{"id":"https://openalex.org/W2131200995","doi":"https://doi.org/10.1109/hldvt.2009.5340171","title":"An instrumented observability coverage method for system validation","display_name":"An instrumented observability coverage method for system validation","publication_year":2009,"publication_date":"2009-11-01","ids":{"openalex":"https://openalex.org/W2131200995","doi":"https://doi.org/10.1109/hldvt.2009.5340171","mag":"2131200995"},"language":"en","primary_location":{"id":"doi:10.1109/hldvt.2009.5340171","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2009.5340171","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International High Level Design Validation and Test Workshop","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014225576","display_name":"Peter Lisherness","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peter Lisherness","raw_affiliation_strings":["ECE Department, University of California,\uc2a0Santa Barbara, Santa Barbara, CA, USA","ECE Department, University of California, Santa Barbara, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of California,\uc2a0Santa Barbara, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"ECE Department, University of California, Santa Barbara, USA#TAB#","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077687075","display_name":"Kwang\u2010Ting Cheng","orcid":"https://orcid.org/0000-0002-3885-4912"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kwang-Ting Cheng","raw_affiliation_strings":["ECE Department, University of California,\uc2a0Santa Barbara, Santa Barbara, CA, USA","ECE Department, University of California, Santa Barbara, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of California,\uc2a0Santa Barbara, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"ECE Department, University of California, Santa Barbara, USA#TAB#","institution_ids":["https://openalex.org/I154570441"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I154570441"],"apc_list":null,"apc_paid":null,"fwci":2.2913,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.88609407,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"88","last_page":"93"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.9182880520820618},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.734531044960022},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.6952107548713684},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.6262004971504211},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.5811610221862793},{"id":"https://openalex.org/keywords/compiler","display_name":"Compiler","score":0.5367661118507385},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.48490625619888306},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4270772337913513},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.40115824341773987},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.394259512424469},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34903356432914734},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.32681357860565186},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.2492658793926239},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.23205462098121643},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1340281069278717},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0971316397190094}],"concepts":[{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.9182880520820618},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.734531044960022},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.6952107548713684},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.6262004971504211},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.5811610221862793},{"id":"https://openalex.org/C169590947","wikidata":"https://www.wikidata.org/wiki/Q47506","display_name":"Compiler","level":2,"score":0.5367661118507385},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.48490625619888306},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4270772337913513},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.40115824341773987},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.394259512424469},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34903356432914734},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.32681357860565186},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.2492658793926239},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.23205462098121643},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1340281069278717},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0971316397190094},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/hldvt.2009.5340171","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2009.5340171","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International High Level Design Validation and Test Workshop","raw_type":"proceedings-article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-77040","is_oa":false,"landing_page_url":"http://repository.hkust.edu.hk/ir/Record/1783.1-77040","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference paper"},{"id":"pmh:oai:repository.ust.hk:1783.1-77040","is_oa":false,"landing_page_url":"http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=1552-6674&rft.volume=&rft.issue=&rft.date=2009&rft.spage=88&rft.aulast=Lisherness&rft.aufirst=Peter&rft.atitle=An%20instrumented%20observability%20coverage%20method%20for%20system%20validation&rft.title=Proceedings%20-%20HLDVT'09%20-%20IEEE%20International%20High%20Level%20Design%20Validation%20and%20Test%20Workshop%3B%20San%20Francisco%2C%20CA%3B%20United%20States","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference paper"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.49000000953674316,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1501867187","https://openalex.org/W1970616559","https://openalex.org/W2000767141","https://openalex.org/W2017823104","https://openalex.org/W2020584063","https://openalex.org/W2025370922","https://openalex.org/W2101152030","https://openalex.org/W2102844362","https://openalex.org/W2103825248","https://openalex.org/W2110813667","https://openalex.org/W2123302446","https://openalex.org/W2123329891","https://openalex.org/W2124710683","https://openalex.org/W2148627094","https://openalex.org/W2167707883","https://openalex.org/W4232177410","https://openalex.org/W4239902645","https://openalex.org/W4253833434","https://openalex.org/W6650494588","https://openalex.org/W6675305138","https://openalex.org/W6676661898","https://openalex.org/W6684534873"],"related_works":["https://openalex.org/W3077060396","https://openalex.org/W2097349963","https://openalex.org/W2147058777","https://openalex.org/W4282961407","https://openalex.org/W3148278272","https://openalex.org/W4390098643","https://openalex.org/W1969564587","https://openalex.org/W1559766497","https://openalex.org/W2137114625","https://openalex.org/W2122562527"],"abstract_inverted_index":{"In":[0],"order":[1],"to":[2,77],"improve":[3],"effectiveness":[4],"and":[5,16,28,39,94,133,151],"efficiency":[6,106],"of":[7,53,84],"post-silicon":[8],"validation,":[9],"we":[10],"present":[11],"a":[12,17,51,62,123],"fault-symbol":[13,100],"tracking":[14,71,101],"method":[15],"coverage":[18,44,116,142,150],"metric":[19,86,143],"that":[20,139],"account":[21],"for":[22,32,41,122],"the":[23,85,131,140,148,160],"limited":[24],"observability":[25],"in":[26,47,61,68,155],"silicon":[27],"thus":[29],"are":[30,50,128],"useful":[31],"guiding":[33],"validation":[34],"test":[35,37],"selection,":[36],"development,":[38],"design":[40],"debug.":[42],"The":[43,115,136],"points":[45],"targeted":[46],"this":[48],"study":[49],"set":[52,126],"fault-symbols,":[54],"or":[55,79],"`tags',":[56],"generated":[57],"from":[58,118],"each":[59],"expression":[60],"system":[63],"model.":[64],"Coverage":[65],"is":[66,87,144],"measured":[67],"simulation":[69,113],"by":[70],"tags":[72],"alongside":[73],"dynamic":[74],"information":[75],"flows":[76],"user-defined":[78],"implicit":[80],"observation":[81],"points.":[82],"Computation":[83],"performed":[88],"based":[89],"on":[90],"high-level":[91],"(C/C++)":[92],"functional":[93],"behavioral":[95],"models":[96],"through":[97],"compiler-inserted":[98],"parallel":[99],"instrumentation,":[102],"which":[103],"offers":[104],"high":[105],"as":[107,109],"well":[108],"compatibility":[110],"with":[111,130],"existing":[112],"flows.":[114],"results":[117,137],"our":[119],"initial":[120],"implementation":[121],"microcontroller":[124],"instruction":[125],"simulator":[127],"compared":[129],"statement":[132,149],"mutation":[134,161],"coverages.":[135],"show":[138],"new":[141],"more":[145],"accurate":[146],"than":[147,159],"can":[152],"be":[153],"computed":[154],"significantly":[156],"shorter":[157],"runtimes":[158],"coverage.":[162]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}