{"id":"https://openalex.org/W4414311217","doi":"https://doi.org/10.1109/hcs66204.2025.11154392","title":"Bit-Separable Transformer Accelerator Leveraging Output Activation Sparsity for Efficient DRAM Access","display_name":"Bit-Separable Transformer Accelerator Leveraging Output Activation Sparsity for Efficient DRAM Access","publication_year":2025,"publication_date":"2025-08-24","ids":{"openalex":"https://openalex.org/W4414311217","doi":"https://doi.org/10.1109/hcs66204.2025.11154392"},"language":"en","primary_location":{"id":"doi:10.1109/hcs66204.2025.11154392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hcs66204.2025.11154392","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE Hot Chips 37 Symposium (HCS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050080635","display_name":"Seunghyun Park","orcid":"https://orcid.org/0000-0002-2416-2472"},"institutions":[{"id":"https://openalex.org/I4210145666","display_name":"Embedded Systems (United States)","ror":"https://ror.org/04742eh45","country_code":"US","type":"company","lineage":["https://openalex.org/I4210145666"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Seunghyun Park","raw_affiliation_strings":["KNU,AI-Embedded S²oftware on Chip Lab. School of Electronic and Electrical Engineering,KOREA"],"affiliations":[{"raw_affiliation_string":"KNU,AI-Embedded S²oftware on Chip Lab. School of Electronic and Electrical Engineering,KOREA","institution_ids":["https://openalex.org/I4210145666"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030304824","display_name":"Daejin Park","orcid":"https://orcid.org/0000-0002-5560-873X"},"institutions":[{"id":"https://openalex.org/I4210145666","display_name":"Embedded Systems (United States)","ror":"https://ror.org/04742eh45","country_code":"US","type":"company","lineage":["https://openalex.org/I4210145666"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daejin Park","raw_affiliation_strings":["KNU,AI-Embedded S²oftware on Chip Lab. School of Electronic and Electrical Engineering,KOREA"],"affiliations":[{"raw_affiliation_string":"KNU,AI-Embedded S²oftware on Chip Lab. School of Electronic and Electrical Engineering,KOREA","institution_ids":["https://openalex.org/I4210145666"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5050080635"],"corresponding_institution_ids":["https://openalex.org/I4210145666"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.26448301,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.526199996471405},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.41909998655319214},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.32120001316070557},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.2904999852180481},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.2581000030040741}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6419000029563904},{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.526199996471405},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.41909998655319214},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3856000006198883},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.32120001316070557},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.31060001254081726},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2939999997615814},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.2904999852180481},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2590999901294708},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.2590000033378601},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.2581000030040741},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25220000743865967},{"id":"https://openalex.org/C147494362","wikidata":"https://www.wikidata.org/wiki/Q2078905","display_name":"Troubleshooting","level":2,"score":0.25209999084472656}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/hcs66204.2025.11154392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hcs66204.2025.11154392","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE Hot Chips 37 Symposium (HCS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-03-07T16:01:11.037858","created_date":"2025-10-10T00:00:00"}