{"id":"https://openalex.org/W2147386446","doi":"https://doi.org/10.1109/hldvt.2009.5340160","title":"IFRA: Post-silicon bug localization in processors","display_name":"IFRA: Post-silicon bug localization in processors","publication_year":2009,"publication_date":"2009-11-01","ids":{"openalex":"https://openalex.org/W2147386446","doi":"https://doi.org/10.1109/hldvt.2009.5340160","mag":"2147386446"},"language":"en","primary_location":{"id":"doi:10.1109/hldvt.2009.5340160","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2009.5340160","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International High Level Design Validation and Test Workshop","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://zenodo.org/record/1269307","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026644501","display_name":"Sung-Boem Park","orcid":null},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sung-Boem Park","raw_affiliation_strings":["Departments of Electrical Engineering and Computer Science, University of Stanford, Stanford, CA, USA","Departments of Electrical Engineering and Computer Science, Stanford University, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departments of Electrical Engineering and Computer Science, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"Departments of Electrical Engineering and Computer Science, Stanford University, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036312663","display_name":"Subhasish Mitra","orcid":"https://orcid.org/0000-0002-5572-5194"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Subhasish Mitra","raw_affiliation_strings":["Departments of Electrical Engineering and Computer Science, University of Stanford, Stanford, CA, USA","Departments of Electrical Engineering and Computer Science, Stanford University, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departments of Electrical Engineering and Computer Science, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"Departments of Electrical Engineering and Computer Science, Stanford University, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I97018004"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.23428438,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"7","issue":null,"first_page":"154","last_page":"159"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7107706665992737},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.5986813902854919},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5522164106369019},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5454763174057007},{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.45896199345588684},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3679349422454834},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.26501134037971497},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.22858890891075134},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21035164594650269},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.18787875771522522},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.15000751614570618}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7107706665992737},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.5986813902854919},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5522164106369019},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5454763174057007},{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.45896199345588684},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3679349422454834},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.26501134037971497},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.22858890891075134},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21035164594650269},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.18787875771522522},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.15000751614570618},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/hldvt.2009.5340160","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2009.5340160","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International High Level Design Validation and Test Workshop","raw_type":"proceedings-article"},{"id":"pmh:oai:zenodo.org:1269307","is_oa":true,"landing_page_url":"https://zenodo.org/record/1269307","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"public-domain","license_id":"https://openalex.org/licenses/public-domain","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferencePaper"}],"best_oa_location":{"id":"pmh:oai:zenodo.org:1269307","is_oa":true,"landing_page_url":"https://zenodo.org/record/1269307","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"public-domain","license_id":"https://openalex.org/licenses/public-domain","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferencePaper"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1510808677","https://openalex.org/W1566296806","https://openalex.org/W1952649965","https://openalex.org/W1965210897","https://openalex.org/W1976431848","https://openalex.org/W1977375970","https://openalex.org/W1981514768","https://openalex.org/W2004749420","https://openalex.org/W2020584063","https://openalex.org/W2027534877","https://openalex.org/W2064486455","https://openalex.org/W2066462613","https://openalex.org/W2096950720","https://openalex.org/W2104225326","https://openalex.org/W2119913792","https://openalex.org/W2122146819","https://openalex.org/W2123205813","https://openalex.org/W2123815023","https://openalex.org/W2124438715","https://openalex.org/W2129750565","https://openalex.org/W2133218998","https://openalex.org/W2138849113","https://openalex.org/W2144984544","https://openalex.org/W2145314233","https://openalex.org/W2145913625","https://openalex.org/W2150148998","https://openalex.org/W2151845324","https://openalex.org/W2153425417","https://openalex.org/W2159869022","https://openalex.org/W2169596872","https://openalex.org/W2170454670","https://openalex.org/W3136117375","https://openalex.org/W4231340621","https://openalex.org/W4232307912","https://openalex.org/W4248445118","https://openalex.org/W6681525158"],"related_works":["https://openalex.org/W2116876222","https://openalex.org/W2082317094","https://openalex.org/W2374512474","https://openalex.org/W3003815297","https://openalex.org/W2145705880","https://openalex.org/W2033591085","https://openalex.org/W2067860068","https://openalex.org/W2063558432","https://openalex.org/W3198758847","https://openalex.org/W4230458348"],"abstract_inverted_index":{"IFRA":[0,104,141],"overcomes":[1],"challenges":[2],"associated":[3],"with":[4,86,149],"an":[5],"expensive":[6],"step":[7],"in":[8,59,144],"post-silicon":[9,61,96,109],"validation":[10,63],"of":[11,38,56,91,102,121],"processors":[12],"-":[13],"pinpointing":[14],"the":[15,19,24,42,53,57,68,87,92],"bug":[16,25,78,110],"location":[17],"and":[18,40,74],"instruction":[20,33],"sequence":[21],"that":[22,140],"exposes":[23],"from":[26],"a":[27,60,135],"system":[28,62,66],"failure.":[29],"On-chip":[30],"recorders":[31],"collect":[32],"footprints":[34],"(information":[35],"about":[36],"flows":[37],"instructions,":[39],"what":[41],"instructions":[43],"did":[44],"as":[45],"they":[46],"passed":[47],"through":[48],"various":[49],"design":[50],"blocks)":[51],"during":[52,95],"normal":[54],"operation":[55],"processor":[58,138],"setup.":[64],"Upon":[65],"failure,":[67],"recorded":[69],"information":[70],"is":[71,142],"scanned":[72],"out":[73],"analyzed":[75],"off-line":[76],"for":[77,108],"localization.":[79],"Special":[80],"self-consistency-based":[81],"program":[82,89],"analysis":[83],"techniques,":[84],"together":[85],"test":[88],"binary":[90],"application":[93],"executed":[94],"validation,":[97],"are":[98],"used.":[99],"Major":[100],"benefits":[101],"using":[103],"over":[105],"traditional":[106],"techniques":[107],"localization":[111],"are:":[112],"1.":[113],"It":[114,125],"does":[115,126],"not":[116,127],"require":[117,128],"full":[118,129],"system-level":[119,130],"reproduction":[120],"bugs,":[122],"and,":[123],"2.":[124],"simulation.":[131],"Simulation":[132],"results":[133],"on":[134,153],"complex":[136],"super-scalar":[137],"demonstrate":[139],"effective":[143],"accurately":[145],"localizing":[146],"electrical":[147],"bugs":[148],"very":[150],"little":[151],"impact":[152],"overall":[154],"chip":[155],"area.":[156]},"counts_by_year":[{"year":2019,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}