{"id":"https://openalex.org/W7168369336","doi":"https://doi.org/10.1109/host68814.2026.11604826","title":"BitFlipScope: Scalable Fault Localization and Recovery for Bit-Flip Corruptions in LLMs","display_name":"BitFlipScope: Scalable Fault Localization and Recovery for Bit-Flip Corruptions in LLMs","publication_year":2026,"publication_date":"2026-05-04","ids":{"openalex":"https://openalex.org/W7168369336","doi":"https://doi.org/10.1109/host68814.2026.11604826"},"language":null,"primary_location":{"id":"doi:10.1109/host68814.2026.11604826","is_oa":false,"landing_page_url":"https://doi.org/10.1109/host68814.2026.11604826","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5140955565","display_name":"Muhammad Zeeshan Karamat","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Muhammad Zeeshan Karamat","raw_affiliation_strings":["Virginia Tech,Bradly Dept. of ECE,Blacksburg,Virginia,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virginia Tech,Bradly Dept. of ECE,Blacksburg,Virginia,USA","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5140854784","display_name":"Sadman Saif","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sadman Saif","raw_affiliation_strings":["Virginia Tech,Bradly Dept. of ECE,Blacksburg,Virginia,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virginia Tech,Bradly Dept. of ECE,Blacksburg,Virginia,USA","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5140831362","display_name":"Christiana Chamon","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Christiana Chamon","raw_affiliation_strings":["Virginia Tech,Bradly Dept. of ECE,Blacksburg,Virginia,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virginia Tech,Bradly Dept. of ECE,Blacksburg,Virginia,USA","institution_ids":["https://openalex.org/I859038795"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I859038795"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"367","last_page":"382"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":null,"topics":[],"keywords":[{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.5206999778747559},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.37610000371932983},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.2849999964237213},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.28220000863075256}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6255000233650208},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.5206999778747559},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.37610000371932983},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.3009999990463257},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.2969000041484833},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.2849999964237213},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.28220000863075256},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.2773999869823456},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.2752000093460083},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2669999897480011},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.2513999938964844}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/host68814.2026.11604826","is_oa":false,"landing_page_url":"https://doi.org/10.1109/host68814.2026.11604826","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-16T06:00:37.324182","created_date":"2026-07-16T00:00:00"}