{"id":"https://openalex.org/W2077559304","doi":"https://doi.org/10.1109/i2mtc.2013.6555646","title":"The forthcoming IEEE standard 1696 on test methods for characterizing circuit probes","display_name":"The forthcoming IEEE standard 1696 on test methods for characterizing circuit probes","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W2077559304","doi":"https://doi.org/10.1109/i2mtc.2013.6555646","mag":"2077559304"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2013.6555646","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555646","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016401002","display_name":"Nicholas G. Paulter","orcid":"https://orcid.org/0000-0002-9782-0894"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Nicholas G. Paulter","raw_affiliation_strings":["Security Technologies Group, National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"Security Technologies Group, National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079045760","display_name":"John Jendzurski","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John R. Jendzurski","raw_affiliation_strings":["Security Technologies Group, National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"Security Technologies Group, National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004739259","display_name":"Mike McTigue","orcid":null},"institutions":[{"id":"https://openalex.org/I138285227","display_name":"Agilent Technologies (United States)","ror":"https://ror.org/02tryst02","country_code":"US","type":"company","lineage":["https://openalex.org/I138285227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mike McTigue","raw_affiliation_strings":["Agilent Technologies, Colorado Springs, CO, USA"],"affiliations":[{"raw_affiliation_string":"Agilent Technologies, Colorado Springs, CO, USA","institution_ids":["https://openalex.org/I138285227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5098067217","display_name":"Bill Hagerup","orcid":null},"institutions":[{"id":"https://openalex.org/I1282770075","display_name":"Tektronix (United States)","ror":"https://ror.org/04kw5s604","country_code":"US","type":"company","lineage":["https://openalex.org/I1282770075"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bill Hagerup","raw_affiliation_strings":["Tektronix, Inc., Beaverton, OR, USA"],"affiliations":[{"raw_affiliation_string":"Tektronix, Inc., Beaverton, OR, USA","institution_ids":["https://openalex.org/I1282770075"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064121524","display_name":"Thomas E. Linnenbrink","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Thomas Linnenbrink","raw_affiliation_strings":["Hittite Microwave Corp., Colorado Springs, CO, USA"],"affiliations":[{"raw_affiliation_string":"Hittite Microwave Corp., Colorado Springs, CO, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5016401002"],"corresponding_institution_ids":["https://openalex.org/I1321296531"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13066833,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1412","last_page":"1415"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9879000186920166,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9879000186920166,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9876000285148621,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9868999719619751,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/oscilloscope","display_name":"Oscilloscope","score":0.9114378690719604},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.7166639566421509},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.6654303073883057},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6017055511474609},{"id":"https://openalex.org/keywords/multimeter","display_name":"Multimeter","score":0.5688015222549438},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5520539283752441},{"id":"https://openalex.org/keywords/test-fixture","display_name":"Test fixture","score":0.5259276032447815},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5164916515350342},{"id":"https://openalex.org/keywords/fixture","display_name":"Fixture","score":0.5155279636383057},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.511769711971283},{"id":"https://openalex.org/keywords/focused-impedance-measurement","display_name":"Focused Impedance Measurement","score":0.42604267597198486},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.4115757346153259},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4109748899936676},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3240680694580078},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.30629801750183105},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2564006745815277},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.16240182518959045}],"concepts":[{"id":"https://openalex.org/C184026988","wikidata":"https://www.wikidata.org/wiki/Q174320","display_name":"Oscilloscope","level":3,"score":0.9114378690719604},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.7166639566421509},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.6654303073883057},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6017055511474609},{"id":"https://openalex.org/C103185065","wikidata":"https://www.wikidata.org/wiki/Q189996","display_name":"Multimeter","level":3,"score":0.5688015222549438},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5520539283752441},{"id":"https://openalex.org/C2778502540","wikidata":"https://www.wikidata.org/wiki/Q1141613","display_name":"Test fixture","level":2,"score":0.5259276032447815},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5164916515350342},{"id":"https://openalex.org/C2781122048","wikidata":"https://www.wikidata.org/wiki/Q15983064","display_name":"Fixture","level":2,"score":0.5155279636383057},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.511769711971283},{"id":"https://openalex.org/C172066009","wikidata":"https://www.wikidata.org/wiki/Q5463955","display_name":"Focused Impedance Measurement","level":3,"score":0.42604267597198486},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.4115757346153259},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4109748899936676},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3240680694580078},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.30629801750183105},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2564006745815277},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.16240182518959045},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2013.6555646","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555646","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2371660604","https://openalex.org/W2143531534","https://openalex.org/W2143124335","https://openalex.org/W1964347959","https://openalex.org/W2975062419","https://openalex.org/W1498235722","https://openalex.org/W2348337795","https://openalex.org/W2352439504","https://openalex.org/W2063098132","https://openalex.org/W2014374846"],"abstract_inverted_index":{"The":[0,63,111,136],"Technical":[1],"Committee":[2],"10":[3],"(TC-10)":[4],"of":[5,22,29,37,51,82,109,141,147],"the":[6,20,27,94,99,134,142,148,159],"IEEE":[7],"Instrumentation":[8],"and":[9,60,125],"Measurement":[10],"Society":[11],"initiated":[12],"a":[13,35,46,90,151],"new":[14],"standards":[15],"activity":[16],"in":[17,114,133,158],"2006":[18],"for":[19,49],"development":[21],"test":[23,47,55,153],"methods":[24,56],"to":[25,77,102,138],"characterize":[26],"performance":[28,38,43,129],"circuit":[30],"probes.":[31,62],"This":[32],"standard":[33,116],"contains":[34],"set":[36],"parameters":[39,130],"that":[40,70],"describe":[41],"probe":[42,95,100,149],"along":[44],"with":[45,79,104],"method":[48],"each":[50],"these":[52],"parameters.":[53],"All":[54],"consider":[57],"both":[58],"single-ended":[59],"differential":[61],"probes":[64,112],"may":[65],"be":[66],"either":[67],"stand":[68],"alone,":[69],"is,":[71],"they":[72],"are":[73,117,131],"not":[74],"necessarily":[75],"constrained":[76],"operate":[78],"one":[80,105],"model":[81],"waveform":[83],"recorder":[84],"(such":[85],"as":[86],"an":[87],"oscilloscope),":[88],"or":[89,106],"probe-scope":[91],"system,":[92],"where":[93],"is":[96,150,156],"designed":[97],"by":[98],"manufacturer":[101],"work":[103],"more":[107],"models":[108],"oscilloscopes.":[110],"considered":[113,132],"this":[115],"all":[118],"active":[119],"high-input":[120],"impedance":[121],"devices.":[122],"Both":[123],"static":[124],"dynamic":[126,143],"signal":[127,144],"measuring":[128],"P1696.":[135],"key":[137],"accurate":[139],"measurements":[140],"measurement":[145],"properties":[146],"quality":[152],"fixture,":[154],"which":[155],"described":[157],"standard.":[160]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}