{"id":"https://openalex.org/W2422685390","doi":"https://doi.org/10.1109/hst.2016.7495581","title":"A zero-cost approach to detect recycled SoC chips using embedded SRAM","display_name":"A zero-cost approach to detect recycled SoC chips using embedded SRAM","publication_year":2016,"publication_date":"2016-05-01","ids":{"openalex":"https://openalex.org/W2422685390","doi":"https://doi.org/10.1109/hst.2016.7495581","mag":"2422685390"},"language":"en","primary_location":{"id":"doi:10.1109/hst.2016.7495581","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hst.2016.7495581","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100747200","display_name":"Zimu Guo","orcid":"https://orcid.org/0000-0002-3630-743X"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zimu Guo","raw_affiliation_strings":["ECE Department, University of Florida"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of Florida","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091695146","display_name":"Md Tauhidur Rahman","orcid":"https://orcid.org/0000-0002-0010-6388"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Md. Tauhidur Rahman","raw_affiliation_strings":["ECE Department, University of Florida"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of Florida","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073054890","display_name":"Mark Tehranipoor","orcid":"https://orcid.org/0000-0003-4699-3231"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mark M. Tehranipoor","raw_affiliation_strings":["ECE Department, University of Florida"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of Florida","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009243659","display_name":"Domenic Forte","orcid":"https://orcid.org/0000-0002-2794-7320"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Domenic Forte","raw_affiliation_strings":["ECE Department, University of Florida"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of Florida","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.4864,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.94795268,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"191","last_page":"196"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8968637585639954},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6643840074539185},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6220560669898987},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6005223989486694},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5372002124786377},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.502643346786499},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.49657541513442993},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.49242103099823},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4916751980781555},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.44669198989868164},{"id":"https://openalex.org/keywords/supply-chain","display_name":"Supply chain","score":0.4178480803966522},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.27502763271331787},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26019003987312317},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23401445150375366},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1141417920589447},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.10192939639091492}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8968637585639954},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6643840074539185},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6220560669898987},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6005223989486694},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5372002124786377},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.502643346786499},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.49657541513442993},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.49242103099823},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4916751980781555},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.44669198989868164},{"id":"https://openalex.org/C108713360","wikidata":"https://www.wikidata.org/wiki/Q1824206","display_name":"Supply chain","level":2,"score":0.4178480803966522},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.27502763271331787},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26019003987312317},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23401445150375366},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1141417920589447},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.10192939639091492},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C162853370","wikidata":"https://www.wikidata.org/wiki/Q39809","display_name":"Marketing","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/hst.2016.7495581","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hst.2016.7495581","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320333591","display_name":"Multidisciplinary University Research Initiative","ror":null},{"id":"https://openalex.org/F4320338279","display_name":"Air Force Office of Scientific Research","ror":"https://ror.org/011e9bt93"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1977403917","https://openalex.org/W2002734120","https://openalex.org/W2007280892","https://openalex.org/W2040298438","https://openalex.org/W2052421316","https://openalex.org/W2076453580","https://openalex.org/W2077447828","https://openalex.org/W2082142229","https://openalex.org/W2093439000","https://openalex.org/W2112787602","https://openalex.org/W2113322447","https://openalex.org/W2118754194","https://openalex.org/W2128111793","https://openalex.org/W2168642835","https://openalex.org/W2300806133","https://openalex.org/W2307493678","https://openalex.org/W2327678638","https://openalex.org/W4243195860","https://openalex.org/W6651951826","https://openalex.org/W6698041426"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W2109451123","https://openalex.org/W4378977321","https://openalex.org/W1976168335","https://openalex.org/W3211992815","https://openalex.org/W179354024"],"abstract_inverted_index":{"Considering":[0],"the":[1,5,38,60,76,98,122,126,135,154,179],"rapid":[2],"growth":[3],"of":[4,11,64,85,157,171],"global":[6],"consumer":[7],"electronics":[8],"market,":[9],"counterfeiting":[10],"integrated":[12],"circuits":[13],"(ICs),":[14],"and":[15,35,48,52,62,168,191,197,200],"in":[16,24,128,134],"particular":[17],"recycling,":[18],"has":[19],"become":[20],"a":[21,54,104,110,150],"serious":[22,57],"issue":[23],"recent":[25],"years.":[26],"Recycled":[27],"ICs":[28,44],"are":[29,114,195],"those":[30],"harvested":[31],"from":[32,166],"old":[33],"systems":[34,66],"re-inserted":[36],"into":[37],"supply":[39,203],"chain":[40],"as":[41,53],"new.":[42],"Such":[43],"exhibit":[45],"lower":[46],"performance":[47],"shorter":[49],"life":[50],"time,":[51],"result,":[55],"pose":[56],"threats":[58],"to":[59,96,132,140,144,152,161],"security":[61],"reliability":[63],"electronic":[65],"used":[67,95],"for":[68],"critical":[69],"applications.":[70],"In":[71,88],"this":[72],"paper,":[73],"we":[74],"propose":[75],"first":[77],"recycled":[78],"IC":[79,123],"detection":[80,180],"technique":[81],"based":[82],"on":[83],"aging":[84,127],"embedded":[86],"SRAMs.":[87],"our":[89],"approach,":[90],"an":[91],"enrollment":[92],"phase":[93],"is":[94,124,182],"identify":[97],"SRAM":[99,129,170],"cells":[100,130],"that":[101,178],"initially":[102],"provide":[103],"stable":[105],"output":[106],"upon":[107],"startup":[108],"(like":[109],"PUF":[111],"ID),":[112],"but":[113],"highly":[115],"unstable":[116],"with":[117,184],"aging.":[118],"During":[119],"verification,":[120],"if":[121],"recycled,":[125],"due":[131],"usage":[133],"field":[136],"causes":[137],"its":[138],"ID":[139],"change,":[141],"allowing":[142],"it":[143],"be":[145],"detected.":[146],"We":[147],"also":[148],"develop":[149],"framework":[151],"determine":[153],"parameters":[155],"(length":[156],"ID,":[158],"thresholds,":[159],"etc.)":[160],"achieve":[162],"high":[163,183],"confidence.":[164],"Results":[165],"new":[167],"aged":[169],"Xillinx":[172],"Spartan-3":[173],"FPGA":[174],"development":[175],"boards":[176],"show":[177],"accuracy":[181],"proper":[185],"parameter":[186],"selected":[187],"(false":[188],"accept":[189],"rate":[190,194],"false":[192],"reject":[193],"0":[196],"0.03":[198],"respectively)":[199],"robust":[201],"against":[202],"voltage":[204],"variations.":[205]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":5},{"year":2016,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}