{"id":"https://openalex.org/W1604098349","doi":"https://doi.org/10.1109/hldvt.2002.1224445","title":"Constructing reusable testbenches","display_name":"Constructing reusable testbenches","publication_year":2003,"publication_date":"2003-10-01","ids":{"openalex":"https://openalex.org/W1604098349","doi":"https://doi.org/10.1109/hldvt.2002.1224445","mag":"1604098349"},"language":"en","primary_location":{"id":"doi:10.1109/hldvt.2002.1224445","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2002.1224445","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109881483","display_name":"Andr\u00e9 Wakefield","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"A. Wakefield","raw_affiliation_strings":["Synopsys Professional Services, MA, USA","Synopsys Professional Services, Marlboro, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys Professional Services, MA, USA","institution_ids":["https://openalex.org/I4210088951"]},{"raw_affiliation_string":"Synopsys Professional Services, Marlboro, MA, USA","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009006174","display_name":"Bassam J. Mohd","orcid":"https://orcid.org/0000-0002-9805-1740"},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"B.J. Mohd","raw_affiliation_strings":["Synopsys Professional Services, MA, USA","Synopsys Professional Services, Marlboro, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys Professional Services, MA, USA","institution_ids":["https://openalex.org/I4210088951"]},{"raw_affiliation_string":"Synopsys Professional Services, Marlboro, MA, USA","institution_ids":["https://openalex.org/I1335490905"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"151","last_page":"155"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9876999855041504,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9787999987602234,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reusability","display_name":"Reusability","score":0.9043698310852051},{"id":"https://openalex.org/keywords/reuse","display_name":"Reuse","score":0.8940720558166504},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7408100366592407},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.6653230786323547},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.6550369262695312},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.4681190550327301},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36660680174827576},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.35869696736335754},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.3202202320098877},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.18097081780433655},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1678662896156311},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.12900754809379578}],"concepts":[{"id":"https://openalex.org/C137981799","wikidata":"https://www.wikidata.org/wiki/Q1369184","display_name":"Reusability","level":3,"score":0.9043698310852051},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.8940720558166504},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7408100366592407},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.6653230786323547},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.6550369262695312},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.4681190550327301},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36660680174827576},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.35869696736335754},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.3202202320098877},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.18097081780433655},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1678662896156311},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.12900754809379578},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/hldvt.2002.1224445","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hldvt.2002.1224445","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Seventh IEEE International High-Level Design Validation and Test Workshop, 2002.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2148740615","https://openalex.org/W2799094315","https://openalex.org/W6601274391"],"related_works":["https://openalex.org/W4282938614","https://openalex.org/W2906929912","https://openalex.org/W2099755394","https://openalex.org/W2350686889","https://openalex.org/W1965839502","https://openalex.org/W2621742671","https://openalex.org/W781411824","https://openalex.org/W2515159793","https://openalex.org/W1798542519","https://openalex.org/W4306316885"],"abstract_inverted_index":{"This":[0],"paper":[1],"explores":[2],"a":[3,35,43,59],"novel":[4],"approach":[5],"to":[6,24,69],"classifying,":[7],"enabling":[8],"and":[9,29,39],"measuring":[10],"testbench":[11,16],"reuse.":[12],"Six":[13],"levels":[14],"of":[15,49],"reusability":[17],"are":[18],"presented":[19],"ranging":[20],"from":[21,54],"utility":[22],"(lowest),":[23],"communication,":[25],"transactor,":[26],"generate/check,":[27],"configuration":[28],"tests":[30],"(highest).":[31],"The":[32],"layers":[33],"provide":[34],"template":[36],"for":[37],"implementation":[38],"enable":[40],"reuse":[41,50],"on":[42],"layer-by-layer":[44],"basis.":[45],"A":[46],"qualitative":[47],"measure":[48,61],"is":[51,62],"available":[52,63],"directly":[53],"the":[55,66,71],"layered":[56],"model":[57],"while":[58],"quantitative":[60],"by":[64],"examining":[65],"effort":[67],"required":[68],"build":[70],"layers.":[72]},"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}