{"id":"https://openalex.org/W2093223085","doi":"https://doi.org/10.1109/i2mtc.2013.6555440","title":"Automated wire fault location using impedance spectroscopy and Differential Evolution","display_name":"Automated wire fault location using impedance spectroscopy and Differential Evolution","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W2093223085","doi":"https://doi.org/10.1109/i2mtc.2013.6555440","mag":"2093223085"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2013.6555440","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555440","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048877945","display_name":"Qinghai Shi","orcid":"https://orcid.org/0000-0002-5608-2477"},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Qinghai Shi","raw_affiliation_strings":["Chair for Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany","Dept. of Meas. & Sensor Technol., Chemnitz Univ. of Technol., Chemnitz, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]},{"raw_affiliation_string":"Dept. of Meas. & Sensor Technol., Chemnitz Univ. of Technol., Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068676566","display_name":"Olfa Kanoun","orcid":"https://orcid.org/0000-0002-7166-1266"},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Olfa Kanoun","raw_affiliation_strings":["Chair for Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany","Dept. of Meas. & Sensor Technol., Chemnitz Univ. of Technol., Chemnitz, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]},{"raw_affiliation_string":"Dept. of Meas. & Sensor Technol., Chemnitz Univ. of Technol., Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5048877945"],"corresponding_institution_ids":["https://openalex.org/I2610724"],"apc_list":null,"apc_paid":null,"fwci":0.9458,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.79199288,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9724000096321106,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.631550133228302},{"id":"https://openalex.org/keywords/dielectric-spectroscopy","display_name":"Dielectric spectroscopy","score":0.5623342394828796},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5364131927490234},{"id":"https://openalex.org/keywords/spectroscopy","display_name":"Spectroscopy","score":0.5243504047393799},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5130597352981567},{"id":"https://openalex.org/keywords/differential","display_name":"Differential (mechanical device)","score":0.4762340188026428},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33268845081329346},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3261232376098633},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.32124102115631104},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3044252395629883},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.268202006816864},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.2449806034564972},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21856221556663513},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.09250512719154358},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.08738827705383301}],"concepts":[{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.631550133228302},{"id":"https://openalex.org/C7040849","wikidata":"https://www.wikidata.org/wiki/Q899580","display_name":"Dielectric spectroscopy","level":4,"score":0.5623342394828796},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5364131927490234},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.5243504047393799},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5130597352981567},{"id":"https://openalex.org/C93226319","wikidata":"https://www.wikidata.org/wiki/Q193137","display_name":"Differential (mechanical device)","level":2,"score":0.4762340188026428},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33268845081329346},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3261232376098633},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.32124102115631104},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3044252395629883},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.268202006816864},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.2449806034564972},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21856221556663513},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.09250512719154358},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.08738827705383301},{"id":"https://openalex.org/C52859227","wikidata":"https://www.wikidata.org/wiki/Q7877","display_name":"Electrochemistry","level":3,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2013.6555440","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555440","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1879678483","https://openalex.org/W1970338740","https://openalex.org/W2033733558","https://openalex.org/W2104073917","https://openalex.org/W2134356156","https://openalex.org/W2138613835","https://openalex.org/W2165108010","https://openalex.org/W2168917574","https://openalex.org/W4241999737"],"related_works":["https://openalex.org/W2568003367","https://openalex.org/W2943903417","https://openalex.org/W1986519446","https://openalex.org/W2215888160","https://openalex.org/W2111501207","https://openalex.org/W2519761136","https://openalex.org/W2092821563","https://openalex.org/W2068623945","https://openalex.org/W4243773385","https://openalex.org/W2050511751"],"abstract_inverted_index":{"A":[0],"new":[1],"technique":[2,140],"is":[3,26,68,128,151,193],"proposed":[4,215],"to":[5,72,153,207],"detect":[6],"and":[7,15,76,117,133,136,145,165,168,173,180,209],"locate":[8],"wire":[9,178,185],"fault":[10,179,186],"using":[11,51,104],"impedance":[12,98,105,176],"spectroscopy":[13,106],"(IS)":[14],"a":[16,142],"model-based":[17],"global":[18],"optimization":[19,139],"technique.":[20],"The":[21,83,158,190],"propagation":[22,121],"along":[23],"the":[24,44,65,73,79,91,95,100,138,155,175,182,200,211],"cables":[25],"analytical":[27],"modeled":[28],"with":[29],"flexible":[30],"multi":[31],"section":[32],"cascading":[33],"features":[34],"by":[35],"frequency":[36,118],"dependent":[37,119],"ABCD":[38],"parameters.":[39],"Therefore,":[40,126],"it":[41],"doesn't":[42],"have":[43],"common":[45],"numerical":[46],"method":[47,54,160,192],"problems":[48],"for":[49,195],"instance":[50],"finite":[52,57],"element":[53],"(FEM)":[55],"or":[56,70],"difference":[58],"in":[59,63,199],"time":[60,67],"domain":[61],"(FDTD),":[62],"which":[64],"simulation":[66,132],"linear":[69],"proportional":[71],"wiring":[74],"length":[75],"complexity":[77],"of":[78,99,177,184,197,202,213],"transmission":[80,84,101],"line":[81,85,102],"systems.":[82],"model":[86],"has":[87,141],"been":[88],"setting":[89],"as":[90,94,113],"same":[92,109],"spectrum":[93],"measured":[96],"input":[97],"system":[103],"so":[107],"that":[108],"practical":[110],"effects":[111],"such":[112],"signal":[114,120],"loss,":[115],"dispersion":[116],"can":[122,187],"be":[123,188],"exactly":[124],"incorporated.":[125],"there":[127],"good":[129],"matching":[130],"between":[131],"measurement":[134],"data":[135],"consequently":[137,181],"fast":[143],"convergence":[144],"best":[146],"accuracy.":[147],"Differential":[148],"Evolution":[149],"(DE)":[150],"used":[152],"solve":[154],"inverse":[156],"problem.":[157],"novel":[159],"allows":[161],"locating":[162],"hard":[163],"(short":[164],"open":[166],"circuit)":[167],"soft":[169],"(frays,":[170],"junctions)":[171],"faults":[172],"measuring":[174],"types":[183],"distinguished.":[189],"developed":[191],"also":[194],"characterization":[196],"defects":[198],"branches":[201],"network.":[203],"Results":[204],"are":[205],"presented":[206],"validate":[208],"illustrate":[210],"performance":[212],"this":[214],"method.":[216]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}