{"id":"https://openalex.org/W2133436976","doi":"https://doi.org/10.1109/hldvt.2008.4695866","title":"A method for hunting bugs that occur due to system conflicts","display_name":"A method for hunting bugs that occur due to system conflicts","publication_year":2008,"publication_date":"2008-11-01","ids":{"openalex":"https://openalex.org/W2133436976","doi":"https://doi.org/10.1109/hldvt.2008.4695866","mag":"2133436976"},"language":"en","primary_location":{"id":"doi:10.1109/hldvt.2008.4695866","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2008.4695866","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International High Level Design Validation and Test Workshop","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051124038","display_name":"Daniel Geist","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]},{"id":"https://openalex.org/I4210104622","display_name":"Intel (Israel)","ror":"https://ror.org/027t2s119","country_code":"IL","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210104622"]},{"id":"https://openalex.org/I80687555","display_name":"Israel Electric (Israel)","ror":"https://ror.org/01p8dnv11","country_code":"IL","type":"company","lineage":["https://openalex.org/I80687555"]}],"countries":["IL","US"],"is_corresponding":true,"raw_author_name":"Daniel Geist","raw_affiliation_strings":["Intel Corporation, Haifa, Israel","Intel Israel, Haifa"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Haifa, Israel","institution_ids":["https://openalex.org/I80687555","https://openalex.org/I4210104622"]},{"raw_affiliation_string":"Intel Israel, Haifa","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5098094253","display_name":"Oded Vaida","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104622","display_name":"Intel (Israel)","ror":"https://ror.org/027t2s119","country_code":"IL","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210104622"]},{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]},{"id":"https://openalex.org/I80687555","display_name":"Israel Electric (Israel)","ror":"https://ror.org/01p8dnv11","country_code":"IL","type":"company","lineage":["https://openalex.org/I80687555"]}],"countries":["IL","US"],"is_corresponding":false,"raw_author_name":"Oded Vaida","raw_affiliation_strings":["Intel Corporation, Haifa, Israel","Intel Israel, Haifa"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Haifa, Israel","institution_ids":["https://openalex.org/I80687555","https://openalex.org/I4210104622"]},{"raw_affiliation_string":"Intel Israel, Haifa","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5051124038"],"corresponding_institution_ids":["https://openalex.org/I1343180700","https://openalex.org/I4210104622","https://openalex.org/I80687555"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.18436658,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"11","last_page":"17"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.8202304840087891},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7669674158096313},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.6668303608894348},{"id":"https://openalex.org/keywords/regression-testing","display_name":"Regression testing","score":0.6200382709503174},{"id":"https://openalex.org/keywords/suite","display_name":"Suite","score":0.5854418873786926},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5173879861831665},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.47376349568367004},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.45239347219467163},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4484156668186188},{"id":"https://openalex.org/keywords/resource","display_name":"Resource (disambiguation)","score":0.44066905975341797},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4342030882835388},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.43392127752304077},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.4195585548877716},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3326956629753113},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3243095874786377},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.2770475745201111},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.25081369280815125},{"id":"https://openalex.org/keywords/regression-analysis","display_name":"Regression analysis","score":0.19482606649398804},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.14682269096374512},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.14158111810684204},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12799400091171265}],"concepts":[{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.8202304840087891},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7669674158096313},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.6668303608894348},{"id":"https://openalex.org/C161821725","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Regression testing","level":5,"score":0.6200382709503174},{"id":"https://openalex.org/C79581498","wikidata":"https://www.wikidata.org/wiki/Q1367530","display_name":"Suite","level":2,"score":0.5854418873786926},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5173879861831665},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.47376349568367004},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.45239347219467163},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4484156668186188},{"id":"https://openalex.org/C206345919","wikidata":"https://www.wikidata.org/wiki/Q20380951","display_name":"Resource (disambiguation)","level":2,"score":0.44066905975341797},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4342030882835388},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.43392127752304077},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.4195585548877716},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3326956629753113},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3243095874786377},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.2770475745201111},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.25081369280815125},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.19482606649398804},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.14682269096374512},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.14158111810684204},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12799400091171265},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/hldvt.2008.4695866","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2008.4695866","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International High Level Design Validation and Test Workshop","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1529130237","https://openalex.org/W1566072248","https://openalex.org/W4239053401"],"related_works":["https://openalex.org/W1978406750","https://openalex.org/W2054959879","https://openalex.org/W2243231242","https://openalex.org/W3134448717","https://openalex.org/W2028796071","https://openalex.org/W2795302276","https://openalex.org/W2052414005","https://openalex.org/W2187337904","https://openalex.org/W1974262535","https://openalex.org/W2129761255"],"abstract_inverted_index":{"A":[0],"very":[1,47,62],"important":[2],"class":[3],"of":[4,39],"bugs":[5,21,40],"that":[6,135],"occurs":[7],"in":[8,13,68,123],"VLSI":[9],"projects,":[10,19],"and":[11,46,83,99,104],"especially":[12],"System":[14],"on":[15,28,107],"Chip":[16],"(SoC)":[17],"type":[18],"are":[20,41],"caused":[22],"by":[23,118],"two":[24],"or":[25],"more":[26],"processes":[27],"chip":[29],"trying":[30],"to":[31,44,52,64,78],"access":[32],"a":[33,54,76,84,124,130],"shared":[34],"resource":[35],"simultaneously.":[36],"These":[37],"kinds":[38],"both":[42],"hard":[43,63],"find":[45],"likely":[48],"have":[49,95],"the":[50,108],"potential":[51],"cause":[53],"respin":[55],"if":[56],"not":[57],"found":[58],"since":[59],"it":[60],"is":[61,136],"work":[65],"around":[66],"them":[67,106],"software":[69],"(SW).":[70],"In":[71],"this":[72,92,97],"paper":[73],"we":[74],"present":[75],"framework":[77,98],"define":[79],"such":[80],"conflict":[81],"cases":[82,90],"tool":[85],"for":[86],"automatically":[87],"generating":[88],"test":[89,102,132],"from":[91],"definition.":[93],"We":[94],"implemented":[96],"tool,":[100],"generated":[101],"suites,":[103],"simulated":[105,137],"Design":[109],"Under":[110],"Verification.":[111],"Our":[112],"method":[113],"immediately":[114],"proved":[115],"its":[116],"effectiveness":[117],"catching":[119],"an":[120],"unknown":[121],"problem":[122],"project":[125],"which":[126],"has":[127],"already":[128],"established":[129],"reasonable":[131],"suite":[133],"regression":[134],"periodically.":[138]},"counts_by_year":[{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}