{"id":"https://openalex.org/W2166692831","doi":"https://doi.org/10.1109/hase.2004.1281738","title":"Assessing reliability risk using fault correction profiles","display_name":"Assessing reliability risk using fault correction profiles","publication_year":2004,"publication_date":"2004-06-10","ids":{"openalex":"https://openalex.org/W2166692831","doi":"https://doi.org/10.1109/hase.2004.1281738","mag":"2166692831"},"language":"en","primary_location":{"id":"doi:10.1109/hase.2004.1281738","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hase.2004.1281738","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Eighth IEEE International Symposium on High Assurance Systems Engineering, 2004. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111439385","display_name":"Norman F. Schneidewind","orcid":null},"institutions":[{"id":"https://openalex.org/I35364215","display_name":"Naval Postgraduate School","ror":"https://ror.org/033yfkj90","country_code":"US","type":"education","lineage":["https://openalex.org/I1330347796","https://openalex.org/I3130687028","https://openalex.org/I35364215"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"N.F. Schneidewind","raw_affiliation_strings":["Naval Postgraduate School, USA"],"affiliations":[{"raw_affiliation_string":"Naval Postgraduate School, USA","institution_ids":["https://openalex.org/I35364215"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5111439385"],"corresponding_institution_ids":["https://openalex.org/I35364215"],"apc_list":null,"apc_paid":null,"fwci":1.5339,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.84461392,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"139","last_page":"148"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6976346373558044},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6958984136581421},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6228622198104858},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6204738616943359},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5890158414840698},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4872928857803345},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.45856937766075134},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.43130603432655334},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3636184334754944},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.202339768409729},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13561496138572693}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6976346373558044},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6958984136581421},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6228622198104858},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6204738616943359},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5890158414840698},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4872928857803345},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.45856937766075134},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.43130603432655334},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3636184334754944},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.202339768409729},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13561496138572693},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/hase.2004.1281738","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hase.2004.1281738","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Eighth IEEE International Symposium on High Assurance Systems Engineering, 2004. Proceedings.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W59022160","https://openalex.org/W563896938","https://openalex.org/W1532168298","https://openalex.org/W1890729281","https://openalex.org/W1893425519","https://openalex.org/W1974598514","https://openalex.org/W2074465314","https://openalex.org/W2096138104","https://openalex.org/W2104249068","https://openalex.org/W2135900634","https://openalex.org/W2141619592","https://openalex.org/W2147819434","https://openalex.org/W6639496510"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Building":[0],"on":[1],"the":[2,5,42,49,64,81,105],"concept":[3],"of":[4,12,22,53],"fault":[6,16,43,56,60,74,87],"correction":[7,17,44,57,61,75,88],"profile":[8,62],"-":[9,26],"a":[10,20],"set":[11],"functions":[13],"that":[14,38,95],"predict":[15],"events":[18,25],"as":[19],"function":[21],"failure":[23],"detection":[24],"introduced":[27],"in":[28],"previous":[29],"research,":[30],"we":[31,93],"define":[32],"and":[33,69,90,101],"apply":[34],"reliability":[35,52,96],"risk":[36,97],"metrics":[37,47,79],"are":[39],"derived":[40],"from":[41],"profile.":[45],"These":[46],"assess":[48],"threat":[50],"to":[51,80,103],"an":[54],"unstable":[55],"process.":[58],"The":[59],"identifies":[63],"need":[65,106],"for":[66,72,107],"process":[67,89,108],"improvements":[68],"provides":[70],"information":[71],"developing":[73],"strategies.":[76],"Applying":[77],"these":[78],"NASA":[82],"Goddard":[83],"Space":[84],"Flight":[85],"Center":[86],"its":[91],"data,":[92],"demonstrate":[94],"can":[98],"be":[99],"measured":[100],"used":[102],"identify":[104],"improvement.":[109]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}