{"id":"https://openalex.org/W2122118742","doi":"https://doi.org/10.1109/hldvt.2008.4695890","title":"Panel: SoC power management implications on validation and testing","display_name":"Panel: SoC power management implications on validation and testing","publication_year":2008,"publication_date":"2008-11-01","ids":{"openalex":"https://openalex.org/W2122118742","doi":"https://doi.org/10.1109/hldvt.2008.4695890","mag":"2122118742"},"language":"en","primary_location":{"id":"doi:10.1109/hldvt.2008.4695890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2008.4695890","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International High Level Design Validation and Test Workshop","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016213907","display_name":"Bhanu Kapoor","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Bhanu Kapoor","raw_affiliation_strings":["Mimasic","Mimasic, USA"],"affiliations":[{"raw_affiliation_string":"Mimasic","institution_ids":[]},{"raw_affiliation_string":"Mimasic, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088016695","display_name":"John B. Goodenough","orcid":"https://orcid.org/0000-0001-9350-3034"},"institutions":[{"id":"https://openalex.org/I4210156213","display_name":"American Rock Mechanics Association","ror":"https://ror.org/05vfrxy92","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210156213"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John Goodenough","raw_affiliation_strings":["ARM, Inc., USA","ARM, USA"],"affiliations":[{"raw_affiliation_string":"ARM, Inc., USA","institution_ids":["https://openalex.org/I4210156213"]},{"raw_affiliation_string":"ARM, USA","institution_ids":["https://openalex.org/I4210156213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069731703","display_name":"Shankar Hemmady","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Shankar Hemmady","raw_affiliation_strings":["Synopsis, Inc","Synopsys, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Synopsis, Inc","institution_ids":[]},{"raw_affiliation_string":"Synopsys, USA#TAB#","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030418006","display_name":"Shireesh Verma","orcid":null},"institutions":[{"id":"https://openalex.org/I1322669654","display_name":"Conexant (United States)","ror":"https://ror.org/05rx1xe20","country_code":"US","type":"company","lineage":["https://openalex.org/I1322669654"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shireesh Verma","raw_affiliation_strings":["Conexant Systems, Inc","Conexant, USA"],"affiliations":[{"raw_affiliation_string":"Conexant Systems, Inc","institution_ids":[]},{"raw_affiliation_string":"Conexant, USA","institution_ids":["https://openalex.org/I1322669654"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049580102","display_name":"M. d'Abreu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Manuel A. d'Abreu","raw_affiliation_strings":["Sandisk","[SanDisk, USA]"],"affiliations":[{"raw_affiliation_string":"Sandisk","institution_ids":[]},{"raw_affiliation_string":"[SanDisk, USA]","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031161187","display_name":"Kaushik Roy","orcid":"https://orcid.org/0009-0002-3375-2877"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kaushik Roy","raw_affiliation_strings":["Purdue University, USA","Purdue University , USA"],"affiliations":[{"raw_affiliation_string":"Purdue University, USA","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"Purdue University , USA","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5016213907"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10416017,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"135","last_page":"137"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.6967372894287109},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5734869241714478},{"id":"https://openalex.org/keywords/semiconductor-industry","display_name":"Semiconductor industry","score":0.5713212490081787},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5516121983528137},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5166783332824707},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5137006044387817},{"id":"https://openalex.org/keywords/mobile-device","display_name":"Mobile device","score":0.4971504509449005},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.4893157184123993},{"id":"https://openalex.org/keywords/time-to-market","display_name":"Time to market","score":0.4548526406288147},{"id":"https://openalex.org/keywords/consumption","display_name":"Consumption (sociology)","score":0.4483368694782257},{"id":"https://openalex.org/keywords/semiconductor-device","display_name":"Semiconductor device","score":0.4392394423484802},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23581966757774353},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2083423137664795},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.1303357481956482},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.12476930022239685},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.11775219440460205},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.10413283109664917}],"concepts":[{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.6967372894287109},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5734869241714478},{"id":"https://openalex.org/C2987888538","wikidata":"https://www.wikidata.org/wiki/Q2986369","display_name":"Semiconductor industry","level":2,"score":0.5713212490081787},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5516121983528137},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5166783332824707},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5137006044387817},{"id":"https://openalex.org/C186967261","wikidata":"https://www.wikidata.org/wiki/Q5082128","display_name":"Mobile device","level":2,"score":0.4971504509449005},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.4893157184123993},{"id":"https://openalex.org/C2779229675","wikidata":"https://www.wikidata.org/wiki/Q445235","display_name":"Time to market","level":2,"score":0.4548526406288147},{"id":"https://openalex.org/C30772137","wikidata":"https://www.wikidata.org/wiki/Q5164762","display_name":"Consumption (sociology)","level":2,"score":0.4483368694782257},{"id":"https://openalex.org/C79635011","wikidata":"https://www.wikidata.org/wiki/Q175805","display_name":"Semiconductor device","level":3,"score":0.4392394423484802},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23581966757774353},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2083423137664795},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.1303357481956482},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.12476930022239685},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.11775219440460205},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10413283109664917},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C36289849","wikidata":"https://www.wikidata.org/wiki/Q34749","display_name":"Social science","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/hldvt.2008.4695890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2008.4695890","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International High Level Design Validation and Test Workshop","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7400000095367432,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W3034529322","https://openalex.org/W2113597336","https://openalex.org/W2155505549","https://openalex.org/W2115913271","https://openalex.org/W2357479218","https://openalex.org/W1819546284","https://openalex.org/W2043253324","https://openalex.org/W2018648706","https://openalex.org/W2114232034","https://openalex.org/W2503934310"],"abstract_inverted_index":{"We":[0],"are":[1,10],"at":[2,77],"the":[3,14,23,37,52,62,78,84],"crossroads":[4],"of":[5,22,51],"some":[6],"fundamental":[7],"changes":[8],"that":[9],"taking":[11],"place":[12],"in":[13,36,69,74,83],"semiconductor":[15,29,53],"industry.":[16],"Power":[17,43,56],"consumption":[18,71],"has":[19],"become":[20],"one":[21],"most":[24],"important":[25],"differentiating":[26],"factors":[27],"for":[28,49],"products":[30],"due":[31],"to":[32],"a":[33,45,58],"major":[34],"shift":[35,63],"market":[38],"towards":[39,64],"handheld":[40],"consumer":[41],"devices.":[42],"is":[44,57],"primary":[46],"design":[47],"criterion":[48],"bulk":[50],"designs":[54,66],"now.":[55],"key":[59],"reason":[60],"behind":[61],"multi-core":[65],"as":[67],"increase":[68],"power":[70],"limits":[72],"increases":[73],"clock":[75],"speed":[76],"rate":[79],"we":[80],"have":[81],"seen":[82],"past.":[85]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}