{"id":"https://openalex.org/W1998079993","doi":"https://doi.org/10.1109/i2mtc.2013.6555481","title":"To develop an optical system model for image based multi-degree-of-freedom measurement system","display_name":"To develop an optical system model for image based multi-degree-of-freedom measurement system","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W1998079993","doi":"https://doi.org/10.1109/i2mtc.2013.6555481","mag":"1998079993"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2013.6555481","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555481","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021261100","display_name":"Chun\u2010Jen Chen","orcid":"https://orcid.org/0000-0002-9211-8641"},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Applied Research Laboratories","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"funder","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chun-Jen Chen","raw_affiliation_strings":["Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","Nat. Appl. Res. Labs., Instrum. Technol. Res. Center, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]},{"raw_affiliation_string":"Nat. Appl. Res. Labs., Instrum. Technol. Res. Center, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110241878","display_name":"Chun\u2010Li Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Applied Research Laboratories","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"funder","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Li Chang","raw_affiliation_strings":["Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","Nat. Appl. Res. Labs., Instrum. Technol. Res. Center, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]},{"raw_affiliation_string":"Nat. Appl. Res. Labs., Instrum. Technol. Res. Center, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070078981","display_name":"Wen-Tse Hsiao","orcid":"https://orcid.org/0000-0003-4085-7351"},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Applied Research Laboratories","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"funder","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wen-Tse Hsiao","raw_affiliation_strings":["Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","Nat. Appl. Res. Labs., Instrum. Technol. Res. Center, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]},{"raw_affiliation_string":"Nat. Appl. Res. Labs., Instrum. Technol. Res. Center, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054806740","display_name":"Min-Wei Hung","orcid":"https://orcid.org/0000-0001-7525-2921"},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Applied Research Laboratories","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"funder","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Min-Wei Hung","raw_affiliation_strings":["Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","Nat. Appl. Res. Labs., Instrum. Technol. Res. Center, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]},{"raw_affiliation_string":"Nat. Appl. Res. Labs., Instrum. Technol. Res. Center, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073128871","display_name":"Wen\u2010Yuh Jywe","orcid":"https://orcid.org/0009-0009-0661-4429"},"institutions":[{"id":"https://openalex.org/I40689657","display_name":"National Formosa University","ror":"https://ror.org/00q523p52","country_code":"TW","type":"education","lineage":["https://openalex.org/I40689657"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wenyuh Jywe","raw_affiliation_strings":["Department of automation engineering, National Formosa University, Huwei, Taiwan","Dept. of Autom. Eng., Nat. Formosa Univ. Huwei, Huwei, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of automation engineering, National Formosa University, Huwei, Taiwan","institution_ids":["https://openalex.org/I40689657"]},{"raw_affiliation_string":"Dept. of Autom. Eng., Nat. Formosa Univ. Huwei, Huwei, Taiwan","institution_ids":["https://openalex.org/I40689657"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111632789","display_name":"Yun-Feng Teng","orcid":null},"institutions":[{"id":"https://openalex.org/I40689657","display_name":"National Formosa University","ror":"https://ror.org/00q523p52","country_code":"TW","type":"education","lineage":["https://openalex.org/I40689657"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yunfeng Teng","raw_affiliation_strings":["Department of automation engineering, National Formosa University, Huwei, Taiwan","Dept. of Autom. Eng., Nat. Formosa Univ. Huwei, Huwei, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of automation engineering, National Formosa University, Huwei, Taiwan","institution_ids":["https://openalex.org/I40689657"]},{"raw_affiliation_string":"Dept. of Autom. Eng., Nat. Formosa Univ. Huwei, Huwei, Taiwan","institution_ids":["https://openalex.org/I40689657"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5021261100"],"corresponding_institution_ids":["https://openalex.org/I4210166867"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11326554,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"572","last_page":"575"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.6335187554359436},{"id":"https://openalex.org/keywords/position","display_name":"Position (finance)","score":0.5940067768096924},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5672355890274048},{"id":"https://openalex.org/keywords/laser-diode","display_name":"Laser diode","score":0.5427274107933044},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.5180020928382874},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.44016680121421814},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.4345172941684723},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.41460371017456055},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.40620625019073486},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19054007530212402},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13361510634422302}],"concepts":[{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.6335187554359436},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.5940067768096924},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5672355890274048},{"id":"https://openalex.org/C2777048131","wikidata":"https://www.wikidata.org/wiki/Q321098","display_name":"Laser diode","level":3,"score":0.5427274107933044},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5180020928382874},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.44016680121421814},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.4345172941684723},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.41460371017456055},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.40620625019073486},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19054007530212402},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13361510634422302},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2013.6555481","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555481","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.800000011920929}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1964539604","https://openalex.org/W1965752623","https://openalex.org/W1968608901","https://openalex.org/W1974705734","https://openalex.org/W1983232193","https://openalex.org/W1983549331","https://openalex.org/W2027951822","https://openalex.org/W2029662407","https://openalex.org/W2033988356","https://openalex.org/W2036536765","https://openalex.org/W2052345191","https://openalex.org/W2058014931","https://openalex.org/W2071573125","https://openalex.org/W2086151654","https://openalex.org/W2086247981","https://openalex.org/W2324389506"],"related_works":["https://openalex.org/W2366906938","https://openalex.org/W2349391998","https://openalex.org/W4205655149","https://openalex.org/W2000775715","https://openalex.org/W2795393339","https://openalex.org/W2626393719","https://openalex.org/W4390618967","https://openalex.org/W2074467390","https://openalex.org/W2174745845","https://openalex.org/W2063058012"],"abstract_inverted_index":{"This":[0],"paper":[1],"subjects":[2],"an":[3],"optoelectronic":[4],"multi-degree-of-freedom":[5],"(DOF)":[6],"measurement":[7,33,51,56,76,96],"system":[8,13,34,57,77,97],"to":[9],"establish":[10],"the":[11,16,19,27,46,73,91],"optical":[12,17],"model.":[14],"Through":[15],"model,":[18],"multi-DOF":[20,32,50,55,75,95],"motion":[21],"can":[22,85,98],"be":[23,99],"carried":[24],"out":[25],"by":[26],"laser":[28,42,88],"spot":[29,89],"variation.":[30],"The":[31,53],"includes":[35],"2":[36],"digital":[37],"image":[38,83],"sensors":[39],"and":[40,65],"4":[41],"diodes.":[43],"It":[44],"improves":[45],"disadvantage":[47],"of":[48,93],"conventional":[49,54,74],"system.":[52],"usually":[58],"needs":[59,78],"many":[60],"position":[61],"sensing":[62],"detectors":[63],"(PSD)":[64],"each":[66],"PSD":[67],"must":[68],"have":[69],"enough":[70],"space.":[71,80],"Therefore,":[72],"large":[79],"Because":[81],"one":[82],"sensor":[84],"sense":[86],"multi":[87],"simultaneously,":[90],"structure":[92],"proposed":[94],"simplified.":[100]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}