{"id":"https://openalex.org/W2017827600","doi":"https://doi.org/10.1109/hst.2013.6581562","title":"Adapting voltage ramp-up time for temperature noise reduction on memory-based PUFs","display_name":"Adapting voltage ramp-up time for temperature noise reduction on memory-based PUFs","publication_year":2013,"publication_date":"2013-06-01","ids":{"openalex":"https://openalex.org/W2017827600","doi":"https://doi.org/10.1109/hst.2013.6581562","mag":"2017827600"},"language":"en","primary_location":{"id":"doi:10.1109/hst.2013.6581562","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hst.2013.6581562","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://zenodo.org/record/3431260","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006007359","display_name":"Mafalda Cortez","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Mafalda Cortez","raw_affiliation_strings":["Faculty of EE, Mathematics and CS, Delft University of Technology, Delft, Netherlands","Fac. of EE, Math. & CS, Delft Univ. of Technol., Delft, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of EE, Mathematics and CS, Delft University of Technology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Fac. of EE, Math. & CS, Delft Univ. of Technol., Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005739146","display_name":"Said Hamdioui","orcid":"https://orcid.org/0000-0002-8961-0387"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Said Hamdioui","raw_affiliation_strings":["Faculty of EE, Mathematics and CS, Delft University of Technology, Delft, Netherlands","Fac. of EE, Math. & CS, Delft Univ. of Technol., Delft, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of EE, Mathematics and CS, Delft University of Technology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Fac. of EE, Math. & CS, Delft Univ. of Technol., Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023038018","display_name":"Vincent van der Leest","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Vincent van der Leest","raw_affiliation_strings":["Intrinsic-ID B.V., Eindhoven, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intrinsic-ID B.V., Eindhoven, Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090494585","display_name":"Roel Maes","orcid":"https://orcid.org/0000-0001-6240-8608"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Roel Maes","raw_affiliation_strings":["Intrinsic-ID B.V., Eindhoven, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intrinsic-ID B.V., Eindhoven, Netherlands","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050768584","display_name":"Geert-Jan Schrijen","orcid":"https://orcid.org/0000-0003-3492-2655"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Geert-Jan Schrijen","raw_affiliation_strings":["Intrinsic-ID B.V., Eindhoven, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intrinsic-ID B.V., Eindhoven, Netherlands","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.0746,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.95220462,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"35","last_page":"40"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.7175821661949158},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6926395297050476},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6147335171699524},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6139867901802063},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6059126853942871},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5904872417449951},{"id":"https://openalex.org/keywords/footprint","display_name":"Footprint","score":0.5276511907577515},{"id":"https://openalex.org/keywords/memory-footprint","display_name":"Memory footprint","score":0.5192685127258301},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.4955977201461792},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4647229313850403},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.44392597675323486},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.39980798959732056},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3701595962047577},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30148595571517944},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18273606896400452},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07562202215194702}],"concepts":[{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.7175821661949158},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6926395297050476},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6147335171699524},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6139867901802063},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6059126853942871},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5904872417449951},{"id":"https://openalex.org/C132943942","wikidata":"https://www.wikidata.org/wiki/Q2562511","display_name":"Footprint","level":2,"score":0.5276511907577515},{"id":"https://openalex.org/C74912251","wikidata":"https://www.wikidata.org/wiki/Q6815727","display_name":"Memory footprint","level":2,"score":0.5192685127258301},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.4955977201461792},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4647229313850403},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.44392597675323486},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.39980798959732056},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3701595962047577},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30148595571517944},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18273606896400452},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07562202215194702},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/hst.2013.6581562","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hst.2013.6581562","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST)","raw_type":"proceedings-article"},{"id":"pmh:oai:zenodo.org:3431260","is_oa":true,"landing_page_url":"https://zenodo.org/record/3431260","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:zenodo.org:3431260","is_oa":true,"landing_page_url":"https://zenodo.org/record/3431260","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"score":0.7099999785423279,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W42545666","https://openalex.org/W65483511","https://openalex.org/W124944822","https://openalex.org/W164711155","https://openalex.org/W1501486502","https://openalex.org/W1505206383","https://openalex.org/W1606443045","https://openalex.org/W1922829621","https://openalex.org/W1968261083","https://openalex.org/W1971584660","https://openalex.org/W1975166224","https://openalex.org/W1981555606","https://openalex.org/W1995871244","https://openalex.org/W2000171858","https://openalex.org/W2002734120","https://openalex.org/W2011978521","https://openalex.org/W2056212403","https://openalex.org/W2102576814","https://openalex.org/W2112995947","https://openalex.org/W2113322447","https://openalex.org/W2130351941","https://openalex.org/W2146813141","https://openalex.org/W2165642710","https://openalex.org/W2174648984","https://openalex.org/W2785506110","https://openalex.org/W2787231538","https://openalex.org/W4240085364","https://openalex.org/W6606751613","https://openalex.org/W6635981913","https://openalex.org/W6640248849","https://openalex.org/W6675028928","https://openalex.org/W6679357471","https://openalex.org/W6685649096"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W2330537534","https://openalex.org/W4306968100","https://openalex.org/W2368534554","https://openalex.org/W2148469257","https://openalex.org/W2999244305","https://openalex.org/W3137434606","https://openalex.org/W4372263373"],"abstract_inverted_index":{"The":[0],"efficiency":[1],"and":[2,8,72,89,139],"cost":[3,45],"of":[4,19,21],"silicon":[5,119],"PUF-based":[6,57],"applications,":[7],"in":[9,66],"particular":[10],"key":[11,58],"generators,":[12],"are":[13,121],"heavily":[14],"impacted":[15],"by":[16],"the":[17,22,48,125,144],"level":[18],"reproducibility":[20],"bare":[23],"PUF":[24,50,63,75,97,156],"responses":[25],"under":[26],"varying":[27],"operational":[28],"circumstances.":[29],"Error-correcting":[30],"codes":[31],"can":[32],"be":[33],"used":[34],"to":[35,106,123,143,160],"achieve":[36],"near-perfect":[37],"reliability,":[38],"but":[39],"come":[40],"at":[41,147],"a":[42,56,60,67,73,86,150],"high":[43],"implementation":[44],"especially":[46],"when":[47],"underlying":[49],"is":[51,149],"very":[52],"noisy.":[53],"When":[54],"designing":[55],"generator,":[59],"more":[61,80],"reliable":[62],"will":[64],"result":[65],"less":[68],"complex":[69],"ECC":[70],"decoder":[71],"smaller":[74],"footprint,":[76],"hence":[77],"an":[78,133],"overall":[79],"efficient":[81],"implementation.":[82],"This":[83],"paper":[84],"proposes":[85],"novel":[87],"insight":[88],"resulting":[90],"technique":[91],"for":[92,137],"reducing":[93],"noise":[94,158],"on":[95,100,111],"memory-based":[96,155],"responses,":[98],"based":[99],"adapting":[101,140],"supply":[102],"voltage":[103,135],"ramp-up":[104,136],"time":[105],"ambient":[107,145],"temperature.":[108],"Circuit":[109],"simulations":[110],"45nm":[112],"Low-Power":[113],"CMOS,":[114],"as":[115,117],"well":[116],"actual":[118],"measurements":[120],"presented":[122],"validate":[124],"proposed":[126],"methods.":[127],"Our":[128],"results":[129],"demonstrate":[130],"that":[131],"choosing":[132],"appropriate":[134],"enrollment":[138],"it":[141],"according":[142],"temperature":[146],"key-reconstruction":[148],"powerful":[151],"method":[152],"which":[153],"makes":[154],"response":[157],"up":[159],"three":[161],"times":[162],"smaller.":[163]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":10},{"year":2014,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2016-06-24T00:00:00"}