{"id":"https://openalex.org/W1599960931","doi":"https://doi.org/10.1109/hldvt.2003.1252484","title":"ATPG-based preimage computation: efficient search space pruning with ZBDD","display_name":"ATPG-based preimage computation: efficient search space pruning with ZBDD","publication_year":2004,"publication_date":"2004-03-30","ids":{"openalex":"https://openalex.org/W1599960931","doi":"https://doi.org/10.1109/hldvt.2003.1252484","mag":"1599960931"},"language":"en","primary_location":{"id":"doi:10.1109/hldvt.2003.1252484","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2003.1252484","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Eighth IEEE International High-Level Design Validation and Test Workshop","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064923800","display_name":"Kameshwar Chandrasekar","orcid":"https://orcid.org/0000-0002-6249-5593"},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Chandrasekar","raw_affiliation_strings":["Virginia Technology, Blacksburg, VA, USA","Virginia Tech, , Blacksburg, VA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virginia Technology, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"Virginia Tech, , Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108516165","display_name":"Michael S. Hsiao","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.S. Hsiao","raw_affiliation_strings":["Virginia Technology, Blacksburg, VA, USA","Virginia Tech, , Blacksburg, VA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virginia Technology, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"Virginia Tech, , Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I859038795"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"117","last_page":"122"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.8077244162559509},{"id":"https://openalex.org/keywords/pruning","display_name":"Pruning","score":0.7951053977012634},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6139266490936279},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.5934051871299744},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5836089849472046},{"id":"https://openalex.org/keywords/linear-subspace","display_name":"Linear subspace","score":0.4952782690525055},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.47353360056877136},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4723920524120331},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.461424857378006},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2929811477661133},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2471165955066681}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.8077244162559509},{"id":"https://openalex.org/C108010975","wikidata":"https://www.wikidata.org/wiki/Q500094","display_name":"Pruning","level":2,"score":0.7951053977012634},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6139266490936279},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.5934051871299744},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5836089849472046},{"id":"https://openalex.org/C12362212","wikidata":"https://www.wikidata.org/wiki/Q728435","display_name":"Linear subspace","level":2,"score":0.4952782690525055},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.47353360056877136},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4723920524120331},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.461424857378006},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2929811477661133},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2471165955066681},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/hldvt.2003.1252484","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2003.1252484","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Eighth IEEE International High-Level Design Validation and Test Workshop","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.2.9671","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.2.9671","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.visc.vt.edu/~mhsiao/papers/hldvt03_kc.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1494481937","https://openalex.org/W1554885925","https://openalex.org/W1787074469","https://openalex.org/W1814068099","https://openalex.org/W1838320025","https://openalex.org/W1904003763","https://openalex.org/W1975335740","https://openalex.org/W2024148935","https://openalex.org/W2044560939","https://openalex.org/W2096307462","https://openalex.org/W2111265695","https://openalex.org/W2118346508","https://openalex.org/W2119241964","https://openalex.org/W2120599220","https://openalex.org/W2144883917","https://openalex.org/W2151398141","https://openalex.org/W2156358952","https://openalex.org/W2161010566","https://openalex.org/W2168081446","https://openalex.org/W2172010775","https://openalex.org/W4249515509","https://openalex.org/W4251625379","https://openalex.org/W4302458519","https://openalex.org/W6629484655","https://openalex.org/W6633069435","https://openalex.org/W6638020115","https://openalex.org/W6643725969","https://openalex.org/W6656308666","https://openalex.org/W6674427772","https://openalex.org/W6677600375","https://openalex.org/W6682383673"],"related_works":["https://openalex.org/W2391321755","https://openalex.org/W2378211422","https://openalex.org/W2949110394","https://openalex.org/W2896134808","https://openalex.org/W4289378085","https://openalex.org/W2071055957","https://openalex.org/W4211228991","https://openalex.org/W2353790329","https://openalex.org/W3103861421","https://openalex.org/W2577384513"],"abstract_inverted_index":{"Computing":[0],"image/preimage":[1],"is":[2,150],"a":[3,80],"fundamental":[4],"step":[5],"in":[6,27],"formal":[7,16],"verification":[8,17],"of":[9,66],"hardware":[10],"systems.":[11],"Conventional":[12],"OBDD-based":[13],"methods":[14,36],"for":[15,48,94,147],"suffer":[18],"from":[19],"spatial":[20],"explosion,":[21],"since":[22,51],"OBDDs":[23],"can":[24,45],"grow":[25],"exponentially":[26],"large":[28],"designs.":[29],"On":[30],"the":[31,43],"other":[32],"hand,":[33],"SAT/ATPG":[34,67],"based":[35,68,83,116],"are":[37,73,114],"less":[38],"demanding":[39],"on":[40,117,135],"memory.":[41],"But":[42],"run-time":[44],"be":[46],"huge":[47],"these":[49,101],"methods,":[50,69],"they":[52],"must":[53],"explore":[54],"an":[55,128],"exponential":[56],"search":[57,90],"space.":[58],"In":[59,75],"order":[60],"to":[61,85,153],"reduce":[62],"this":[63,76],"temporal":[64],"explosion":[65],"efficient":[70],"learning":[71],"techniques":[72,126],"needed.":[74],"paper,":[77],"we":[78],"present":[79],"new":[81],"ZBDD":[82],"method":[84],"compactly":[86],"store":[87],"and":[88,103,111,131],"efficiently":[89],"previously":[91],"explored":[92],"search-states":[93,102],"'ATPG-based":[95],"preimage":[96,148],"computation'.":[97],"We":[98,123],"learn":[99],"front":[100],"avoid":[104],"searching":[105],"their":[106,133],"subsets":[107],"or":[108],"supersets.":[109],"Both,solution":[110],"conflict":[112],"subspaces":[113],"pruned":[115],"simple":[118],"set":[119],"operations":[120],"using":[121],"ZBDDs.":[122],"integrate":[124],"our":[125],"into":[127],"ATPG":[129],"engine":[130],"demonstrate":[132],"efficiency":[134],"ISCAS":[136],"'89":[137],"benchmark":[138],"circuits.":[139],"Experimental":[140],"results":[141],"show":[142],"that":[143],"significant":[144],"search-space":[145],"pruning":[146],"computation":[149],"achieved,":[151],"compared":[152],"previous":[154],"methods.":[155]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}