{"id":"https://openalex.org/W2132275159","doi":"https://doi.org/10.1109/hase.2004.1281775","title":"Enhancing testability in architectural design for the new generation of core-based embedded systems","display_name":"Enhancing testability in architectural design for the new generation of core-based embedded systems","publication_year":2004,"publication_date":"2004-06-10","ids":{"openalex":"https://openalex.org/W2132275159","doi":"https://doi.org/10.1109/hase.2004.1281775","mag":"2132275159"},"language":"en","primary_location":{"id":"doi:10.1109/hase.2004.1281775","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hase.2004.1281775","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Eighth IEEE International Symposium on High Assurance Systems Engineering, 2004. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008303398","display_name":"Mansour H. Assaf","orcid":"https://orcid.org/0000-0003-3052-9469"},"institutions":[{"id":"https://openalex.org/I153718931","display_name":"University of Ottawa","ror":"https://ror.org/03c4mmv16","country_code":"CA","type":"education","lineage":["https://openalex.org/I153718931"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"M.H. Assaf","raw_affiliation_strings":["School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, ONT, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I153718931"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101921227","display_name":"S.R. Das","orcid":"https://orcid.org/0000-0002-0668-1981"},"institutions":[{"id":"https://openalex.org/I153718931","display_name":"University of Ottawa","ror":"https://ror.org/03c4mmv16","country_code":"CA","type":"education","lineage":["https://openalex.org/I153718931"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"S.R. Das","raw_affiliation_strings":["Department of Computer and Information Science, Troy State University, Montgomery, AL, USA","School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, ONT, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer and Information Science, Troy State University, Montgomery, AL, USA","institution_ids":[]},{"raw_affiliation_string":"School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I153718931"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023904661","display_name":"Emil M. Petriu","orcid":"https://orcid.org/0000-0002-0274-1035"},"institutions":[{"id":"https://openalex.org/I153718931","display_name":"University of Ottawa","ror":"https://ror.org/03c4mmv16","country_code":"CA","type":"education","lineage":["https://openalex.org/I153718931"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"E.M. Petriu","raw_affiliation_strings":["School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, ONT, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I153718931"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019897542","display_name":"Mehmet \u015eahinoglu","orcid":"https://orcid.org/0000-0003-4488-2300"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Sahinoglu","raw_affiliation_strings":["Department of Computer and Information Science, Troy State University, Montgomery, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer and Information Science, Troy State University, Montgomery, AL, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16792868,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"12","issue":null,"first_page":"312","last_page":"313"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8247404098510742},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.667781412601471},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6515191793441772},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6262322068214417},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.5664469599723816},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5334950089454651},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.4623469412326813},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.413593053817749},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40509819984436035},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3279326558113098},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2736271023750305}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8247404098510742},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.667781412601471},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6515191793441772},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6262322068214417},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.5664469599723816},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5334950089454651},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.4623469412326813},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.413593053817749},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40509819984436035},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3279326558113098},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2736271023750305},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/hase.2004.1281775","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hase.2004.1281775","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Eighth IEEE International Symposium on High Assurance Systems Engineering, 2004. Proceedings.","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.126.5496","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.126.5496","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://csdl.computer.org/comp/proceedings/hase/2004/2094/00/20940312.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.4399999976158142}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1502477161","https://openalex.org/W1950209922","https://openalex.org/W1964801859","https://openalex.org/W1967620093","https://openalex.org/W1999039453","https://openalex.org/W2107995582","https://openalex.org/W2122970891","https://openalex.org/W2130022711","https://openalex.org/W2161191982","https://openalex.org/W2587271961","https://openalex.org/W6641533209"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2114980936","https://openalex.org/W2164493372","https://openalex.org/W2150046587","https://openalex.org/W2164349885","https://openalex.org/W1768820276","https://openalex.org/W2142405811","https://openalex.org/W2115513740","https://openalex.org/W2373135325"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"testability":[3,43],"enhancements":[4],"in":[5,21,58],"architectural":[6],"design":[7,41],"for":[8,42,52],"embedded":[9,54],"cores-based":[10],"system-on-a-chip":[11],"(SoC).":[12],"There":[13],"exist":[14],"methods":[15],"to":[16,33],"ensure":[17],"correct":[18],"SoC":[19],"functionality":[20],"both":[22],"hardware":[23],"and":[24,70],"software,":[25],"but":[26],"one":[27],"of":[28,40,47],"the":[29,38,59],"most":[30],"reliable":[31],"ways":[32],"realize":[34],"this":[35],"is":[36],"through":[37],"use":[39],"approaches.":[44],"Specifically,":[45],"applications":[46],"built-in":[48],"self-test":[49],"(BIST)":[50],"methodology":[51],"testing":[53],"cores":[55],"are":[56],"considered":[57],"paper,":[60],"with":[61],"specific":[62],"implementations":[63],"being":[64],"targeted":[65],"towards":[66],"ISCAS":[67,71],"85":[68],"combinational":[69],"89":[72],"sequential":[73],"benchmark":[74],"circuits.":[75]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}