{"id":"https://openalex.org/W2150311021","doi":"https://doi.org/10.1109/hase.2002.1173130","title":"Metrics-based framework for decision making in COTS-based software systems","display_name":"Metrics-based framework for decision making in COTS-based software systems","publication_year":2003,"publication_date":"2003-06-26","ids":{"openalex":"https://openalex.org/W2150311021","doi":"https://doi.org/10.1109/hase.2002.1173130","mag":"2150311021"},"language":"en","primary_location":{"id":"doi:10.1109/hase.2002.1173130","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hase.2002.1173130","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"7th IEEE International Symposium on High Assurance Systems Engineering, 2002. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034405406","display_name":"Sahra Sedigh","orcid":"https://orcid.org/0000-0002-2917-5643"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S. Sedigh-Ali","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022057487","display_name":"Arif Ghafoor","orcid":"https://orcid.org/0000-0002-3707-8173"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Ghafoor","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110249485","display_name":"Raymond A. Paul","orcid":null},"institutions":[{"id":"https://openalex.org/I1330347796","display_name":"United States Department of Defense","ror":"https://ror.org/0447fe631","country_code":"US","type":"funder","lineage":["https://openalex.org/I1330347796"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R.A. Paul","raw_affiliation_strings":["Department of Defense, OASD/C31 Pentagon, Washington D.C., DC, USA"],"affiliations":[{"raw_affiliation_string":"Department of Defense, OASD/C31 Pentagon, Washington D.C., DC, USA","institution_ids":["https://openalex.org/I1330347796"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5034405406"],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":0.9137,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.81850925,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"31","issue":null,"first_page":"243","last_page":"244"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10639","display_name":"Advanced Software Engineering Methodologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10639","display_name":"Advanced Software Engineering Methodologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10430","display_name":"Software Engineering Techniques and Practices","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6556118726730347},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.518135666847229},{"id":"https://openalex.org/keywords/reuse","display_name":"Reuse","score":0.517366349697113},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.5047541856765747},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.4973929226398468},{"id":"https://openalex.org/keywords/commercial-off-the-shelf","display_name":"Commercial off-the-shelf","score":0.4917166531085968},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4857793152332306},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.4739301800727844},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4650156795978546},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.4582608640193939},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.44852960109710693},{"id":"https://openalex.org/keywords/component-based-software-engineering","display_name":"Component-based software engineering","score":0.4462517499923706},{"id":"https://openalex.org/keywords/software-quality-control","display_name":"Software quality control","score":0.4422055184841156},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.41671180725097656},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.4101272225379944},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.3809746205806732},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3226920962333679},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21475252509117126},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.16973033547401428},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11537989974021912},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.10846474766731262}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6556118726730347},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.518135666847229},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.517366349697113},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.5047541856765747},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.4973929226398468},{"id":"https://openalex.org/C2777030141","wikidata":"https://www.wikidata.org/wiki/Q1115443","display_name":"Commercial off-the-shelf","level":3,"score":0.4917166531085968},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4857793152332306},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.4739301800727844},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4650156795978546},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.4582608640193939},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.44852960109710693},{"id":"https://openalex.org/C174683762","wikidata":"https://www.wikidata.org/wiki/Q609588","display_name":"Component-based software engineering","level":4,"score":0.4462517499923706},{"id":"https://openalex.org/C176035894","wikidata":"https://www.wikidata.org/wiki/Q7554350","display_name":"Software quality control","level":5,"score":0.4422055184841156},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.41671180725097656},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.4101272225379944},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3809746205806732},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3226920962333679},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21475252509117126},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.16973033547401428},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11537989974021912},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.10846474766731262},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/hase.2002.1173130","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hase.2002.1173130","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"7th IEEE International Symposium on High Assurance Systems Engineering, 2002. Proceedings.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W204893172","https://openalex.org/W1842856858","https://openalex.org/W1974865001","https://openalex.org/W2022359395","https://openalex.org/W2066490907","https://openalex.org/W2069636159","https://openalex.org/W2114902385","https://openalex.org/W2118683240","https://openalex.org/W2142425794","https://openalex.org/W2153998517","https://openalex.org/W2339979696","https://openalex.org/W2498544734","https://openalex.org/W6723986034"],"related_works":["https://openalex.org/W2549211027","https://openalex.org/W2011425538","https://openalex.org/W2070902631","https://openalex.org/W1489503135","https://openalex.org/W2184812271","https://openalex.org/W2105340075","https://openalex.org/W2117398427","https://openalex.org/W1580492598","https://openalex.org/W2990419466","https://openalex.org/W630040118"],"abstract_inverted_index":{"The":[0],"growing":[1],"reliance":[2],"on":[3,70,115],"Commercial-Off-The-Shelf":[4],"(COTS)":[5],"components":[6,65,72],"for":[7],"developing":[8],"large-scale":[9],"projects":[10],"introduces":[11],"a":[12,112,128],"new":[13,23],"paradigm":[14],"in":[15,36,100],"software":[16,24,102,116],"engineering,":[17],"which":[18,84],"requires":[19],"the":[20,55,75,88,91,124],"design":[21],"of":[22,57,64,90,127],"development":[25,37],"and":[26,62,132,137],"business":[27],"processes.":[28],"Large":[29],"scale":[30],"component":[31],"reuse":[32],"leads":[33],"to":[34,42,45,78,106,118,123],"savings":[35,52],"resources,":[38],"enabling":[39],"these":[40],"resources":[41],"be":[43],"applied":[44],"areas":[46],"such":[47,108],"as":[48,93,95],"quality":[49,89,126,136],"improvement.":[50],"These":[51],"come":[53],"at":[54],"price":[56],"integration":[58],"difficulties,":[59],"performance":[60],"constraints,":[61],"incompatibility":[63],"from":[66,81],"multiple":[67],"vendors.":[68],"Relying":[69],"COTS":[71],"also":[73],"increases":[74],"system's":[76],"vulnerability":[77],"risks":[79],"arising":[80],"third-party":[82],"development,":[83],"can":[85],"negatively":[86],"affect":[87],"system,":[92],"well":[94],"causing":[96],"expenses":[97],"not":[98],"incurred":[99],"traditional":[101],"development.":[103],"We":[104],"aim":[105],"alleviate":[107],"concerns":[109],"by":[110],"using":[111],"framework":[113],"based":[114],"metrics":[117],"accurately":[119],"quantify":[120],"factors":[121],"contributing":[122],"overall":[125],"COTS-Based":[129],"System":[130],"(CBS)":[131],"guide":[133],"decisions":[134],"regarding":[135],"risk":[138],"management.":[139]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}