{"id":"https://openalex.org/W2091903090","doi":"https://doi.org/10.1109/hpca.2010.5416652","title":"Designing a processor from the ground up to allow voltage/reliability tradeoffs","display_name":"Designing a processor from the ground up to allow voltage/reliability tradeoffs","publication_year":2010,"publication_date":"2010-01-01","ids":{"openalex":"https://openalex.org/W2091903090","doi":"https://doi.org/10.1109/hpca.2010.5416652","mag":"2091903090"},"language":"en","primary_location":{"id":"doi:10.1109/hpca.2010.5416652","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hpca.2010.5416652","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"HPCA - 16 2010 The Sixteenth International Symposium on High-Performance Computer Architecture","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073558386","display_name":"Andrew B. Kahng","orcid":"https://orcid.org/0000-0002-4490-5018"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Andrew B. Kahng","raw_affiliation_strings":["University of California San Diego, La Jolla, CA, US","ECE Departments, University of California, San Diego, La Jolla, CA 92093-0404"],"affiliations":[{"raw_affiliation_string":"University of California San Diego, La Jolla, CA, US","institution_ids":["https://openalex.org/I36258959"]},{"raw_affiliation_string":"ECE Departments, University of California, San Diego, La Jolla, CA 92093-0404","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044543389","display_name":"Seokhyeong Kang","orcid":"https://orcid.org/0000-0003-3015-1806"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Seokhyeong Kang","raw_affiliation_strings":["ECE Departments, University of California, San Diego, CA, USA","ECE Departments, University of California, San Diego, La Jolla, CA 92093-0404"],"affiliations":[{"raw_affiliation_string":"ECE Departments, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]},{"raw_affiliation_string":"ECE Departments, University of California, San Diego, La Jolla, CA 92093-0404","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067547869","display_name":"Rakesh Kumar","orcid":"https://orcid.org/0000-0002-3290-2629"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rakesh Kumar","raw_affiliation_strings":["Coordinated Science Laboratory, University of Illinois, Urbana-Champaign, Urbana, IL, USA","Coordinated Science Laboratory, University of Illinois, Urbana-Champaign, Urbana, IL 61801"],"affiliations":[{"raw_affiliation_string":"Coordinated Science Laboratory, University of Illinois, Urbana-Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Coordinated Science Laboratory, University of Illinois, Urbana-Champaign, Urbana, IL 61801","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046254855","display_name":"John Sartori","orcid":"https://orcid.org/0000-0002-3467-9862"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John Sartori","raw_affiliation_strings":["Coordinated Science Laboratory, University of Illinois, Urbana-Champaign, Urbana, IL, USA","Coordinated Science Laboratory, University of Illinois, Urbana-Champaign, Urbana, IL 61801"],"affiliations":[{"raw_affiliation_string":"Coordinated Science Laboratory, University of Illinois, Urbana-Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Coordinated Science Laboratory, University of Illinois, Urbana-Champaign, Urbana, IL 61801","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5073558386"],"corresponding_institution_ids":["https://openalex.org/I36258959"],"apc_list":null,"apc_paid":null,"fwci":13.634,"has_fulltext":false,"cited_by_count":89,"citation_normalized_percentile":{"value":0.99116772,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6332888603210449},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6279119849205017},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5754852890968323},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.5380105376243591},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5303457379341125},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.49280884861946106},{"id":"https://openalex.org/keywords/dynamic-voltage-scaling","display_name":"Dynamic voltage scaling","score":0.46489137411117554},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.46395084261894226},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.44929778575897217},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.30696773529052734},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21162566542625427},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20420193672180176},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09473523497581482}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6332888603210449},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6279119849205017},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5754852890968323},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.5380105376243591},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5303457379341125},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.49280884861946106},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.46489137411117554},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.46395084261894226},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.44929778575897217},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.30696773529052734},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21162566542625427},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20420193672180176},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09473523497581482},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/hpca.2010.5416652","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hpca.2010.5416652","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"HPCA - 16 2010 The Sixteenth International Symposium on High-Performance Computer Architecture","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8600000143051147,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1913985116","https://openalex.org/W2010468809","https://openalex.org/W2082568343","https://openalex.org/W2097544821","https://openalex.org/W2100379261","https://openalex.org/W2100995829","https://openalex.org/W2102727118","https://openalex.org/W2112833506","https://openalex.org/W2120635877","https://openalex.org/W2133079932","https://openalex.org/W2148923014","https://openalex.org/W2149870396","https://openalex.org/W2152833313","https://openalex.org/W2153456949","https://openalex.org/W2153489710","https://openalex.org/W2154168135","https://openalex.org/W2163421219","https://openalex.org/W2167566128","https://openalex.org/W2168429197","https://openalex.org/W2170925473","https://openalex.org/W4205579859","https://openalex.org/W4236432903","https://openalex.org/W4239012550","https://openalex.org/W4245013765","https://openalex.org/W6671038894","https://openalex.org/W6682145182"],"related_works":["https://openalex.org/W2041615232","https://openalex.org/W975040225","https://openalex.org/W2149032943","https://openalex.org/W2154081718","https://openalex.org/W2167002145","https://openalex.org/W2106281713","https://openalex.org/W1544140237","https://openalex.org/W141820298","https://openalex.org/W3149410719","https://openalex.org/W1503315192"],"abstract_inverted_index":{"Current":[0],"processor":[1,97],"designs":[2,128],"have":[3],"a":[4,10,57,70,96,99,165,189],"critical":[5,20],"operating":[6],"point":[7,144],"that":[8,105,129,145],"sets":[9],"hard":[11],"limit":[12],"on":[13,82],"voltage":[14,21,54,140,162,180],"scaling.":[15],"Any":[16],"scaling":[17,55,181],"beyond":[18],"the":[19,25,51,90,108,114,143,161,169,176,200,232],"results":[22,123],"in":[23,78,98,124,231],"exceeding":[24],"maximum":[26,147,170],"allowable":[27,148,171],"error":[28,172,191,205,219,235],"rate,":[29,173],"i.e.,":[30],"there":[31],"are":[32,212,229],"more":[33],"timing":[34,87,93],"errors":[35,119,149],"than":[36],"can":[37],"be":[38],"effectively":[39],"and":[40,101,184,216,225],"gainfully":[41],"detected":[42],"or":[43],"corrected":[44],"by":[45,138],"an":[46,204],"error-tolerance":[47],"mechanism.":[48],"This":[49,122],"limits":[50],"effectiveness":[52],"of":[53,89,95,110,116,155,207,221,234,241],"as":[56],"knob":[58],"for":[59,150,188,218],"reliability/power":[60,136],"tradeoffs.":[61],"In":[62],"this":[63],"paper,":[64],"we":[65,106],"present":[66],"power-aware":[67,83],"slack":[68,84,88],"redistribution,":[69],"novel":[71],"design-level":[72],"approach":[73],"to":[74,134,142,159,246],"allow":[75],"voltage/reliability":[76],"tradeoffs":[77,137],"processors.":[79],"Techniques":[80],"based":[81],"redistribution":[85],"reapportion":[86],"frequently-occurring,":[91],"near-critical":[92],"paths":[94],"power-":[100],"area-efficient":[102],"manner,":[103],"such":[104],"increase":[107],"range":[109,177],"voltages":[111],"over":[112,178,199],"which":[113,164,179],"incidence":[115],"operational":[117],"(timing)":[118],"is":[120,158,182,244],"acceptable.":[121],"soft":[125,166],"architectures":[126],"\u2014":[127],"fail":[130],"gracefully,":[131],"allowing":[132],"us":[133],"perform":[135],"reducing":[139],"up":[141,245],"produces":[146],"our":[151,156,242],"application.":[152],"The":[153],"goal":[154],"optimization":[157],"minimize":[160],"at":[163,203],"architecture":[167],"encounters":[168],"thus":[174],"maximizing":[175],"possible":[183],"minimizing":[185],"power":[186,197,210],"consumption":[187],"given":[190],"rate.":[192],"Our":[193],"experiments":[194],"demonstrate":[195],"23%":[196],"savings":[198],"baseline":[201],"design":[202],"rate":[206],"1%.":[208],"Observed":[209],"reductions":[211],"29%,":[213,214],"19%,":[215],"20%":[217],"rates":[220],"2%,":[222],"4%,":[223],"8%,":[224],"16%":[226],"respectively.":[227],"Benefits":[228],"higher":[230],"face":[233],"recovery":[236],"using":[237],"Razor.":[238],"Area":[239],"overhead":[240],"techniques":[243],"2.7%.":[247]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":11},{"year":2012,"cited_by_count":14}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}