],"wavelengths":[42,104],"has":[43],"been":[44,97],"measured.":[45],"A":[46],"QE":[47],"26%":[49],"in":[50],"450":[52],"-":[54],"520":[55],"wavelength":[57],"range":[58,102],"was":[59],"achieved.":[60],"developed":[62],"setup":[63],"procedures":[66],"can":[67],"be":[68],"used":[69],"diced":[71],"samples,":[72],"packaged":[73],"devices,":[74],"on-wafer":[76],"probing":[77],"(maximum":[78],"size:":[79],"4\u201d":[80],"wafers);":[81],"furthermore,":[82],"it":[83],"is":[84],"equipped":[85],"temperature":[87],"control.":[88],"integrated":[90],"detectors":[92],"(IOD)":[93],"key":[94],"phenomena":[95],"have":[96],"investigated":[98],"wide":[101],"biasing":[106],"conditions,":[107],"both":[108],"experimentally":[109],"numerically.":[111],"Simulation":[112],"results":[113,118],"as":[114,116],"well":[115],"experimental":[117],"are":[119],"presented":[120],"compared.":[122]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}