{"id":"https://openalex.org/W2046467839","doi":"https://doi.org/10.1109/hst.2014.6855586","title":"Countering the effects of silicon aging on SRAM PUFs","display_name":"Countering the effects of silicon aging on SRAM PUFs","publication_year":2014,"publication_date":"2014-05-01","ids":{"openalex":"https://openalex.org/W2046467839","doi":"https://doi.org/10.1109/hst.2014.6855586","mag":"2046467839"},"language":"en","primary_location":{"id":"doi:10.1109/hst.2014.6855586","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hst.2014.6855586","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090494585","display_name":"Roel Maes","orcid":"https://orcid.org/0000-0001-6240-8608"},"institutions":[{"id":"https://openalex.org/I4210105824","display_name":"Intrinsic LifeSciences (United States)","ror":"https://ror.org/01maah330","country_code":"US","type":"company","lineage":["https://openalex.org/I4210105824"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Roel Maes","raw_affiliation_strings":["Intrinsic-ID, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Intrinsic-ID, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210105824"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023038018","display_name":"Vincent van der Leest","orcid":null},"institutions":[{"id":"https://openalex.org/I4210105824","display_name":"Intrinsic LifeSciences (United States)","ror":"https://ror.org/01maah330","country_code":"US","type":"company","lineage":["https://openalex.org/I4210105824"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vincent van der Leest","raw_affiliation_strings":["Intrinsic-ID, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Intrinsic-ID, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210105824"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5090494585"],"corresponding_institution_ids":["https://openalex.org/I4210105824"],"apc_list":null,"apc_paid":null,"fwci":7.3555,"has_fulltext":false,"cited_by_count":77,"citation_normalized_percentile":{"value":0.9748093,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"148","last_page":"153"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9440044164657593},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6969679594039917},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5583232045173645},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.509584903717041},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5042155981063843},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.49877095222473145},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4700295627117157},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4486350417137146},{"id":"https://openalex.org/keywords/accelerated-aging","display_name":"Accelerated aging","score":0.4366527795791626},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.30214470624923706},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2631379961967468},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.10895895957946777}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9440044164657593},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6969679594039917},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5583232045173645},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.509584903717041},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5042155981063843},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.49877095222473145},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4700295627117157},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4486350417137146},{"id":"https://openalex.org/C118820876","wikidata":"https://www.wikidata.org/wiki/Q4672283","display_name":"Accelerated aging","level":2,"score":0.4366527795791626},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.30214470624923706},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2631379961967468},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.10895895957946777},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/hst.2014.6855586","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hst.2014.6855586","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.41999998688697815}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W59294937","https://openalex.org/W2017174041","https://openalex.org/W2034547981","https://openalex.org/W2053877171","https://openalex.org/W2130351941","https://openalex.org/W2174648984","https://openalex.org/W4241721083","https://openalex.org/W6602440995","https://openalex.org/W6679357471"],"related_works":["https://openalex.org/W1909296377","https://openalex.org/W2089002058","https://openalex.org/W3185029353","https://openalex.org/W2969498307","https://openalex.org/W3116379964","https://openalex.org/W2793465010","https://openalex.org/W2915176329","https://openalex.org/W2208608937","https://openalex.org/W2120018824","https://openalex.org/W2766443086"],"abstract_inverted_index":{"Silicon":[0],"aging,":[1],"in":[2,47],"particular":[3],"NBTI,":[4],"causes":[5],"many":[6,87],"PUFs":[7,32],"to":[8,109,140],"exhibit":[9],"a":[10,66,77,90,117,132],"natural":[11,95],"tendency":[12],"of":[13,30,39,57,68],"growing":[14],"less":[15],"reliable":[16,112],"over":[17,113],"time.":[18,114],"This":[19,115],"is":[20,34,84,116],"inconvenient":[21],"or":[22],"even":[23,99],"unacceptable":[24],"for":[25],"in-the-field":[26],"applications.":[27],"In":[28,50,71],"case":[29],"SRAM":[31,62,80,107,123],"it":[33,83],"observed":[35,85],"that":[36,86],"the":[37,44,48,55,106,141],"impact":[38],"NBTI":[40],"aging":[41,60,74],"depends":[42],"on":[43,61,76],"data":[45],"stored":[46],"SRAM.":[49],"this":[51],"work,":[52],"we":[53],"investigate":[54],"effects":[56],"data-dependent":[58,129],"silicon":[59],"PUF":[63,81,108,142],"reliability":[64,92],"under":[65],"number":[67],"realistic":[69],"scenarios.":[70],"an":[72,122],"accelerated":[73],"experiment":[75],"65nm":[78],"CMOS":[79],"implementation":[82],"scenarios":[88,98],"cause":[89,105],"smaller":[91],"reduction":[93],"than":[94],"aging.":[96],"Some":[97],"show":[100],"anti-aging":[101],"effects,":[102],"i.e.":[103],"they":[104],"grow":[110],"more":[111,126],"significant":[118],"improvement":[119],"when":[120],"using":[121],"PUF.":[124],"Even":[125],"so":[127],"because":[128],"(anti-)aging":[130],"has":[131],"particularly":[133],"low":[134],"overhead,":[135],"requiring":[136],"neither":[137],"any":[138,145],"changes":[139],"circuit":[143],"nor":[144],"pre-deployment":[146],"effort.":[147]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":8},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":9},{"year":2017,"cited_by_count":12},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":1}],"updated_date":"2026-02-25T23:00:34.991745","created_date":"2025-10-10T00:00:00"}