{"id":"https://openalex.org/W2101887239","doi":"https://doi.org/10.1109/i2mtc.2013.6555682","title":"Design and development of an accelerated testing architecture for embedded systems fault monitoring","display_name":"Design and development of an accelerated testing architecture for embedded systems fault monitoring","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W2101887239","doi":"https://doi.org/10.1109/i2mtc.2013.6555682","mag":"2101887239"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2013.6555682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555682","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007208196","display_name":"Valeria L. Scarano","orcid":null},"institutions":[{"id":"https://openalex.org/I45084792","display_name":"University of Florence","ror":"https://ror.org/04jr1s763","country_code":"IT","type":"education","lineage":["https://openalex.org/I45084792"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Valeria L. Scarano","raw_affiliation_strings":["Department of Electronics and Telecommunications, University of Florence, Firenze, Italy","Dept of Electron. & Telecommun., Univ. of Florence, Florence, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Telecommunications, University of Florence, Firenze, Italy","institution_ids":["https://openalex.org/I45084792"]},{"raw_affiliation_string":"Dept of Electron. & Telecommun., Univ. of Florence, Florence, Italy","institution_ids":["https://openalex.org/I45084792"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107410257","display_name":"Marcantonio Catelani","orcid":"https://orcid.org/0000-0002-9537-9724"},"institutions":[{"id":"https://openalex.org/I45084792","display_name":"University of Florence","ror":"https://ror.org/04jr1s763","country_code":"IT","type":"education","lineage":["https://openalex.org/I45084792"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marcantonio Catelani","raw_affiliation_strings":["Department of Electronics and Telecommunications, University of Florence, Firenze, Italy","Dept of Electron. & Telecommun., Univ. of Florence, Florence, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Telecommunications, University of Florence, Firenze, Italy","institution_ids":["https://openalex.org/I45084792"]},{"raw_affiliation_string":"Dept of Electron. & Telecommun., Univ. of Florence, Florence, Italy","institution_ids":["https://openalex.org/I45084792"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037390523","display_name":"Andrea Carignano","orcid":null},"institutions":[{"id":"https://openalex.org/I1300504238","display_name":"Piaggio (Italy)","ror":"https://ror.org/00r254y42","country_code":"IT","type":"company","lineage":["https://openalex.org/I1300504238"]},{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andrea Carignano","raw_affiliation_strings":["Interdepartmental Center of Research E.Piaggio, University of Pisa, Pisa, Italy","I&S Global Design, bioMerieux Italia S.p.A., Florence, Italy"],"affiliations":[{"raw_affiliation_string":"Interdepartmental Center of Research E.Piaggio, University of Pisa, Pisa, Italy","institution_ids":["https://openalex.org/I1300504238","https://openalex.org/I108290504"]},{"raw_affiliation_string":"I&S Global Design, bioMerieux Italia S.p.A., Florence, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024349725","display_name":"Daniele Mazzei","orcid":"https://orcid.org/0000-0001-8383-3355"},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Daniele Mazzei","raw_affiliation_strings":["I&S Global Design, BioM\u00e9rieux Italia S.p.A., Florence, Italy","Interdept. Center of Res. E.Piaggio, Univ. of Pisa, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"I&S Global Design, BioM\u00e9rieux Italia S.p.A., Florence, Italy","institution_ids":[]},{"raw_affiliation_string":"Interdept. Center of Res. E.Piaggio, Univ. of Pisa, Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091669927","display_name":"Giacomo Baldi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Giacomo Baldi","raw_affiliation_strings":["Errequadro Srl, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"Errequadro Srl, Pisa, Italy","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5007208196"],"corresponding_institution_ids":["https://openalex.org/I45084792"],"apc_list":null,"apc_paid":null,"fwci":0.5088,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.74348429,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"2","issue":null,"first_page":"1590","last_page":"1593"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.984000027179718,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6986793279647827},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6611793637275696},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6461423635482788},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.589592695236206},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5225079655647278},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.510688841342926},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4956773519515991},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.48129692673683167},{"id":"https://openalex.org/keywords/software-performance-testing","display_name":"Software performance testing","score":0.42951327562332153},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.426789790391922},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.41281795501708984},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.3965384364128113},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.22843945026397705},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.22745898365974426},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20297232270240784},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.14658021926879883},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11386016011238098}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6986793279647827},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6611793637275696},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6461423635482788},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.589592695236206},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5225079655647278},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.510688841342926},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4956773519515991},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.48129692673683167},{"id":"https://openalex.org/C178059732","wikidata":"https://www.wikidata.org/wiki/Q1982529","display_name":"Software performance testing","level":5,"score":0.42951327562332153},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.426789790391922},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.41281795501708984},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.3965384364128113},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.22843945026397705},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.22745898365974426},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20297232270240784},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.14658021926879883},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11386016011238098},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/i2mtc.2013.6555682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555682","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},{"id":"pmh:oai:arpi.unipi.it:11568/856192","is_oa":false,"landing_page_url":"http://hdl.handle.net/11568/856192","pdf_url":null,"source":{"id":"https://openalex.org/S4377196265","display_name":"CINECA IRIS Institutial research information system (University of Pisa)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I108290504","host_organization_name":"University of Pisa","host_organization_lineage":["https://openalex.org/I108290504"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:flore.unifi.it:2158/1050101","is_oa":false,"landing_page_url":"http://hdl.handle.net/2158/1050101","pdf_url":null,"source":{"id":"https://openalex.org/S4306402033","display_name":"Florence Research (University of Florence)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I45084792","host_organization_name":"University of Florence","host_organization_lineage":["https://openalex.org/I45084792"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","score":0.699999988079071,"display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W578754772","https://openalex.org/W1551058925","https://openalex.org/W2098176834","https://openalex.org/W2116870707","https://openalex.org/W2143585755","https://openalex.org/W2284485726","https://openalex.org/W2795854098","https://openalex.org/W2964183068","https://openalex.org/W4229680264","https://openalex.org/W4239261471","https://openalex.org/W6639416087"],"related_works":["https://openalex.org/W79904784","https://openalex.org/W2043849561","https://openalex.org/W2127317700","https://openalex.org/W2612858043","https://openalex.org/W2032374522","https://openalex.org/W1972391765","https://openalex.org/W4300923837","https://openalex.org/W2135271429","https://openalex.org/W3145773044","https://openalex.org/W2083209667"],"abstract_inverted_index":{"The":[0],"evaluation":[1],"of":[2,5,26,29,49],"reliability":[3,48],"performances":[4],"a":[6,39],"commercial":[7],"embedded":[8],"module":[9],"was":[10,22],"proposed.":[11],"Testing":[12],"procedure,":[13],"hardware":[14],"and":[15,47],"software":[16],"architecture":[17],"for":[18],"on-line":[19],"fault":[20],"monitoring":[21],"implemented.":[23],"By":[24],"means":[25],"the":[27,33,45,50],"application":[28],"accelerated":[30],"climatic":[31],"testing,":[32],"final":[34],"challenge":[35],"is":[36],"to":[37,42],"implement":[38],"model":[40],"able":[41],"statistically":[43],"prove":[44],"quality":[46],"module.":[51]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}