{"id":"https://openalex.org/W1989057771","doi":"https://doi.org/10.1109/i2mtc.2013.6555452","title":"Electronic circuit fault diagnosis methods based on improved Support Vector Machines","display_name":"Electronic circuit fault diagnosis methods based on improved Support Vector Machines","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W1989057771","doi":"https://doi.org/10.1109/i2mtc.2013.6555452","mag":"1989057771"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2013.6555452","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555452","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Yang Zhiming","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yang Zhiming","raw_affiliation_strings":["Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, Heilongjiang, China","Dept. of Autom. Test & Control, Harbin Inst. of Technol., Harbin, China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Dept. of Autom. Test & Control, Harbin Inst. of Technol., Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068021161","display_name":"Yang Yu","orcid":"https://orcid.org/0000-0003-4669-934X"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Yu","raw_affiliation_strings":["Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, Heilongjiang, China","Dept. of Autom. Test & Control, Harbin Inst. of Technol., Harbin, China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Dept. of Autom. Test & Control, Harbin Inst. of Technol., Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100720490","display_name":"Gang Wang","orcid":"https://orcid.org/0000-0002-0641-8593"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]},{"id":"https://openalex.org/I4210161462","display_name":"Heilongjiang Institute of Technology","ror":"https://ror.org/05x0m9n95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210161462"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gang Wang","raw_affiliation_strings":["Department of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, Heilongjiang, China","Dept. of Electron. & Inf. Eng., Harbin Inst. of Technol., Harbin, , China"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I4210161462","https://openalex.org/I204983213"]},{"raw_affiliation_string":"Dept. of Electron. & Inf. Eng., Harbin Inst. of Technol., Harbin, , China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.06469306,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"422","last_page":"426"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9876999855041504,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7715309858322144},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.6931868195533752},{"id":"https://openalex.org/keywords/feature-vector","display_name":"Feature vector","score":0.6592166423797607},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6507434248924255},{"id":"https://openalex.org/keywords/empirical-research","display_name":"Empirical research","score":0.5447067618370056},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.531918466091156},{"id":"https://openalex.org/keywords/linear-discriminant-analysis","display_name":"Linear discriminant analysis","score":0.5231660008430481},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5228046178817749},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5029293894767761},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.48324450850486755},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4563562870025635},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4292793571949005},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.4214569628238678},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13809847831726074},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10329627990722656}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7715309858322144},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.6931868195533752},{"id":"https://openalex.org/C83665646","wikidata":"https://www.wikidata.org/wiki/Q42139305","display_name":"Feature vector","level":2,"score":0.6592166423797607},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6507434248924255},{"id":"https://openalex.org/C120936955","wikidata":"https://www.wikidata.org/wiki/Q2155640","display_name":"Empirical research","level":2,"score":0.5447067618370056},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.531918466091156},{"id":"https://openalex.org/C69738355","wikidata":"https://www.wikidata.org/wiki/Q1228929","display_name":"Linear discriminant analysis","level":2,"score":0.5231660008430481},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5228046178817749},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5029293894767761},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.48324450850486755},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4563562870025635},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4292793571949005},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.4214569628238678},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13809847831726074},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10329627990722656},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2013.6555452","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555452","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities","score":0.6299999952316284}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W85350352","https://openalex.org/W122356390","https://openalex.org/W1541542649","https://openalex.org/W1964604696","https://openalex.org/W2099435377","https://openalex.org/W2108697353","https://openalex.org/W2133604244","https://openalex.org/W2140389641","https://openalex.org/W2148143831","https://openalex.org/W2152446064","https://openalex.org/W3152456456","https://openalex.org/W4230674625","https://openalex.org/W6603460400"],"related_works":["https://openalex.org/W2250488071","https://openalex.org/W2356150353","https://openalex.org/W2090763504","https://openalex.org/W2380744779","https://openalex.org/W1999647744","https://openalex.org/W2967867994","https://openalex.org/W2018643641","https://openalex.org/W2469878540","https://openalex.org/W2009284386","https://openalex.org/W2353313924"],"abstract_inverted_index":{"In":[0,63],"nowadays,":[1],"fault":[2,22,36,86,92,108],"diagnosis":[3,93,109,118],"method":[4,56,115],"for":[5],"analog":[6],"circuit":[7,107],"based":[8,57],"on":[9,58,104],"support":[10],"vector":[11],"machines,":[12],"has":[13,39],"become":[14],"a":[15],"hot":[16],"topic":[17],"in":[18,25,35,72],"research":[19],"field":[20],"of":[21,28,85],"diagnosis.":[23],"However,":[24],"practical":[26],"application":[27],"this":[29,46,48],"method,":[30,66],"the":[31,64,90,117],"imbalanced":[32],"problem":[33],"occurred":[34],"sample":[37],"dataset":[38],"greatly":[40],"influenced":[41],"its":[42],"effectiveness.":[43],"To":[44],"remedy":[45],"problem,":[47,110],"paper":[49],"proposed":[50],"an":[51],"improved":[52],"Support":[53],"Vector":[54],"Machines":[55],"biased":[59,67],"empirical":[60,73,102],"feature":[61,74],"mapping.":[62],"new":[65],"discriminant":[68],"analysis":[69,100],"was":[70],"applied":[71],"space,":[75],"to":[76],"make":[77],"all":[78],"normal":[79],"samples":[80],"far":[81],"away":[82],"from":[83],"center":[84],"samples,":[87],"so":[88],"that":[89,113],"overall":[91],"ability":[94],"can":[95],"be":[96],"improved.":[97],"Through":[98],"theoretical":[99],"and":[101],"study":[103],"actual":[105],"electronic":[106],"we":[111],"show":[112],"our":[114],"augments":[116],"accuracy":[119],"rate":[120],"effectively.":[121]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-04-16T08:26:57.006410","created_date":"2025-10-10T00:00:00"}