{"id":"https://openalex.org/W2554640531","doi":"https://doi.org/10.1109/hldvt.2016.7748266","title":"Hardware-in-the-loop model-less diagnostic test generation","display_name":"Hardware-in-the-loop model-less diagnostic test generation","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2554640531","doi":"https://doi.org/10.1109/hldvt.2016.7748266","mag":"2554640531"},"language":"en","primary_location":{"id":"doi:10.1109/hldvt.2016.7748266","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2016.7748266","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International High Level Design Validation and Test Workshop (HLDVT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013171865","display_name":"Sarmad Tanwir","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sarmad Tanwir","raw_affiliation_strings":["Virginia Tech, Blacksburg, VA, USA"],"affiliations":[{"raw_affiliation_string":"Virginia Tech, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108516165","display_name":"Michael S. Hsiao","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael S. Hsiao","raw_affiliation_strings":["Virginia Tech, Blacksburg, VA, USA"],"affiliations":[{"raw_affiliation_string":"Virginia Tech, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090078841","display_name":"Loganathan Lingappan","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Loganathan Lingappan","raw_affiliation_strings":["Intel Corporation, Folsom, CA, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Folsom, CA, USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5013171865"],"corresponding_institution_ids":["https://openalex.org/I859038795"],"apc_list":null,"apc_paid":null,"fwci":0.6307,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.68864021,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"128","last_page":"135"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.7759050726890564},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7637511491775513},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.6606170535087585},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6523035168647766},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5122548937797546},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.49668198823928833},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4880041182041168},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.48259055614471436},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.43294936418533325},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.424361914396286},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4216074049472809},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3476424217224121},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3224499523639679},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2566835284233093},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.1646835207939148},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11947011947631836},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.11236333847045898}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.7759050726890564},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7637511491775513},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.6606170535087585},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6523035168647766},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5122548937797546},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.49668198823928833},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4880041182041168},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.48259055614471436},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.43294936418533325},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.424361914396286},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4216074049472809},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3476424217224121},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3224499523639679},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2566835284233093},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.1646835207939148},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11947011947631836},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.11236333847045898},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/hldvt.2016.7748266","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2016.7748266","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International High Level Design Validation and Test Workshop (HLDVT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.4399999976158142}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1507615093","https://openalex.org/W1581030050","https://openalex.org/W1843392114","https://openalex.org/W1849928240","https://openalex.org/W1965224622","https://openalex.org/W1972545198","https://openalex.org/W1973423723","https://openalex.org/W1987398152","https://openalex.org/W1995521279","https://openalex.org/W2014953362","https://openalex.org/W2016114271","https://openalex.org/W2065847128","https://openalex.org/W2095537921","https://openalex.org/W2111334369","https://openalex.org/W2115005577","https://openalex.org/W2131814033","https://openalex.org/W2143846508","https://openalex.org/W2144328631","https://openalex.org/W2145986592","https://openalex.org/W2146990954","https://openalex.org/W2152489029","https://openalex.org/W2159254834","https://openalex.org/W2161229078","https://openalex.org/W2183098680","https://openalex.org/W2283559063","https://openalex.org/W4230940000","https://openalex.org/W4233956586","https://openalex.org/W4250556527","https://openalex.org/W4250678187","https://openalex.org/W6643715187","https://openalex.org/W6681228468"],"related_works":["https://openalex.org/W4321442002","https://openalex.org/W2015265939","https://openalex.org/W2284072287","https://openalex.org/W2611067230","https://openalex.org/W2480201319","https://openalex.org/W2387706296","https://openalex.org/W2155788121","https://openalex.org/W2030553922","https://openalex.org/W2791339912","https://openalex.org/W27394797"],"abstract_inverted_index":{"Iterative":[0],"scan":[1],"diagnosis":[2,191],"is":[3,128,136],"often":[4],"needed":[5,76],"for":[6,94,99],"both":[7],"the":[8,12,75,81,100,107,116,140,145,161,190,194,203,212],"first":[9],"silicon":[10],"and":[11,23,50,59,73,160,214],"hard-to-diagnose":[13,101],"chips.":[14],"The":[15],"chips":[16,102],"in":[17],"question":[18],"are":[19,67],"extracted":[20],"from":[21],"wafers":[22],"re-tested":[24],"on":[25,115,139,206],"a":[26,32,46,119,131,150,156,174],"debug":[27,108],"platform":[28],"to":[29,69,79,106,149,188,224],"arrive":[30],"at":[31],"reasonable":[33],"number":[34],"of":[35,53,83,152,155,193,218],"probable":[36],"defect":[37,84],"candidates":[38],"that":[39,135],"can":[40],"be":[41],"physically":[42],"analyzed.":[43],"This":[44,126],"requires":[45],"large":[47],"setup":[48,213],"time":[49,226],"multiple":[51],"iterations":[52],"deterministic":[54],"diagnostic":[55,97,177],"test":[56],"pattern":[57,178],"generation":[58,179],"application.":[60],"In":[61,86],"every":[62],"iteration,":[63],"offline":[64,219],"software":[65],"tools":[66],"used":[68],"diagnose":[70],"observed":[71,142],"failures":[72],"generate":[74,111],"new":[77],"patterns":[78,98,113,148],"prune":[80],"list":[82],"candidates.":[85],"this":[87],"paper,":[88],"we":[89,185],"propose":[90],"an":[91],"online":[92],"approach":[93],"generating":[95],"additional":[96,225],"without":[103],"moving":[104],"them":[105],"platform.":[109],"We":[110,165],"these":[112],"directly":[114],"tester":[117],"through":[118],"fault":[120],"model":[121],"independent":[122],"hardware-in-the-loop":[123],"evolutionary":[124],"algorithm.":[125],"algorithm":[127],"guided":[129],"by":[130,143,169],"lightweight":[132],"fitness":[133],"metric":[134],"solely":[137],"based":[138],"mismatches":[141],"applying":[144],"newly":[146],"generated":[147,183],"pair":[151],"circuits":[153],"consisting":[154],"known":[157],"good":[158],"die":[159],"chip":[162],"being":[163],"diagnosed.":[164],"evaluated":[166],"our":[167,171,182],"technique":[168,209],"comparing":[170],"results":[172],"against":[173],"state-of-the-art":[175],"commercial":[176,195,204],"tool.":[180],"Using":[181],"patterns,":[184],"were":[186],"able":[187],"match":[189],"quality":[192],"tool,":[196],"while":[197],"incurring":[198],"significantly":[199],"less":[200],"runtime":[201],"than":[202],"tool":[205],"average.":[207],"Our":[208],"also":[210],"eliminates":[211],"other":[215],"overhead":[216],"costs":[217],"iterative":[220],"diagnosis,":[221],"which":[222],"amounts":[223],"savings.":[227]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}