{"id":"https://openalex.org/W2056405702","doi":"https://doi.org/10.1109/i2mtc.2013.6555636","title":"A reluctance-Hall Effect based linear digital angle sensor","display_name":"A reluctance-Hall Effect based linear digital angle sensor","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W2056405702","doi":"https://doi.org/10.1109/i2mtc.2013.6555636","mag":"2056405702"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2013.6555636","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555636","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041679557","display_name":"C. S. Anoop","orcid":"https://orcid.org/0000-0003-4819-7386"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"C. S. Anoop","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India","[Dept. of Electr. Eng., Indian Inst. of Technol. Madras, Chennai, India]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Indian Inst. of Technol. Madras, Chennai, India]","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086437761","display_name":"Boby George","orcid":"https://orcid.org/0000-0001-9923-6328"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Boby George","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India","[Dept. of Electr. Eng., Indian Inst. of Technol. Madras, Chennai, India]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Indian Inst. of Technol. Madras, Chennai, India]","institution_ids":["https://openalex.org/I24676775"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5041679557"],"corresponding_institution_ids":["https://openalex.org/I24676775"],"apc_list":null,"apc_paid":null,"fwci":0.4729,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.69479623,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"91","issue":null,"first_page":"1362","last_page":"1366"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/signal-conditioning","display_name":"Signal conditioning","score":0.7799290418624878},{"id":"https://openalex.org/keywords/magnetic-reluctance","display_name":"Magnetic reluctance","score":0.77289879322052},{"id":"https://openalex.org/keywords/hall-effect-sensor","display_name":"Hall effect sensor","score":0.7532752752304077},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5326551795005798},{"id":"https://openalex.org/keywords/air-gap","display_name":"Air gap (plumbing)","score":0.47555917501449585},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.4703139364719391},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.45178043842315674},{"id":"https://openalex.org/keywords/magnetic-flux","display_name":"Magnetic flux","score":0.4343101680278778},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4084339141845703},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34931638836860657},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3321426510810852},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3205721974372864},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30308079719543457},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.19419240951538086},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.11692854762077332}],"concepts":[{"id":"https://openalex.org/C2780412824","wikidata":"https://www.wikidata.org/wiki/Q3686420","display_name":"Signal conditioning","level":3,"score":0.7799290418624878},{"id":"https://openalex.org/C197993065","wikidata":"https://www.wikidata.org/wiki/Q863390","display_name":"Magnetic reluctance","level":3,"score":0.77289879322052},{"id":"https://openalex.org/C107637996","wikidata":"https://www.wikidata.org/wiki/Q1431247","display_name":"Hall effect sensor","level":3,"score":0.7532752752304077},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5326551795005798},{"id":"https://openalex.org/C50587689","wikidata":"https://www.wikidata.org/wiki/Q4698328","display_name":"Air gap (plumbing)","level":2,"score":0.47555917501449585},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.4703139364719391},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.45178043842315674},{"id":"https://openalex.org/C157479481","wikidata":"https://www.wikidata.org/wiki/Q177831","display_name":"Magnetic flux","level":3,"score":0.4343101680278778},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4084339141845703},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34931638836860657},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3321426510810852},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3205721974372864},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30308079719543457},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.19419240951538086},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.11692854762077332},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2013.6555636","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555636","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W367666663","https://openalex.org/W1531830406","https://openalex.org/W1657539175","https://openalex.org/W1980472540","https://openalex.org/W1980983554","https://openalex.org/W2012429047","https://openalex.org/W2083784038","https://openalex.org/W2123098055","https://openalex.org/W2127131052","https://openalex.org/W2139356817","https://openalex.org/W2153237051","https://openalex.org/W6678091755"],"related_works":["https://openalex.org/W3152958642","https://openalex.org/W4367341664","https://openalex.org/W1721787598","https://openalex.org/W1678708368","https://openalex.org/W4205255278","https://openalex.org/W2937398906","https://openalex.org/W2058075549","https://openalex.org/W2951971168","https://openalex.org/W2375142553","https://openalex.org/W3217033379"],"abstract_inverted_index":{"A":[0,104,121],"new":[1,105],"angle":[2,31,101,123],"sensor":[3,22,35,64,118,124,154],"based":[4],"on":[5],"a":[6,9,24,46,94,111],"combination":[7],"of":[8,37,99,135,165],"reluctance":[10],"technique":[11],"and":[12,45,125,132,145,159],"Hall-Effect":[13,63,90],"principle":[14],"is":[15,119,155,168],"presented":[16],"in":[17,43,56,72],"this":[18],"paper.":[19],"The":[20,34,152],"proposed":[21,117,153],"provides":[23,110],"linear,":[25],"digital":[26,113],"output":[27,114],"proportional":[28],"to":[29,172],"the":[30,51,59,73,77,83,100,116,136,166,174],"being":[32,102],"sensed.":[33,103],"consists":[36],"two":[38],"identical":[39],"ring":[40],"shaped":[41],"sheets,":[42],"parallel,":[44],"permanent":[47],"magnet,":[48],"placed":[49],"between":[50,76],"rings.":[52,78],"This":[53],"unit":[54,128,138],"rotates":[55],"unison":[57],"with":[58],"target.":[60],"Two":[61],"fixed":[62,89],"ICs,":[65],"which":[66],"are":[67,70],"180\u00b0":[68],"apart,":[69],"kept":[71],"air":[74],"gap":[75],"An":[79],"analysis":[80],"shows":[81],"that":[82,109],"flux":[84],"density":[85],"seen":[86],"by":[87],"these":[88],"ICs":[91],"vary":[92],"as":[93],"third":[95],"order":[96],"polynomial":[97],"function":[98],"signal":[106,126],"conditioning":[107,127],"method":[108],"linear":[112,140],"from":[115],"presented.":[120],"prototype":[122,137],"have":[129],"been":[130],"built":[131],"tested.":[133],"Output":[134],"was":[139,148],"across":[141],"0":[142],"-":[143],"110\u00b0":[144],"worst-case":[146],"error":[147],"less":[149],"than":[150],"1.2%.":[151],"suitable":[156],"for":[157],"automotive":[158],"industrial":[160],"applications,":[161],"especially":[162],"where":[163],"center":[164],"target":[167],"not":[169],"easily":[170],"accessible":[171],"employ":[173],"conventional":[175],"magnetic":[176],"sensors":[177],"directly.":[178]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}